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1. 发明授权

US5739890A Liquid crystal display device and a method of fabricating same 失效
标题翻译：液晶显示装置及其制造方法
公开(公告)号：US5739890A
公开(公告)日：1998-04-14
申请号：US597206
申请日：1996-02-06
申请人： Mitsuru Uda , Masami Shinohara , Mamoru Nishida
发明人： Mitsuru Uda , Masami Shinohara , Mamoru Nishida
IPC分类号： G02F1/1335 , G02F1/1339 , G02F1/1362
CPC分类号： G02F1/13394 , G02F1/136277 , G02F1/133512 , G02F1/133553
摘要： This invention relates to a reflection liquid crystal display device using a reflection liquid crystal light bulb and a method for fabricating such liquid crystal display devices, and an object thereof is to provide a liquid crystal display device and its manufacture wherein the numerical aperture of the subpixel is increased to improve the display brightness. The present method comprises the steps of forming an optical absorbing layer 26 on a semiconductor substrate 1; forming a plurality of light reflecting films 32 on the optical absorbing layer 26 via an insulating film 28; forming an insulating film 36 all over the surface; coating positive photoresist all over the insulating film 36 to form a resist layer 64; exposing and developing the resist layer 64 from above to form a mask in such a way that the resist layer 64 remains only on the regions between the plurality of light reflecting films 32 in a self-aligned manner; and using the mask to etch the insulating film 36 to form pillar-shape spacers 34 on the regions between the plurality of light reflecting films 32.
摘要翻译：本发明涉及一种使用反射型液晶灯泡的反射型液晶显示装置及其制造方法，其目的在于提供一种液晶显示装置及其制造方法，其中子像素的数值孔径增加显示亮度。本方法包括在半导体衬底1上形成光吸收层26的步骤; 通过绝缘膜28在光吸收层26上形成多个光反射膜32; 在整个表面上形成绝缘膜36; 在绝缘膜36上涂覆正性光致抗蚀剂层以形成抗蚀剂层64; 从上方露出和显影抗蚀剂层64以使得抗蚀剂层64以自对准方式仅保留在多个光反射膜32之间的区域上的方式形成掩模; 并且使用掩模来蚀刻绝缘膜36，以在多个光反射膜32之间的区域上形成柱状间隔物34。

2. 发明授权

US06452671B1 Illuminator for macro inspection, macro inspecting apparatus and macro inspecting method 失效
标题翻译：宏观检查灯，宏观检测仪器及宏观检测方法
公开(公告)号：US06452671B1
公开(公告)日：2002-09-17
申请号：US09698423
申请日：2000-10-27
申请人： Mitsuru Uda , Tsuyoshi Yamaguchi , Masami Shinohara
发明人： Mitsuru Uda , Tsuyoshi Yamaguchi , Masami Shinohara
IPC分类号： G01N2100
CPC分类号： G01N21/956
摘要： The inspecting apparatus according to the present invention includes an illuminator for emitting radiation onto a substrate having a surface on which a fine feature pattern is formed. Inspection for defects in the pattern is performed by visually inspecting radiation diffracted by the surface. The illuminator provides radiation including two different complementary colors.
摘要翻译：根据本发明的检查装置包括用于将辐射发射到具有形成有精细特征图案的表面的基板上的照明器。通过视觉检查由表面衍射的辐射来进行图案中的缺陷的检查。照明器提供包括两种不同补色的辐射。

