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    • 1. 发明专利
    • DE60020064T2
    • 2006-01-12
    • DE60020064
    • 2000-12-28
    • NISSAN MOTOR
    • KARAKI TOSHIROTHRONGNUMCHAI KRAISORN
    • H02M1/08H03K17/042H03K17/082H03K17/16H03K17/56
    • In the initial stage of the operation of turning off a semiconductor device (Q1), the impedance of a carrier pull out circuit (5) remains low for rapidly pulling out the stored carriers from the control electrode (G) of the device (Q1). When the turn-off transition of the device (Q1) proceeds and becomes close to its completion, the impedance of the carrier pull out circuit (S) is shifted to a higher level for retarding the carrier pull out speed. A detector (4) is provided for detecting a control current developed by pulling out the carriers. When the current measured by the detector (4) drops down to below a predetermined level, it is judged that the turn-off transition is approaching to its end. This permits the turn-off transition to be smoothly finished and can thus prevent unwanted oscillation of the control electrode voltage. More specifically, the device (Q1) can be inhibited from being accidentally turned on by the effect of oscillation of the control electrode voltage and also, the delay time in the turn off transition becomes longer while the storage time is same as the conventional circuitry.
    • 2. 发明专利
    • DE60040052D1
    • 2008-10-09
    • DE60040052
    • 2000-12-22
    • NISSAN MOTOR
    • SHIMOIDA YOSHIOTHRONGNUMCHAI KRAISORNKARAKI TOSHIRO
    • H03K17/082H03K17/0812
    • A protective control unit for controlling a highside-output transistor (T1) and a lowside-output transistor (T2) connected in series is provided. The highside-output transistor has a first main electrode region connected to a power supply, a second main electrode region and a first control electrode. The lowside-output transistor has a third main electrode region connected to the second main electrode region, a fourth electrode region connected to ground and a second control electrode. And an inductive load (L1) is connected to a connecting point (P) between the second and the third electrode regions. The protective control unit of the present invention has a highside-drive circuit. The highside-drive circuit pulls out charges stored in the highside-output transistor, through the first control electrode, during the periods when the highside-output transistor is in the end of reverse conducting state and reverse recovery state. The charges are pulled out by short-circuiting between the first control electrode and the second main electrode region during the periods when the highside-output transistor is in the end of reverse conducting state and reverse recovery state. Or, the charges are pulled out by a providing a potential having an opposite polarity to the charges during the periods when the highside-output transistor is in the end of reverse conducting state and reverse recovery state.
    • 3. 发明专利
    • DE60020064D1
    • 2005-06-16
    • DE60020064
    • 2000-12-28
    • NISSAN MOTOR
    • KARAKI TOSHIROTHRONGNUMCHAI KRAISORN
    • H02M1/08H03K17/16H03K17/56H03K17/042H03K17/082
    • In the initial stage of the operation of turning off a semiconductor device (Q1), the impedance of a carrier pull out circuit (5) remains low for rapidly pulling out the stored carriers from the control electrode (G) of the device (Q1). When the turn-off transition of the device (Q1) proceeds and becomes close to its completion, the impedance of the carrier pull out circuit (S) is shifted to a higher level for retarding the carrier pull out speed. A detector (4) is provided for detecting a control current developed by pulling out the carriers. When the current measured by the detector (4) drops down to below a predetermined level, it is judged that the turn-off transition is approaching to its end. This permits the turn-off transition to be smoothly finished and can thus prevent unwanted oscillation of the control electrode voltage. More specifically, the device (Q1) can be inhibited from being accidentally turned on by the effect of oscillation of the control electrode voltage and also, the delay time in the turn off transition becomes longer while the storage time is same as the conventional circuitry.
