会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Method for recovering alcohols
    • 回收醇的方法
    • US3989763A
    • 1976-11-02
    • US507885
    • 1974-09-20
    • Toshihiro FujiiNaoji KurataYukio Okuda
    • Toshihiro FujiiNaoji KurataYukio Okuda
    • C07C29/52C07C29/24
    • C07C29/52
    • A process for the preparation of alcohols by oxidizing aliphatic saturated hydrocarbons, having 10-20 carbon atoms, in the presence of a boron compound, contacting the oxidation reaction mixture with water, removing the aqueous solution of boric acid, and separating the resulting oil layer with saponification and washing with water. A boron compound is added to the resulting oil layer to esterify the alcohols therein. The resulting mixture is distilled to remove unreacted hydrocarbons, the residue comprising borate esters of alcohols is contacted with water, the aqueous solution of boric acid is removed, and the resulting oil layer is separated and distilled to recover the desired alcohols.
    • 通过在硼化合物的存在下氧化具有10-20个碳原子的脂族饱和烃来制备醇的方法,使氧化反应混合物与水接触,除去硼酸水溶液,并将所得油层分离 皂化并用水洗涤。 向所得油层中加入硼化合物以酯化其中的醇。 将所得混合物蒸馏以除去未反应的烃,将含有硼酸酯的残余物与水接触,除去硼酸水溶液,并将所得油层分离并蒸馏以回收所需的醇。
    • 4. 发明授权
    • Refrigerating device
    • 制冷装置
    • US4283920A
    • 1981-08-18
    • US51829
    • 1979-06-25
    • Hiroyuki KainumaYukio OkudaYoshiaki Fujisawa
    • Hiroyuki KainumaYukio OkudaYoshiaki Fujisawa
    • F25B1/02F25B49/02G05D23/24H02K33/18F25B31/02F04B49/10
    • H02K33/18F25B49/022G05D23/1913G05D23/24F25B2600/021Y02B30/741
    • A refrigerating device having an inverter circuit for generating alternating voltage, a vibrating compressor to which the alternating voltage from the inverter circuit is supplied, a condenser to which the refrigerant compressed by the compressor is supplied, a capillary tube provided on the downstream side of the condenser and an evaporator provided on the downstream side of the capillary tube, wherein a phase control circuit for controlling the phase of the alternating voltage supplied to the compressor in accordance with ambient temperature of the refrigerating device and/or the evaporator temperature is provided to cause the piston stroke of the vibrating compressor to be reduced in accordance with decreases in ambient temperature of the refrigerating device and/or the evaporator temperature so as to prevent unwanted damage to the compressor.
    • 一种具有用于产生交流电压的逆变器电路的制冷装置,供应来自逆变器电路的交流电压的振动压缩机,供应由压缩机压缩的制冷剂的冷凝器,设置在该压缩机的下游侧的毛细管 冷凝器和设置在毛细管的下游侧的蒸发器,其中提供用于根据制冷装置的环境温度和/或蒸发器温度控制供应给压缩机的交流电压的相位的相位控制电路,以使 根据制冷装置的环境温度和/或蒸发器温度的降低,振动压缩机的活塞冲程减小,以防止对压缩机的不必要的损坏。
    • 8. 发明授权
    • Method and apparatus of testing and analyzing CMOS integrated circuit
    • CMOS集成电路的测试和分析方法和设备
    • US06515500B1
    • 2003-02-04
    • US09661793
    • 2000-09-14
    • Yukio Okuda
    • Yukio Okuda
    • G01R3126
    • G01R31/3008
    • A method of testing a CMOS integrated circuit including the steps of applying a test signal to a CMOS integrated circuit under test and measuring a quiescent power supply current at a plurality of strobe points, calculating defect current estimates corresponding to the strobe points based on average value ratios of the quiescent power supply currents at the plurality of strobe points calculated in advance for a good CMOS integrated circuit, measured values of the quiescent power supply current at the plurality of strobe points, and an average value of the measured values of the quiescent power supply currents, and judging the CMOS integrated circuit under test as a defect when an absolute value of a calculated defect current estimate is larger than an absolute value of an allowable error of a measured value of the quiescent power supply current, whereby it is possible to detect the defect current of a CMOS integrated circuit with a large quiescent power supply current and a large variation.
    • 一种测试CMOS集成电路的方法,包括以下步骤:将测试信号施加到被测CMOS集成电路,并测量多个选通点处的静态电源电流,基于平均值计算与选通点相对应的缺陷电流估计值 预先为好的CMOS集成电路计算的多个选通点处的静态电源电流的比率,多个选通点处的静态电源电流的测量值和静态功率的测量值的平均值 供电电流,并且当所计算的缺陷电流估计的绝对值大于静态电源电流的测量值的允许误差的绝对值时,将被测试的CMOS集成电路判断为缺陷,由此可以 检测具有大静态电源电流和大变量的CMOS集成电路的缺陷电流 。