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    • 6. 发明专利
    • Optical integrated element
    • 光学综合元件
    • JP2011066174A
    • 2011-03-31
    • JP2009215167
    • 2009-09-17
    • Nippon Telegr & Teleph Corp Tokyo Institute Of Technology国立大学法人東京工業大学日本電信電話株式会社
    • KAMIOKA HIROYUKIOHASHI HIROMISUGO MITSURUNISHIYAMA NOBUHIKOARAI SHIGEHISALEE SEUNG-HOON
    • H01S5/026H01S5/12
    • PROBLEM TO BE SOLVED: To provide an optical integrated element such as an integrated DFB laser in which a DFB laser element and an optical element are integrated, having a structure capable of reducing internal reflection generated between elements without using a new manufacturing step of an inclined waveguide or the like.
      SOLUTION: For example, the integrated DFB laser (optical integrated element) in which a DFB laser element 101 having a diffraction grating and an optical element 102 having a waveguide guiding layer 106 are integrated has a structure in which a refractive index shifting region 107 consisting of constituents 131, 132 each having an optical path length of a sub-wavelength or a wavelength equivalent to the sub-wavelength is installed between a diffraction grating 103 of the DFB laser element 101 and the waveguide guiding layer 106 of the optical element 102.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:为了提供集成DFB激光元件和光学元件的集成DFB激光器的光学集成元件,具有能够减少元件之间产生的内部反射的结构,而不使用新的制造步骤 的倾斜波导等。 解决方案:例如,其中具有衍射光栅的DFB激光元件101和具有波导引导层106的光学元件102集成的集成DFB激光器(光学集成元件)具有折射率偏移 在DFB激光元件101的衍射光栅103和光学器件的波导引导层106之间,安装由具有亚波长或与亚波长相当的波长的光路长度的构成要素131,132构成的区域107。 元素102.版权所有(C)2011,JPO&INPIT
    • 7. 发明专利
    • Information leakage prevention apparatus
    • 信息泄漏防护装置
    • JP2008017312A
    • 2008-01-24
    • JP2006188200
    • 2006-07-07
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • MASUGI MASAOTAJIMA KIMIHIROTOMINAGA AKIYOSHIKAMIOKA HIROYUKISAO MASAHARU
    • H04K3/00
    • PROBLEM TO BE SOLVED: To prevent information from being leaked by reproducing an electromagnetic wave radiated from an information device.
      SOLUTION: An information leakage prevention apparatus includes a clock signal extraction section 11, an IF unit 111 and a main body unit 112, a clock signal generation section 12, a prevention signal generation section 13, a prevention signal generation circuit 131, an output amplifier unit 132 and a video information management unit 133, and a prevention signal output section 14. The clock signal extraction section 11 receives an RGB signal, a horizontal synchronizing signal and a vertical synchronizing signal and extracts a dot clock signal. The clock signal generation section 12 outputs a pseudo clock signal synchronized with the dot clock signal or a pseudo clock signal with a phase difference previously designated for the pseudo clock signal 1. Outputted is any one of an n-order differentiated signal of the pseudo clock signal, an N-fold cycle signal of the pseudo clock signal, a signal similar to a differentiated signal of the pseudo clock signal, and a signal changing an offset position in an amplitude direction of the N-fold cycle signal or a duty ratio decreased signal of the pseudo clock signal.
