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    • 7. 发明申请
    • STRUCTURE ANALYZING DEVICE AND A STRUCTURE ANALYZING METHOD
    • 结构分析装置和结构分析方法
    • US20150177195A1
    • 2015-06-25
    • US14406242
    • 2013-01-11
    • NEC CORPORATION
    • Yasuhiro SasakiMasatake TakahashiShigeki Shinoda
    • G01N29/12
    • G01N29/12G01M3/243G01M7/00G01N29/045G01N29/4436G01N2291/0258
    • Disclosed is a structure analyzing device and a structure analyzing method which can analyze a state change of a structure, which is caused before the structure is destroyed, such as a state change of degradation of the structure or the like. A structure analyzing device (10) includes a vibration detecting unit (11) which detects a vibration of a structure, and an analysis unit (12) which analyzes an output signal of the vibration detecting unit (11). The analysis unit (12) analyzes a state change of the structure by comparing a value of resonant sharpness Q, which is measured by use of the following formula (1) in a state existing when carrying out analysis, with a value of resonant sharpness Q which is measured by use of the following formula (1) in a standard state.
    • 公开了一种结构分析装置和结构分析方法,其可以分析结构被破坏之前引起的结构的状态变化,例如结构劣化的状态变化等。 一种结构分析装置(10)包括检测结构振动的振动检测单元(11)和分析振动检测单元(11)的输出信号的分析单元(12)。 分析单元(12)通过将在进行分析时存在的状态下使用以下公式(1)测量的谐振锐度Q的值与共振锐度Q的值进行比较来分析结构的状态变化 其通过使用下列公式(1)在标准状态下测量。