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1. 发明授权

US08497451B2 Brittle nonmetallic workpiece and method and device for making same 有权
标题翻译：脆性非金属工件及其制造方法及装置
公开(公告)号：US08497451B2
公开(公告)日：2013-07-30
申请号：US12141091
申请日：2008-06-18
申请人： Mu-Chi Hsu , Qing Liu , Guo-Han Yue , Chi-Lu Chih , Jun-Qi Li
发明人： Mu-Chi Hsu , Qing Liu , Guo-Han Yue , Chi-Lu Chih , Jun-Qi Li
IPC分类号： B23K26/00 , C03B33/02 , C03B33/09
CPC分类号： C03B33/091 , B23K26/0736 , B23K26/146 , B23K26/364 , B23K26/40 , B23K2103/50 , C03B33/04 , Y10T225/12 , Y10T225/307 , Y10T428/315
摘要： An exemplary brittle non-metallic workpiece (70) is made by the laser beam (31), a cutting surface (701 ) of the brittle non-metallic workpiece has no micro cracks. A method for making the brittle non-metallic workpiece includes: focusing a laser beam on the brittle non-metallic substrate to form an elliptic beam spot; driving the laser beam to move along a predetermined curved cutting path, making a center of a major axis of the elliptic beam spot intersecting along the predetermined curved cutting path and the major axis being tangent to the predetermined curved cutting path at the intersecting point; a coolant stream following the elliptic beam spot to move, thus producing a crack in the brittle non-metallic substrate corresponding to the predetermined curved cutting path; separating the brittle non-metallic substrate along the crack. A laser cutting device (40) for making the same is also provided.
摘要翻译：通过激光束（31）制成示例性的脆性非金属工件（70），脆性非金属工件的切割面（701）没有微裂纹。制造脆性非金属工件的方法包括：将激光束聚焦在脆性非金属基底上以形成椭圆形光斑; 驱动所述激光束沿着预定的弯曲切割路径移动，使得所述椭圆光束点的长轴的中心沿着所述预定弯曲切割路径相交，并且所述长轴在所述交叉点处与所述预定弯曲切割路径相切; 沿着椭圆形光束点移动的冷却剂流，从而在对应于预定弯曲切割路径的脆性非金属基板中产生裂纹; 沿着裂纹分离脆性非金属基材。还提供了一种用于制造它的激光切割装置（40）。

2. 发明授权

US07756673B2 Measuring device for measuring aspects of objects 有权
标题翻译：用于测量物体方面的测量装置
公开(公告)号：US07756673B2
公开(公告)日：2010-07-13
申请号：US11966964
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li
发明人： Qing Liu , Jun-Qi Li
IPC分类号： G01B3/22
CPC分类号： G01B5/008 , G01B7/008 , G01B2210/44
摘要： An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.
摘要翻译：用于测量物体方面的示例性测量装置（100）包括第一轮廓测量探针（10），第二轮廓测量探针（20）和处理器（30）。第一轮廓测量探针（10）具有第一末端延伸部（16）和第一位移传感器（19）。第一末端延伸部（16）可沿第一方向滑动。第一位移传感器（19）用于感测第一末端延伸部（16）的位移。第二轮廓测量探针（20）具有第二末端延伸部（26）和第二位移传感器。第二末端延伸部26可沿第一方向滑动。第二位移传感器用于感测第二末端延伸部（26）的位移。处理器（30）分别电连接到第一位移传感器（19）和第二位移传感器。