    • 4. 发明专利
    • FAULT DETECTION DEVICE
    • JP2000293201A
    • 2000-10-20
    • JP10116699
    • 1999-04-08
    • NISSAN MOTOR
    • KARAKI TOSHIRO
    • F02D45/00F02D35/00G01R31/02G05B9/02
    • PROBLEM TO BE SOLVED: To detect incomplete shorting when it occurs. SOLUTION: A fault detection device detects current flowing in a MOS transistor 4 by a mirror MOS transistor 7, a detection resistor 8 and a voltage amplifier 9. The current flowing in a MOS transistor 10 is detected by a mirror MOS transistor 10, a detection resistor 11 and a voltage amplifier 12. An L fault detection circuit 13 compares current detection values and judges a fault content. When the values are not similar, it is judged that incomplete shorting occurs on a side where the current value is smaller. Then, a control circuit 1 can stop the current flowing in an L load 5 based on the judged result. Since a fault is judged by the comparison of the current values, the relative precision of a resistance value is kept and the value can be detected when the detection resistor is formed in a small area on an IC chip. Then, the device can be formed without trimming an expensive outer resistor and the detection resistor.
    • 5. 发明专利
    • CURRENT CONTROL CIRCUIT
    • JP2000217347A
    • 2000-08-04
    • JP1370299
    • 1999-01-22
    • NISSAN MOTOR
    • KARAKI TOSHIRO
    • H01L21/822H01L21/82H01L27/04H02M3/28
    • PROBLEM TO BE SOLVED: To provide cost reduction by disposing a first to a fourth transistors and a first to a fourth transistor loads within a distance where the electrical characteristics of a semiconductor substrate can change almost linearly. SOLUTION: Pairs of differential input transistors, 60 and 61, 62 and 63, 64 and 65 of respective operational amplifiers 72, 73, 74 in respective current sense circuits, and pairs of load transistors 66 and 67, 68 and 69, 70 and 71 of the differential input transistors are arranged based on their positional relation and disposed closest with each other, by which the direction and absolute value of the input offset voltage of the respective operational amplifiers 72, 73, 74 are kept the same. The constituent elements of the respective current sense circuit are also disposed closest to them, and a thermal separation band 75 is disposed around them to form a small temperature gradient in the respective current sense circuits. As a result, sampling the input offset voltage of the respective operational amplifiers 72, 73, 74 can be conducted at only one position, and only one zero-point holding resistor is required. It is thus possible to attain reduction in a semiconductor chip area and the cost.
    • 7. 发明专利
    • Drive circuit for current controlled device
    • 电流控制装置的驱动电路
    • JP2003338742A
    • 2003-11-28
    • JP2002147449
    • 2002-05-22
    • Nissan Motor Co Ltd日産自動車株式会社
    • KARAKI TOSHIROKLEISON TRONNAMCHAI
    • H02M1/08H03K17/16H03K17/64H03K17/66
    • PROBLEM TO BE SOLVED: To provide a drive circuit, for a current controlled semiconductor device, for suppressing through-current, when one transistor constituting a half bridge is turned on while the other transistor is turned on in the opposite direction. SOLUTION: When a transistor T2 for driving a lower side arm, is turned on while a transistor T1 for driving an upper side arm, is turned on in the opposite direction, the carrier accumulated in the drive transistor T1 is pulled out, using a current in the direction flowing into the dot side of the secondary winding SU of a transformer T. Thereby, the time during which the driving transistor T1 is made to conduct forward current, while being in off state, is reduced. The current, in the direction flowing into the dot side of the secondary winding SU of the transformer T, is made to flow by turning on an N-type MOS transistor M21U, when the induced voltage V2U in the secondary winding SU becomes negative (= the time, when the signal detected by a pulse period sensing circuit 24U reaches H level). Then, the detected signal at the pulse period sensing circuit 24U passes through a waveform shaping circuit 25U, to remove the noise superposed on the detected signal. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了提供用于抑制贯通电流的电流控制半导体器件的驱动电路,当构成半桥的一个晶体管导通,而另一个晶体管在相反方向上导通时。 解决方案:当用于驱动下侧臂的晶体管T2在用于驱动上侧臂的晶体管T1在相反方向导通时导通,所以累积在驱动晶体管T1中的载流子被拉出, 在流过变压器T的次级绕组SU的点侧的方向上使用电流。由此,使驱动晶体管T1导通正向电流的同时处于截止状态的时间减少。 当次级绕组SU中的感应电压V2U变为负(= 1)时,流过变压器T的次级绕组SU的点侧的电流流过N型MOS晶体管M21U, 当脉冲周期检测电路24U检测到的信号达到H电平时)。 然后,脉冲周期检测电路24U的检测信号通过波形整形电路25U,去除叠加在检测信号上的噪声。 版权所有(C)2004,JPO