3. 发明授权

US06614502B2 Reflection type liquid crystal device, manufacturing method therefor, and projection display system 有权
标题翻译：反射型液晶装置及其制造方法和投影显示系统
公开(公告)号：US06614502B2
公开(公告)日：2003-09-02
申请号：US09824674
申请日：2001-04-04
申请人： Masami Shinohara , Mitsuru Uda
发明人： Masami Shinohara , Mitsuru Uda
IPC分类号： G02F11335
CPC分类号： G02F1/13439 , G02F1/133553 , G02F1/136 , G02F2001/133357
摘要： An active matrix reflective liquid crystal device includes an array substrate which includes switching elements corresponding to pixels and an array of pixel electrodes connected to the switching elements; and an opposing substrate which has a transparent electrode opposite the array of pixel electrodes with a liquid crystal layer inserted therebetween. Each of the pixel electrodes includes an array of electrode studs, (e.g., divided electrode elements). The regions between the electrodes are filled with an insulating material, and the surface of the stud array is planarized by chemical-mechanical polishing (CMP). A dielectric light reflective film is formed on the planarized surface of the stud array, and a liquid crystal molecule alignment film is deposited thereon. Thus, a reflection type liquid crystal device is provided having a planarized light reflective face for a reduced reflection loss, along with a method for manufacturing the same, and a projection display system using such a reflection type liquid crystal device.
摘要翻译：有源矩阵反射型液晶装置包括阵列基板，其包括与像素相对应的开关元件和连接到开关元件的像素电极阵列; 以及对置基板，其具有与像素电极阵列相对的透明电极，液晶层插入其间。每个像素电极包括电极柱的阵列（例如分开的电极元件）。电极之间的区域填充有绝缘材料，并且通过化学机械抛光（CMP）将螺柱阵列的表面平坦化。在螺柱阵列的平坦化表面上形成电介质光反射膜，并在其上沉积液晶分子取向膜。因此，提供一种反射型液晶装置，其具有用于降低反射损耗的平坦化的光反射面及其制造方法，以及使用这种反射型液晶装置的投影显示系统。

4. 发明授权

US06781650B1 Liquid crystal light valve and method for producing same, and liquid crystal projection display device 失效
标题翻译：液晶光阀及其制造方法及液晶投影显示装置
公开(公告)号：US06781650B1
公开(公告)日：2004-08-24
申请号：US09662192
申请日：2000-09-14
申请人： Evan George Colgan , Masami Shinohara , Mitsuru Uda
发明人： Evan George Colgan , Masami Shinohara , Mitsuru Uda
IPC分类号： G02F11335
CPC分类号： G02F1/136209 , G02F1/136277
摘要： Incident light from the space between the light-reflecting films in a liquid crystal light valve of a liquid crystal display device, especially in a reflection-type liquid crystal light valve of a projection-type liquid crystal display device is effectively blocked. The liquid crystal light valve having a semiconductor substrate, a counter substrate, light-reflecting films, and liquid crystal comprises a light-blocking layer and light shields formed between the light-blocking layer and the light-reflecting films.
摘要翻译：在液晶显示装置的液晶光阀中的光反射膜之间的空间，特别是在投射型液晶显示装置的反射型液晶光阀中的入射光被有效地阻挡。具有半导体衬底，对向衬底，光反射膜和液晶的液晶光阀包括遮光层和在遮光层和光反射膜之间形成的遮光板。

5. 发明授权

US06654129B1 Film thickness testing apparatus and method 有权
标题翻译：薄膜厚度测试仪和方法
公开(公告)号：US06654129B1
公开(公告)日：2003-11-25
申请号：US09516039
申请日：2000-03-01
申请人： Mitsuru Uda , Masami Shinohara
发明人： Mitsuru Uda , Masami Shinohara
IPC分类号： G01B902
CPC分类号： G01B11/0625
摘要： To provide a film thickness testing apparatus and a film thickness testing method in which coherence between light reflected from the surface of a film and light reflected from the surface of a substrate is improved so as to accurately visually test film thickness irregularities. Film thickness testing is conducted by using a light source part for irradiating a substrate with light having an intensity peak with a half band width of 30 nm or less and having spectral intensity in a peak wavelength region alone.
摘要翻译：为了提供薄膜厚度测试装置和薄膜厚度测试方法，其中改善了从膜表面反射的光与从基板表面反射的光之间的相干性，以便精确地目视地测试膜厚不规则性。通过使用用于对具有半波长宽度为30nm以下的强度峰值的光照射基板并且仅在峰值波长区域具有光谱强度的光源部进行膜厚测试。

