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    • 4. 发明授权
    • Process for the production of a polymerized material and the product produced thereby
    • 生产聚合材料的方法及由此生产的产品
    • US06291598B1
    • 2001-09-18
    • US09230717
    • 1999-10-18
    • Michael C. WilliamsNai-Hong LiYatin Sankholkar
    • Michael C. WilliamsNai-Hong LiYatin Sankholkar
    • C08G6918
    • C08G64/42C08G69/14C08G69/44
    • A polymerized material produced by the polymerization of an organic amide monomer in the presence of an organic carbonate and a process for the preparation thereof. The process comprises the steps of: heating an amount of the organic anide monomer to a temperature above its melting point; first mixing an amount of an anionic initiator with at least a portion of the amount of heated organic amide mnonomer to produce an amount of activated monomer, wherein the anionic initiator is not comprised of an alkali metal; second mixing an amount of the organic carbonate with at least a portion of the amount of heated organic amide monomer to produce an amount of dissolved organic carbonate; and polymerizing the amounts of heated organic amide monomer and activated monomer in the presence of the amount of dissolved organic carbonate to produce the polymerized material.
    • 在有机碳酸酯存在下通过有机酰胺单体的聚合制备的聚合材料及其制备方法。 该方法包括以下步骤:将一定量的有机助剂单体加热至高于其熔点的温度; 首先将一定量的阴离子引发剂与加热的有机酰胺单体的量的至少一部分混合以产生一定量的活化单体,其中阴离子引发剂不由碱金属构成; 将一定量的有机碳酸酯与加热的有机酰胺单体的量的至少一部分混合以产生一定量的溶解的有机碳酸酯; 并在溶解的有机碳酸酯存在下聚合加热的有机酰胺单体和活化单体的量以产生聚合的材料。
    • 6. 发明授权
    • Wireless test fixture for printed circuit board test systems
    • 无线测试夹具用于印刷电路板测试系统
    • US06628130B2
    • 2003-09-30
    • US09908355
    • 2001-07-18
    • Michael C. WilliamsRobert A. Slutz
    • Michael C. WilliamsRobert A. Slutz
    • G01R3102
    • G01R1/07328G01R1/07335
    • A wireless test fixture is disclosed for connecting printed circuit boards or other electrical interconnect devices having electronic components to a test system. Rigid support beams and insulating spacers are used to reduce the structural loads on the electrical interconnect plane and to minimize probe mounting plate deflections in the wireless test fixture. The test system electrical interface is via a series of floating transfer pins. The floating transfer pins provide electrical signal paths between test system interface probes and the electrical interconnect plane that interfaces with double-end sockets coupled to a probe for making electrical contact with the DUT. One or more fixed double-ended sockets and spring probes are used to make electrical contact with the DUT.
    • 公开了一种无线测试夹具,用于将具有电子部件的印刷电路板或其它电气互连装置连接到测试系统。 使用刚性支撑梁和绝缘垫片来减少电气互连平面上的结构负载,并使无线测试夹具中的探针安装板偏转最小化。 测试系统电气接口通过一系列浮动传输引脚。 浮动传输引脚在测试系统接口探针和电互连平面之间提供电信号路径,该电互连平面与耦合到探头的双端插座相连接,用于与DUT进行电接触。 一个或多个固定的双端插座和弹簧探头用于与DUT进行电气接触。