3. 发明授权

US07650701B2 Contour measuring probe 有权
标题翻译：轮廓测量探头
公开(公告)号：US07650701B2
公开(公告)日：2010-01-26
申请号：US11966952
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li
发明人： Qing Liu , Jun-Qi Li
IPC分类号： G01B5/004 , G01B5/20
CPC分类号： G01B3/008 , G01B5/012 , Y10S33/02
摘要： An exemplary contour measuring probe (10) includes a tube guide (12), a tip extension (20), a pair of hollow tubes (16), a plurality of pipes (104, 106), a linear measuring scale (18), and a displacement sensor (19). The tip extension (20) is configured to touch a surface of an object (50). The hollow tubes (16) are configured to be driven by a flux of air to push the tip extension (20) to move. The pipes (104, 106) are obliquely disposed in a tube guide (12) relative to the hollow tubes (16). The pipes (104, 106) allow the flux of air to be pumped on a sidewall of the hollow tubes (16). A part of the flux of air is ejected out of the tube guide (12). The linear measuring scale (18) and the displacement sensor (19) are respectively fixed relative to one of the tube guide (12) and the tip extension (20). The linear measuring scale (18) displays values of displacements of the tip extension (20). The displacement sensor (19) detects and reads the displacement values displayed by the linear measuring scale (18).
摘要翻译：示例性轮廓测量探针（10）包括管引导件（12），尖端延伸部（20），一对中空管（16），多个管（104,106），线性测量标尺（18）和位移传感器（19）。尖端延伸部（20）构造成接触物体（50）的表面。中空管（16）构造成由空气流驱动以推动末端延伸部（20）移动。管道（104,106）相对于中空管道（16）倾斜地布置在管子引导件（12）中。管道（104,106）允许空气通量泵送到中空管（16）的侧壁上。空气通量的一部分从管引导件（12）中排出。线性测量刻度（18）和位移传感器（19）分别相对于管引导件（12）和尖端延伸部（20）中的一个固定。线性测量刻度（18）显示尖端延伸部（20）的位移值。位移传感器（19）检测并读取由线性测量秤（18）显示的位移值。

4. 发明授权

US07597034B2 Machining method employing oblique workpiece spindle 有权
标题翻译：采用倾斜工件主轴的加工方法
公开(公告)号：US07597034B2
公开(公告)日：2009-10-06
申请号：US11944468
申请日：2007-11-23
申请人： Qing Liu , Jun-Qi Li
发明人： Qing Liu , Jun-Qi Li
IPC分类号： B23B1/00 , B23B3/00
CPC分类号： B23C3/20 , B23C1/06 , B23C3/023 , B23C2250/16 , Y10T82/10 , Y10T82/2502
摘要： An exemplary machining method used to machine a predetermined curved surface on a workpiece (46) comprising: (1) providing a machining apparatus (30), the machining apparatus including a vertical tool spindle (40) for mounting a tool (42) and a workpiece spindle (44) being rotatable in an axis thereof, the tool spindle being rotatable relative to a vertical direction, a rotational axis of the workpiece spindle is oblique relative to a rotational axis of the tool spindle; (2) mounting the workpiece onto the workpiece spindle; (3) driving the spindle and the workpiece spindle to rotate, and positioning the tool corresponding to the workpiece; and (4) driving a machining point of the tool to move on the predetermined curved surface and along a path passing through a top point “P” and any point “Q” of an edge of the predetermined curved surface.
摘要翻译：一种用于加工工件（46）上的预定弯曲表面的示例性加工方法，包括：（1）提供加工装置（30），所述加工装置包括用于安装工具（42）和垂直工具主轴工件主轴（44）能够沿其轴线旋转，所述工具主轴能够相对于垂直方向旋转，所述工件主轴的旋转轴线相对于所述工具主轴的旋转轴线倾斜; （2）将工件安装在工件主轴上; （3）驱动主轴和工件主轴旋转，并将刀具对准工件定位; 以及（4）驱动工具的加工点在预定弯曲表面上并且沿着通过顶点“P”的路径和预定曲面的边缘的任何点“Q”移动。

5. 发明申请

US20090037140A1 CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS 有权
标题翻译：用于测量物体方面的轮廓测量方法
公开(公告)号：US20090037140A1
公开(公告)日：2009-02-05
申请号：US11966957
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B5/20
CPC分类号： G01B5/20
摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.
摘要翻译：用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括两个轮廓测量探针和处理器的测量装置，所述轮廓测量探针具有尖端延伸部和用于感测尖端延伸部的位移的位移传感器，处理器电连接到位移传感器; （2）驱动两个尖端延伸部分别接触物体的两个相对表面; （3）驱动两个末端延伸部分别移动和接触物体的两个相对表面，同时位移传感器将尖端延伸部上的位移信息发送到处理器; （4）根据所述尖端延伸部上的位移信息，由所述处理器计算所述物体的横截面; （5）重复步骤（3）和（4），处理器计算对象的多个横截面，编制横截面以获得对象的方面。

6. 发明授权

US07726036B2 Contour measuring probe 有权
标题翻译：轮廓测量探头
公开(公告)号：US07726036B2
公开(公告)日：2010-06-01
申请号：US11966951
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B5/20 , G01B5/00
CPC分类号： G01B5/012 , G01B3/008
摘要： An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).
摘要翻译：示例性轮廓测量探针包括导向件（12），可移动齿条，反平衡机构，线性测量秤（24）和位移传感器（26）。可动齿条包括用于接触物体表面的末端延伸部（20）。在作用在可移动支架上的重力作用下，推动末端延伸部20向物体移动。反平衡机构被构造成部分地平衡作用在可移动支架上的重力。线性测量刻度（24）显示尖端延伸部（20）的位移值。位移传感器（26）检测并读取由线性测量秤（24）显示的位移值。

