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1. 发明专利

JP2004061372A Impedance parameter estimation device 有权
公开(公告)号：JP2004061372A
公开(公告)日：2004-02-26
申请号：JP2002221768
申请日：2002-07-30
申请人： Nf Corp , 株式会社エヌエフ回路設計ブロック
发明人： KADOKAWA TAKANORI
IPC分类号： G01R27/02
摘要： PROBLEM TO BE SOLVED: To provide an impedance parameter estimation device capable of rapidly and simply finding equivalent circuits and parameters of test impedance with high accuracy.
SOLUTION: From a swept sine wave generator 14, a frequency- swept sine wave-like change is given to a current passing through test impedance 11. In this state, an impedance measurement part 17 finds impedance measurement values from measurement values of voltage detection part 15 and a current detection part 16 at respective frequencies. The impedance measurement values for the respective frequencies are given to an equivalent circuit estimation part 18. Simultaneous equations in the form of transfer functions are prepared and solutions of the equations are decomposed into a combination of linear and quadratic forms. Portions of the linear and quadratic forms obtained by the decomposition are converted into respectively corresponding equivalent circuits and parameters, thereby estimating the equivalent circuits and parameters of the test impedance 11.
COPYRIGHT: (C)2004,JPO

2. 发明专利

JP2004325302A Device and method for diagnosing hot line insulation capable of allowing measurement over wide area 审中-公开
公开(公告)号：JP2004325302A
公开(公告)日：2004-11-18
申请号：JP2003121521
申请日：2003-04-25
申请人： Chubu Electric Power Co Inc , Chubu Plant Service Co Ltd , Nf Corp , 中部電力株式会社 , 株式会社エヌエフ回路設計ブロック , 株式会社中部プラントサービス
发明人： TSUJI KENJI , KUWABARA TOKINORI , KADOKAWA TAKANORI
IPC分类号： G01R31/02 , G01R1/22 , G01R15/18 , G01R27/18 , G01R31/12
摘要： PROBLEM TO BE SOLVED: To realize highly precise measurement excellent in reproducibility. SOLUTION: This device/method has a low-frequency superposed power source 4, a ZCT 7 having a secondary coil and a tertiary coil as a calibration signal input coil and attached to a cable way 1, and a calibration power source 12 for inputting a low-frequency of calibration current into the tertiary coil of the ZCT 7. The low-frequency of calibration current is input into the tertiary coil of the ZCT 7 by calibration measurement to find a gain Gcal (=¾Ig÷Ical¾) and a phase difference θcal (=Ig∠Lcal) as calibration information, and a zero phase current Ig acquired by the the ZCT 7 in the measurement is corrected using the calibration information to remove an influence of the phase shift in the ZCT 7. COPYRIGHT: (C)2005,JPO&NCIPI

3. 发明专利

JP2005063304A Function generator 审中-公开
标题翻译：功能发生器
公开(公告)号：JP2005063304A
公开(公告)日：2005-03-10
申请号：JP2003295331
申请日：2003-08-19
申请人： Nf Corp , 株式会社エヌエフ回路設計ブロック
发明人： ISHIBASHI MASAHIRO , KADOKAWA TAKANORI
IPC分类号： G06F1/02 , H03M1/66
摘要： PROBLEM TO BE SOLVED: To provide a function generator capable of carrying out more complicated waveform creation by a simple circuit configuration, by eliminating the limit of the capacity of a waveform memory.
SOLUTION: When function information such as parameters of a function expression is inputted by a function expression input part 1, function data is generated by a CPU 3 on the basis of the information, and the generated function data is directly converted into an analog signal by a D/A conversion 7 and outputted.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：通过消除波形存储器的容量的限制，提供能够通过简单的电路配置执行更复杂的波形创建的功能发生器。解决方案：当由功能表达式输入部分1输入功能表达式的参数等功能信息时，CPU 3根据该信息产生功能数据，生成的功能数据直接转换为模拟信号通过D / A转换7输出。版权所有（C）2005，JPO＆NCIPI

4. 发明专利

JP2005062102A Waveform-measuring device 审中-公开
标题翻译：波形测量装置
公开(公告)号：JP2005062102A
公开(公告)日：2005-03-10
申请号：JP2003295332
申请日：2003-08-19
申请人： Nf Corp , 株式会社エヌエフ回路設計ブロック
发明人： ABE YUTAKA , KADOKAWA TAKANORI , ISHIBASHI MASAHIRO
IPC分类号： G01D7/00 , G01D9/00 , G01R13/20
摘要： PROBLEM TO BE SOLVED: To provide a waveform-measuring device capable of effectively retrieving desired data from among measurement data.
SOLUTION: The measurement data, composed of waveform data are stored in the data memory part 5, event condition representing the characteristics of the measurement data, are inputted to an input part 4. The event information is created by comparing the measurement data with the event condition by the event information setting means 12 of the control part 1, and the retrieval of the measurement data is made possible, based on the event information by setting the event information corresponding to the measurement data matching with the event condition.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供能够从测量数据中有效地检索所需数据的波形测量装置。解决方案：将由波形数据组成的测量数据存储在数据存储器部分5中，表示测量数据的特性的事件条件被输入到输入部分4.通过比较测量数据来创建事件信息利用控制部分1的事件信息设置装置12的事件条件，并且通过设置与与事件条件匹配的测量数据相对应的事件信息，可以基于事件信息来使测量数据的检索成为可能。版权所有（C）2005，JPO＆NCIPI

5. 发明专利

JP2001041995A GROUND FAULT LOCATOR AND LOCATING METHOD 失效
公开(公告)号：JP2001041995A
公开(公告)日：2001-02-16
申请号：JP21352799
申请日：1999-07-28
申请人： KANSAI ELECTRIC POWER CO , NF CORP
发明人： YOSHIDA TAKASHI , KADOKAWA TAKANORI
IPC分类号： G01R31/08 , H02H7/26 , H02J3/00
摘要： PROBLEM TO BE SOLVED: To locate even a faint ground fault by taking waveform parameter correlation between the actually measured ground fault surge waveform of a system and the imaginary ground fault surge waveform of an equivalent circuit modulating the system. SOLUTION: A waveform measuring means 11 converts a received ground fault surge waveform into a digital signal and a waveform analyzing means 12 calculates the waveform parameters of the ground fault surge waveform. A system equivalent network forming means 14 forms a state equation by redesignating the input and output positions from an existing drawing of placement and a system analyzing means 15 calculates a transfer function and outputs the waveform parameters B of the ground fault surge waveform. A waveform parameter comparing means 13 calculates the correlation value of the waveform parameters A, B and a ground fault point/ground fault resistance varying means 16 varies the ground fault point/ground fault resistance from the value thus obtained and feeds the varied value back to the state equation. More specifically, the waveform parameters B are calculated while varying the ground fault point/ground fault resistance variously depending on the comparison results and the ground fault is located at a point where the difference between the waveform parameters A, B is smallest.

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