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1. 发明授权

US07533309B2 Testing memories using algorithm selection 有权
标题翻译：使用算法选择测试记忆
公开(公告)号：US07533309B2
公开(公告)日：2009-05-12
申请号：US10861851
申请日：2004-06-04
申请人： Nilanjan Mukherjee , Joseph C. Rayhawk , Amrendra Kumar
发明人： Nilanjan Mukherjee , Joseph C. Rayhawk , Amrendra Kumar
IPC分类号： G11C29/00 , G11C7/00
CPC分类号： G11C29/10 , G11C29/14 , G11C29/16 , G11C29/38 , G11C2029/3202
摘要： A method of performing a built-in-self-test (BIST) of at least one memory element of a circuit is disclosed. In a specific example, a determination is made during running of a BIST whether one or more algorithms are to be run. If any algorithm is not designated for running, the particular algorithm is skipped and the test moves to other algorithms to be run. A BIST controller is configured to perform a group of test algorithms. Certain algorithms from the group may be checked to see if they are to be run or bypassed. A delay or skip state is desirably interposed following the inclusion of a particular algorithm and prior to the start of a next algorithm. A determination is made during the delay or skip state whether the next algorithm is to be run. The user may also have the option of running all of the algorithms if desired for performance of a particular BIST.
摘要翻译：公开了一种执行电路的至少一个存储元件的内置自检（BIST）的方法。在具体示例中，在BIST的运行期间确定是否要运行一个或多个算法。如果没有指定运算的算法，跳过特定的算法，并且测试移动到要运行的其他算法。 BIST控制器被配置为执行一组测试算法。可以检查组中的某些算法，以查看它们是要运行还是旁路。期望在包含特定算法之后并且在下一个算法开始之前插入延迟或跳过状态。在延迟或跳过状态期间确定是否要运行下一个算法。如果需要执行特定的BIST，用户还可以选择运行所有算法。

2. 发明申请

US20050204231A1 Testing memories using algorithm selection 有权
标题翻译：使用算法选择测试记忆
公开(公告)号：US20050204231A1
公开(公告)日：2005-09-15
申请号：US10861851
申请日：2004-06-04
申请人： Nilanjan Mukherjee , Joseph Rayhawk , Amrendra Kumar
发明人： Nilanjan Mukherjee , Joseph Rayhawk , Amrendra Kumar
IPC分类号： G01R31/28 , G11C29/00
CPC分类号： G11C29/10 , G11C29/14 , G11C29/16 , G11C29/38 , G11C2029/3202
摘要： A method of performing a built-in-self-test (BIST) of at least one memory element of a circuit is disclosed. In a specific example, a determination is made during running of a BIST whether one or more algorithms are to be run. If any algorithm is not designated for running, the particular algorithm is skipped and the test moves to other algorithms to be run. A BIST controller is configured to perform a group of test algorithms. Certain algorithms from the group may be checked to see if they are to be run or bypassed. A delay or skip state is desirably interposed following the inclusion of a particular algorithm and prior to the start of a next algorithm. A determination is made during the delay or skip state whether the next algorithm is to be run. The user may also have the option of running all of the algorithms if desired for performance of a particular BIST.
摘要翻译：公开了一种执行电路的至少一个存储元件的内置自检（BIST）的方法。在具体示例中，在BIST的运行期间确定是否要运行一个或多个算法。如果没有指定运算的算法，跳过特定的算法，并且测试移动到要运行的其他算法。 BIST控制器被配置为执行一组测试算法。可以检查组中的某些算法，以查看它们是要运行还是旁路。期望在包含特定算法之后并且在下一个算法开始之前插入延迟或跳过状态。在延迟或跳过状态期间确定是否要运行下一个算法。如果需要执行特定的BIST，用户还可以选择运行所有算法。

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