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    • 1. 发明授权
    • Test circuit for input-to-output speed measurement
    • 用于输入到输出速度测量的测试电路
    • US06768333B1
    • 2004-07-27
    • US10437862
    • 2003-05-13
    • Oliver C. KaoGladwyn O. D'Souza
    • Oliver C. KaoGladwyn O. D'Souza
    • G01R3126
    • G01R31/3016G01R31/31715
    • A test circuit aids in accurately measuring the input pin to output pin signal propagation speed through an integrated circuit by providing a D flip-flop in the signal path near the output pad to register the arrival of a test signal transition. The flip-flop is clocked at various clock frequencies. At the high frequencies, test signal transitions applied at the input pad coincident with a clock transition having not arrived at the output pad in time to be registered at the next clock transition. At lower clock frequencies, the test transition has time to propagate through the integrated circuit and thus will be registered by the flip-flop. By successively lowering the clock frequency and sending test signals through the circuit, one-half of that clock period that just registers the test signal transition corresponds to the input-to-output delay time being measured.
    • 测试电路有助于通过在输出焊盘附近的信号路径中提供D触发器来准确测量输入引脚以输出引脚信号传播速度,以注册测试信号转换的到达。 触发器以各种时钟频率进行定时。 在高频时,在输入焊盘处施加的测试信号转换与未在时间上到达输出焊盘的时钟转换一致,以在下一个时钟转换时被注册。 在较低的时钟频率下,测试转换有时间传播通过集成电路,因此将由触发器进行寄存。 通过连续降低时钟频率并通过电路发送测试信号,刚刚注册测试信号转换的时钟周期的一半对应于被测量的输入到输出延迟时间。
    • 6. 发明授权
    • Programmable logic auto write-back
    • 可编程逻辑自动回写
    • US07183801B2
    • 2007-02-27
    • US10937817
    • 2004-09-08
    • Oliver C. KaoNancy D. Kunnari
    • Oliver C. KaoNancy D. Kunnari
    • H03K19/177
    • H03K19/17748H03K19/1776
    • A first configuration controller loads configuration data into a programmable logic device. The first controller is coupled with a first configuration memory and manages couplings of the memory to a first load path. The load path couples to a latch ring, which receives configuration data from the first memory. An array of configuration latches receives the configuration from the latch ring and effects a configuration of the programmable device. A write-back path couples the latch ring and first configuration memory. A write-back controller manages write-back operations of configuration data from the latch ring to the configuration memory. A second configuration controller is coupled to a second configuration memory, which is coupled to a second load path. The second controller and second memory operate like the first. The write-back controller can be configured to couple to the second memory and facilitate development processes by a writing-back developmental configurations.
    • 第一配置控制器将配置数据加载到可编程逻辑器件中。 第一控制器与第一配置存储器耦合,并且管理存储器与第一负载路径的耦合。 负载路径耦合到锁存环,其从第一存储器接收配置数据。 一组配置锁存器从锁存环接收配置,并实现可编程器件的配置。 写回路径耦合锁存环和第一配置存储器。 写回控制器管理从锁存环到配置存储器的配置数据的回写操作。 第二配置控制器耦合到第二配置存储器,其被耦合到第二负载路径。 第二个控制器和第二个存储器像第一个操作一样运行。 回写控制器可以被配置为耦合到第二存储器并且通过回写开发配置来促进开发过程。