7. 发明授权

US07654008B2 Contour measuring method for measuring aspects of objects 有权
标题翻译：轮廓测量方法用于测量物体的各个方面
公开(公告)号：US07654008B2
公开(公告)日：2010-02-02
申请号：US11966956
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B5/20
CPC分类号： G01B5/20 , G01B5/012
摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.
摘要翻译：用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括尖端延伸部（16），位移传感器（19）和连接到位移传感器的处理器（119）的轮廓测量探针（10）所述尖端延伸部可沿第一方向滑动; （2）驱动尖端延伸部移动以便在第一预定点与物体接触，并且在处理器中记录第一预定点的坐标; （3）驱动尖端延伸部中的一个和物体移动，因此，尖端延伸部在第二预定点处与物体接触，位移传感器感测尖端延伸部沿着第一方向的位移，并将位移发送到处理器，并且所述处理器记录所述第二预定点的坐标; 和（4）重复步骤（3），处理器记录一系列点的测量坐标。

8. 发明授权

US07490413B2 Contour measuring device with error correcting unit 有权
标题翻译：具有纠错单元的轮廓测量装置
公开(公告)号：US07490413B2
公开(公告)日：2009-02-17
申请号：US11843664
申请日：2007-08-23
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B5/20 , G01B11/24
CPC分类号： G01B5/20 , G01B11/24 , G01B21/045
摘要： An exemplary contour measuring device (100) includes a pair of guide rails (13), a movable fixture (14), a first probe (15), a second probe (16), and an error correcting unit (17). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.
摘要翻译：示例性轮廓测量装置（100）包括一对导轨（13），可移动夹具（14），第一探针（15），第二探针（16）和误差校正单元（17）。可动夹具可移动地设置在导轨上。第一探针被配置为沿着轮廓测量方向测量物体，并且从待测量对象获得第一测量轮廓值。第二探针被配置用于沿轮廓测量方向测量其轮廓已知的标准物体，并从标准物体获得第二测量轮廓值。误差校正单元被配置为根据第二测量轮廓值来补偿第一测量轮廓值。

9. 发明申请

US20090030650A1 CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS 有权
标题翻译：用于测量物体方面的轮廓测量方法
公开(公告)号：US20090030650A1
公开(公告)日：2009-01-29
申请号：US11966956
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B5/20
CPC分类号： G01B5/20 , G01B5/012
摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.
摘要翻译：用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括尖端延伸部（16），位移传感器（19）和连接到位移传感器的处理器（119）的轮廓测量探针（10）所述尖端延伸部可沿第一方向滑动; （2）驱动尖端延伸部移动以便在第一预定点与物体接触，并且在处理器中记录第一预定点的坐标; （3）驱动尖端延伸部中的一个和物体移动，因此，尖端延伸部在第二预定点处与物体接触，位移传感器感测尖端延伸部沿着第一方向的位移，并将位移发送到处理器，并且所述处理器记录所述第二预定点的坐标; 和（4）重复步骤（3），处理器记录一系列点的测量坐标。

10. 发明授权

US07725290B2 Contour measuring method for measuring aspects of objects 有权
标题翻译：轮廓测量方法用于测量物体的各个方面
公开(公告)号：US07725290B2
公开(公告)日：2010-05-25
申请号：US11966957
申请日：2007-12-28
申请人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
发明人： Qing Liu , Jun-Qi Li , Takeo Nakagawa
IPC分类号： G01B3/22
CPC分类号： G01B5/20
摘要： An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.
摘要翻译：用于测量物体方面的示例性轮廓测量方法包括：（1）提供包括两个轮廓测量探针和处理器的测量装置，所述轮廓测量探针具有尖端延伸部和用于感测尖端延伸部的位移的位移传感器，处理器电连接到位移传感器; （2）驱动两个尖端延伸部分别接触物体的两个相对表面; （3）驱动两个末端延伸部分别移动和接触物体的两个相对表面，同时位移传感器将尖端延伸部上的位移信息发送到处理器; （4）根据所述尖端延伸部上的位移信息，由所述处理器计算所述物体的横截面; （5）重复步骤（3）和（4），处理器计算对象的多个横截面，编制横截面以获得对象的方面。

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