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1. 发明申请

WO2008029348A2 TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD 审中-公开
标题翻译：可测试的集成电路和IC测试方法
公开(公告)号：WO2008029348A2
公开(公告)日：2008-03-13
申请号：PCT/IB2007/053558
申请日：2007-09-04
申请人： NXP B.V. , RIUS VAZQUEZ, Josep , VILLAGRA, Luis Elvira , MEIJER, Rinze I., M., P.
发明人： RIUS VAZQUEZ, Josep , VILLAGRA, Luis Elvira , MEIJER, Rinze I., M., P.
CPC分类号： G01R31/3008
摘要： A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).
摘要翻译： IC的电路部分（100）包括用于耦合各个电路部分元件（150）的多个导电轨道（130），例如，标准逻辑单元到达电源轨道（110），其中导电轨道（130）经由至少一个启用开关（132）耦合到电源轨道（110）。电路部分（100）还包括用于在集成电路（600）的测试模式中确定电路部分（100）上的电压梯度的元件（160），该电路部分导电地耦合到导电轨道（130）。元件（160）具有用于将元件（160）耦合到电源端子的第一端部（164）和用于在测试模式下将元件（160）耦合到输出（620）的第二端部（166）。这通过测量元件（160）上的电压梯度来促进电路部分（100）的IDDQ测试。

2. 发明授权

EP2064562B1 TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD 有权
标题翻译：可验证的集成电路和IC测试程序
公开(公告)号：EP2064562B1
公开(公告)日：2010-04-21
申请号：EP07826254.0
申请日：2007-09-04
申请人： NXP B.V.
发明人： RIUS VAZQUEZ, Josep , VILLAGRA, Luis Elvira , MEIJER, Rinze I., M., P.
IPC分类号： G01R31/30
CPC分类号： G01R31/3008

3. 发明公开

EP2064562A2 TESTABLE INTEGRATED CIRCUIT AND IC TEST METHOD 有权
标题翻译：可验证的集成电路和IC测试程序
公开(公告)号：EP2064562A2
公开(公告)日：2009-06-03
申请号：EP07826254.0
申请日：2007-09-04
申请人： NXP B.V.
发明人： RIUS VAZQUEZ, Josep , VILLAGRA, Luis Elvira , MEIJER, Rinze I., M., P.
IPC分类号： G01R31/30
CPC分类号： G01R31/3008
摘要： A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).

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