6. 发明授权

US06292246B1 Reflection type liquid crystal device, manufacturing method therefor, and projection display system 有权
标题翻译：反射型液晶装置及其制造方法和投影显示系统
公开(公告)号：US06292246B1
公开(公告)日：2001-09-18
申请号：US09256292
申请日：1999-02-24
申请人： Masami Shinohara , Mitsuru Uda
发明人： Masami Shinohara , Mitsuru Uda
IPC分类号： G02F11335
CPC分类号： G02F1/13439 , G02F1/133553 , G02F1/136 , G02F2001/133357
摘要： An active matrix reflective liquid crystal device includes an array substrate which includes switching elements corresponding to pixels and an array of pixel electrodes connected to the switching elements; and an opposing substrate which has a transparent electrode opposite the array of pixel electrodes with a liquid crystal layer inserted therebetween. Each of the pixel electrodes includes an array of electrode studs, (e.g., divided electrode elements). The regions between the electrodes are filled with an insulating material, and the surface of the stud array is planarized by chemical-mechanical polishing (CMP). A dielectric light reflective film is formed on the planarized surface of the stud array, and a liquid crystal molecule alignment film is deposited thereon. Thus, a reflection type liquid crystal device is provided having a planarized light reflective face for a reduced reflection loss, along with a method for manufacturing the same, and a projection display system using such a reflection type liquid crystal device.
摘要翻译：有源矩阵反射型液晶装置包括阵列基板，其包括与像素相对应的开关元件和连接到开关元件的像素电极阵列; 以及对置基板，其具有与像素电极阵列相对的透明电极，液晶层插入其间。每个像素电极包括电极柱的阵列（例如分开的电极元件）。电极之间的区域填充有绝缘材料，并且通过化学机械抛光（CMP）将螺柱阵列的表面平坦化。在螺柱阵列的平坦化表面上形成电介质光反射膜，并在其上沉积液晶分子取向膜。因此，提供一种反射型液晶装置，其具有用于降低反射损耗的平坦化的光反射面及其制造方法，以及使用这种反射型液晶装置的投影显示系统。

7. 发明授权

US07719672B2 Macro inspection apparatus and microscopic inspection method 失效
标题翻译：宏观检查仪器和显微镜检查方法
公开(公告)号：US07719672B2
公开(公告)日：2010-05-18
申请号：US12327222
申请日：2008-12-03
申请人： Atsushi Kohayase , Mitsuru Uda
发明人： Atsushi Kohayase , Mitsuru Uda
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/8422 , G01N21/9501
摘要： The invention provides a macro inspection apparatus including: a stage on which an inspection object is placed; a light source that irradiates light on an upper surface of the inspection object from an angular direction arbitrarily selected relative to the upper surface of the inspection object; and a line sensor which is placed in an angular direction selected relative to the upper surface of the inspection object so that an optical axis thereof corresponds with an edge of the upper surface area irradiated by the light source and which receives reflected light from the edge of the upper surface area of the inspection object.
摘要翻译：本发明提供了一种宏观检查装置，包括：放置检查对象的阶段; 从相对于检查对象的上表面任意选择的角度方向对检查对象的上表面照射光的光源; 以及线传感器，其以相对于检查对象的上表面选择的角度方向放置，使得其光轴对应于由光源照射的上表面区域的边缘，并且接收来自检查对象的上表面积。

8. 发明授权

US07440118B2 Apparatus and method for color filter inspection 失效
标题翻译：彩色滤光片检查装置及方法
公开(公告)号：US07440118B2
公开(公告)日：2008-10-21
申请号：US11419030
申请日：2006-05-18
申请人： Mitsuru Uda , Atsushi Kohayase , Hiroshi Yamashita
发明人： Mitsuru Uda , Atsushi Kohayase , Hiroshi Yamashita
IPC分类号： G01B11/30
CPC分类号： G01N21/95 , G01N21/86 , G01N2021/9511
摘要： The present invention provides an apparatus and method for detecting flatness and/or unevenness of a surface of an overcoat layer on a colored pixel layer of a color filter with a high degree of accuracy. The apparatus includes: a light source 34, placed almost directly above the surface of a plate 30, for emitting an emission-line spectrum corresponding to at least one color of coloring particles in a color filter 32; a photo-receiver 36, placed obliquely upward with respect to the surface of the plate 30 and having a spectral sensitivity corresponding to the emission-line spectrum of the light source, for receiving reflected light from the color filter 32 on the plate 30 during inspection; and a detection means 42 for creating a brightness distribution for a color using a color signal output from the photo-receiver 36 as corresponding to its spectral sensitivity to detect the flatness (unevenness) of the surface of an overcoat layer 16.
摘要翻译：本发明提供了一种用于以高精度检测滤色器的着色像素层上的外涂层的表面的平坦度和/或不均匀性的装置和方法。该装置包括：几乎位于板30表面上方的光源34，用于发射与滤色器32中的至少一种着色颗粒颜色相对应的发射线光谱; 相对于板30的表面倾斜向上放置并具有与光源的发射线光谱相对应的光谱灵敏度的光电接收器36，用于在检查期间接收来自板30上的滤色器32的反射光 ; 以及检测装置42，用于根据其光谱灵敏度，使用从光接收器36输出的颜色信号产生颜色的亮度分布，以检测外涂层16的表面的平坦度（不均匀性）。