      COPYRIGHT: (C)2008,JPO&INPIT
    • 要解决的问题:通过再现从信息设备辐射的电磁波来防止信息泄漏。 解决方案:信息泄漏防止装置包括:时钟信号提取部11,IF部111以及主体部112,时钟信号生成部12,防止信号生成部13,防止信号生成电路131, 输出放大器单元132和视频信息管理单元133以及防止信号输出部分14.时钟信号提取部分11接收RGB信号,水平同步信号和垂直同步信号,并提取点时钟信号。 时钟信号生成部分12输出与点时钟信号同步的伪时钟信号或者对于伪时钟信号1预先指定的相位差的伪时钟信号。输出是伪时钟的n阶微分信号中的任何一个 信号,伪时钟信号的N倍周期信号,类似于伪时钟信号的微分信号的信号,以及改变N倍周期信号的幅度方向上的偏移位置或占空比的信号减小 伪时钟信号的信号。 版权所有(C)2008,JPO&INPIT
    • 9. 发明专利
    • Superconductive device
    • 超级设备
    • JP2013219238A
    • 2013-10-24
    • JP2012089418
    • 2012-04-10
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • KAMIOKA HIROYUKI
    • H01S5/227H01S5/343
    • PROBLEM TO BE SOLVED: To provide a structure which efficiently radiates heat generated during the driving of a semiconductor device having a form where a side surface of a waveguide is buried with a semiconducting material, an organic material, and the like.SOLUTION: A semiconductor device has a buried region made of a semiconducting material or an organic material on a side surface of a waveguide. The semiconductor device further includes vent holes, each of which is composed of at least two or more openings and a cavity connecting the openings with each other, in the buried region. When at least one of the openings has a height different from heights of the other openings, heat generated during the driving of the semiconductor device generates an upward current in the vent hole structure, and outer cooling air flowing from the lower opening of the vent hole moves upward in the vent hole to draw heat from a side wall of the vent hole and be exhausted from the upper opening. Thus, heat is efficiently radiated.
    • 要解决的问题:提供一种有效地辐射在半导体器件驱动期间产生的热的结构,该半导体器件具有用半导体材料,有机材料等埋入波导的侧表面的形式。解决方案:半导体 器件具有由波导的侧表面上的半导体材料或有机材料制成的掩埋区域。 该半导体器件还包括通气孔,每个通孔由至少两个或更多个开口和在该掩埋区域中彼此连接开口的空腔构成。 当开口中的至少一个具有与其他开口的高度不同的高度时,在半导体器件的驱动期间产生的热在通气孔结构中产生向上的电流,并且从通气孔的下开口流出的外部冷却空气 在通气孔中向上移动以从通气孔的侧壁吸收热量并从上部开口排出。 因此,有效地辐射热量。
    • 10. 发明专利
    • Method for adjusting coating reflection factor
    • 调整涂层反射因子的方法
    • JP2005045128A
    • 2005-02-17
    • JP2003279413
    • 2003-07-24
    • Nippon Telegr & Teleph Corp 日本電信電話株式会社
    • TAKESHITA TATSUYASUGO MITSURUSHIBATA YASUOTOMORI YUICHIKAMIOKA HIROYUKI
    • G02B6/13G02B6/122G02F1/015H01L21/302H01S3/00H01S5/028
    • PROBLEM TO BE SOLVED: To adjust the reflection factor of a coating film formed at the edge of the light emitting surface of an optical element such as a semiconductor laser or a surface light wave circuit to a proper value. SOLUTION: Properties of the optical element are monitored, while the thickness of the coating film (a reflection film or an anti-reflection film) is adjusted by etching. Since the abrasion by irradiation of ultraviolet laser beams is used as an etching method, the light output section of the coating film formed at the end surface for the light emission can be etched locally without using a resist mask. Further, since the etching accuracy is in nm unit, a precise etching amount can be controlled. For this reason, the coating film coincident with a designed reflection factor which was difficult in the prior art is obtained. COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:将形成在诸如半导体激光器或表面光波形电路的光学元件的发光表面的边缘处的涂膜的反射系数调整到适当的值。

      解决方案:通过蚀刻来调节光学元件的性能,同时涂覆膜(反射膜或抗反射膜)的厚度。 由于使用紫外激光束照射的磨损作为蚀刻方法,所以可以在不使用抗蚀剂掩模的情况下局部蚀刻形成在发光的端面的涂膜的光输出部。 此外,由于蚀刻精度为nm单位,因此可以控制精确的蚀刻量。 因此,获得与现有技术难以设计的反射系数一致的涂膜。 版权所有(C)2005,JPO&NCIPI