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    • 1. 发明授权
    • Particle selection method and a time-of flight mass spectrometer
    • 粒子选择方法和飞行时间质谱仪
    • US5962849A
    • 1999-10-05
    • US826311
    • 1997-03-25
    • Naoaki SaitoMitsumori TanimotoKazuyoshi KoyamaYasushi Iwata
    • Naoaki SaitoMitsumori TanimotoKazuyoshi KoyamaYasushi Iwata
    • G01N27/62H01J49/40G01D59/44H01J49/00
    • H01J49/40
    • In the time-of-flight mass spectrometer, the mass spectrometer with high resolution is provided which defines the initial position and the initial velocity of the charged particles and selects only the stable charged particles to measure.First, all of the charged particles Pe are accelerated to one direction in a homogeneous or spatially uniform electric field during a common finite period of time, and then all of the charged particles Pe are accelerated to the opposite direction of the former in a homogeneous or spatially uniform electric field during a common finite period of time and given the same momentum in the opposite direction of the former. Two kind of particle selection method can be adopted. Only the charged particles Pe passing through a predetermined position at a predetermined time are selected by the selector. The charged particles Pe passing through the selector are defected by the first and second deflectors and then only the charged particles passing through a predetermined point of the slit are selected and reach the ion detector. Finally, the mass spectrum is obtained by measuring the time-of-flight of the particles using the ion detector.
    • 在飞行时间质谱仪中,提供了具有高分辨率的质谱仪,其定义了带电粒子的初始位置和初始速度,并且仅选择稳定的带电粒子进行测量。 首先,在均匀或空间均匀的电场中,所有带电粒子Pe在均匀或空间均匀的电场中被加速到一个方向,然后所有带电粒子Pe被加速到前者的相反方向, 在相同的有限时间段内空间均匀的电场,并给出与前者相反方向相同的动量。 可采用两种粒子选择方法。 选择器仅选择在预定时间内通过预定位置的带电粒子Pe。 穿过选择器的带电粒子Pe被第一和第二偏转器缺陷,然后仅选择通过狭缝的预定点的带电粒子并到达离子检测器。 最后,通过使用离子检测器测量颗粒的飞行时间来获得质谱。