9. 发明授权

US06040888A Positioning of posts in liquid crystal valves for a projection display device 失效
标题翻译：用于投影显示装置的液晶阀中的柱的定位
公开(公告)号：US06040888A
公开(公告)日：2000-03-21
申请号：US973734
申请日：1997-11-14
申请人： Shinohara Masami , Mitsuru Uda , Kunio Enami
发明人： Shinohara Masami , Mitsuru Uda , Kunio Enami
IPC分类号： G02F1/1339 , H04N9/31 , G02F1/1335
CPC分类号： H04N9/3105 , G02F1/13394
摘要： A liquid crystal display device having pillar-shaped spacers formed in pixel array regions is provided with improved display quality by preventing the degradation of contrast and the occurrence of residual images. A plurality of pillar-shape spacers formed in their pixel array regions are provided at locations which do not overlap with each other when images are projected on the screen using three different liquid crystal light valves to project the red (R), green (G) and blue (B), constituents of images.
摘要翻译： PCT No.PCT / JP95 / 01031 Sec。 371日期：1997年11月14日 102（e）日期1997年11月14日PCT提交1995年5月29日PCT公布。出版物WO96 / 38755 日期：1996年12月5日具有形成在像素阵列区域中的柱状间隔物的液晶显示装置通过防止对比度的劣化和残留图像的发生而具有改进的显示质量。当使用三个不同的液晶光阀将图像投射到屏幕上以投影红色（R），绿色（G））时，在其像素阵列区域中形成的多个柱状间隔物设置在彼此不重叠的位置处，和蓝色（B），图像的成分。

10. 发明授权

US07525651B2 Inspection apparatus and inspection method for pattern profile, and exposure apparatus 有权
标题翻译：图案轮廓的检查装置和检查方法以及曝光装置
公开(公告)号：US07525651B2
公开(公告)日：2009-04-28
申请号：US11924126
申请日：2007-10-25
申请人： Mitsuru Uda , Kazunari Terakawa , Akira Susuki , Chiaki Oishi , Yasuharu Yamada , Teruhiko Havano
发明人： Mitsuru Uda , Kazunari Terakawa , Akira Susuki , Chiaki Oishi , Yasuharu Yamada , Teruhiko Havano
IPC分类号： G01N21/00
CPC分类号： G03F7/70616 , G01N21/956 , G03F7/70641
摘要： Disclosed is a pattern inspection apparatus which easily and highly accurately detects a profile error (deviation) of at least one pattern having a cross section with projections and recesses. The inspection apparatus for the pattern 32 is for detecting the profile error of the pattern having a cross section with a projection and a recess. This inspection apparatus includes a plate 30 on which a pattern is mounted, light sources 40, 42 and 44 which can change angles of illuminating light emitted onto the pattern, within a range of 15 to 75 degrees with reference to the top surface of the pattern, and photodetectors 52 and 54 which can receive reflected light from the pattern at an angle within a range of 15 to 75 degrees with reference to the top surface of the pattern. The inspection apparatus is characterized by that the profile error of the pattern is detected based on an amount of the reflected light from an edge between the top surface and the side surface of each of the patterns.
摘要翻译：公开了一种图案检查装置，其容易且高精度地检测至少一个具有突起和凹陷的横截面的图案的轮廓误差（偏差）。用于图案32的检查装置用于检测具有突起和凹部的横截面的图案的轮廓误差。该检查装置包括其上安装图案的板30，可以将照射到图案上的照明光的角度相对于图案的顶表面在15至75度的范围内变化的光源40,42和44 以及光电检测器52和54，其可以以相对于图案的顶表面以15至75度的范围内的角度接收来自图案的反射光。检查装置的特征在于，基于来自每个图案的顶表面和侧表面之间的边缘的反射光的量来检测图案的轮廓误差。

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