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2. 发明专利

JP2012087460A Clearance limit measuring device and clearance limit measurement method 有权
标题翻译：间隙限制测量装置和间隙限制测量方法
公开(公告)号：JP2012087460A
公开(公告)日：2012-05-10
申请号：JP2010232332
申请日：2010-10-15
申请人： Tekken Constr Co Ltd , 鉄建建設株式会社
发明人： OKUBO MASAAKI , HAYASHI MAMORU , NAKAMURA HIROICHI
IPC分类号： E01B35/00 , G01C15/00
摘要： PROBLEM TO BE SOLVED: To provide a clearance limit measurement device capable of accurately and easily measuring a distance from a track center or a rail head top surface to a measurement target part, and a clearance limit measurement method capable of easily measuring the separation from the clearance limit of the measurement target part.SOLUTION: A clearance limit measurement device 1 includes: a measurement arm 40 which is arranged on a measuring instrument body 10 and is freely extended and contracted in an orthogonal direction orthogonal to a rail on the side part of the rail; and a light wave distance measurement device 50 which is mounted on the distal end side of the measurement arm 40 and irradiates a rail head top surface RL with a visible light beam 51 vertically to measure a vertical distance Lh to the measurement target part Tp. The light wave distance measurement device 50 is arranged such that a reference point P to be a reference when measuring a distance in the light wave distance measurement device 50 matches with the rail head top surface RL, and a scale 43 for measuring a width direction distance Lw on the rail head top surface RL between the reference point P and the track center CL is provided.
摘要翻译：要解决的问题：提供一种能够精确且容易地测量从轨道中心或轨道头顶表面到测量目标部分的距离的间隙限制测量装置，以及能够容易地测量与测量目标部分的间隙极限分离。解决方案：间隙限制测量装置1包括：测量臂40，其布置在测量仪器主体10上，并且在与轨道的侧部上的轨道正交的正交方向上自由地伸缩; 以及安装在测量臂40的前端侧的光波距离测量装置50，并且向垂直方向照射具有可见光束51的轨道头顶面RL以测量与测量对象部分Tp的垂直距离Lh。光波距离测量装置50被布置成使得在测量光波距离测量装置50中的距离时作为基准的参考点P与轨道头顶面RL匹配，以及用于测量宽度方向距离设置在参考点P和轨道中心CL之间的轨头顶面RL上。版权所有（C）2012，JPO＆INPIT

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