会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明专利
    • Method and apparatus for preparing metallic film, and apparatus for preparing layered film
    • 制备金属膜的方法和装置,以及制备薄膜的装置
    • JP2006002197A
    • 2006-01-05
    • JP2004178117
    • 2004-06-16
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • OBA YOSHIYUKISAKAMOTO HITOSHITONEGAWA YUTAKAOGURA KENHACHIMAN NAOKI
    • C23C16/06C23C16/24C23C16/28H01L21/28H01L21/285
    • PROBLEM TO BE SOLVED: To provide a method for preparing a metallic film, which forms the film at a high speed without damaging a substrate; an apparatus therefor; and an apparatus for preparing a layered film.
      SOLUTION: The method for preparing the metallic film comprises the steps of: placing a substrate 3 in a chamber 1 in which a pressure can be controlled; supplying a halogen-based source gas containing B or Si onto a member 10 to be etched from above, which is arranged in the chamber 1 and is made of a 3d transition metal, and at the same time forming the plasma 19 of a source gas to form free radicals of a halogen element; producing a precursor 20 containing the 3d transition metal included in the member 10, by etching the member 10 with the free radicals of the halogen element; and forming the film of the precursor 20 on the substrate 3 which has been controlled to a lower temperature than that of the member 10, and reducing the film-formed precursor 20 with the free radicals of the halogen element, to prepare the metallic film of the 3d transition metal or the 3d transition metal containing B or Si, on the substrate 3.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种制备金属膜的方法,该方法在不损坏基材的情况下高速形成膜; 一种装置; 以及制备层状膜的装置。 解决方案:制备金属膜的方法包括以下步骤:将基底3放置在可以控制压力的腔室1中; 将含有B或Si的卤素源气体从上方供给到要被蚀刻的构件10上,该构件设置在室1中并由3d过渡金属制成,同时形成源气体的等离子体19 以形成卤素元素的自由基; 通过用卤素元素的自由基蚀刻构件10,制造包含构件10中包含的3d过渡金属的前体20; 在基板3上形成前体20的膜,将其控制在比构件10的温度低的温度下,用卤素元素的自由基还原成膜前体20,制作金属膜 在底物3上含有B或Si的3d过渡金属或3d过渡金属。版权所有(C)2006,JPO&NCIPI
    • 5. 发明专利
    • Metallic film forming method and device
    • 金属膜形成方法和装置
    • JP2003328127A
    • 2003-11-19
    • JP2002132409
    • 2002-05-08
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • SAKAMOTO HITOSHIOBA YOSHIYUKINISHIMORI TOSHIHIKOMATSUDA RYUICHIHACHIMAN NAOKI
    • C23C16/06C23C16/14C23C16/50C23C16/505H01L21/285
    • PROBLEM TO BE SOLVED: To provide a metallic film forming method for forming a high quality film, even if a high density gaseous starting material is supplied to improve film forming efficiency. SOLUTION: Temperatures of a copper plate member 7 to be etched and a substrate 3, and temperature difference between them are controlled to prescribed respective temperatures and temperature difference, thereby etching the copper plate member 7 with the Cl 2 gas plasma in a chamber 1 to form a precursor 15 containing Cu. While this precursor 15 is adsorbed on the substrate 3, a high frequency electric power is supplied to an auxiliary antenna 17, so that a part of the precursor 15 is dissociated in the proximity of the substrate 3 to form Cl*. With this Cl 2 , Cl is abstracted from the CuCl adsorbed on the substrate 3, thereby accelerating a prescribed film-forming reaction in which Cu component is precipitated on the substrate 3. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:即使提供高密度气态原料以提高成膜效率,提供一种形成高质量薄膜的金属成膜方法。 解决方案:要蚀刻的铜板构件7和基板3的温度以及它们之间的温度差被控制为规定的各自的温度和温度差,从而用Cl 2蚀刻铜板构件7, / SB>气体等离子体,以形成含有Cu的前体15。 当该前体15被吸附在基板3上时,将高频电力供给到辅助天线17,使得前体15的一部分在基板3附近解离以形成Cl *。 使用该Cl 2 ,从吸附在基板3上的CuCl中抽出Cl,从而加速在基板3上析出Cu成分的规定的成膜反应。版权所有(C) )2004,JPO
    • 6. 发明专利
    • Device and method for producing metallic film
    • 用于生产金属膜的装置和方法
    • JP2005240187A
    • 2005-09-08
    • JP2005133961
    • 2005-05-02
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • SAKAMOTO HITOSHIMATSUDA RYUICHIHACHIMAN NAOKI
    • C23C16/14H01L21/285
    • PROBLEM TO BE SOLVED: To provide a device for producing a metallic film in which the film deposition speed is high, an inexpensive material can be used, and no impurities remain in the film, and a method for producing the metallic film.
      SOLUTION: A gaseous starting material is fed into a chamber 1 from a nozzle 12, electromagnetic wave is made incident in the chamber 1 from a plasma antenna 9, and an etching reaction is generated on a copper plate member 7 with Cl
      2 gas plasma 14 to generate a precursor (CuxCly) 15. The precursor (CuxCly) 15 to be conveyed to a substrate 3 which is controlled at a temperature lower than that of the copper plate member 7 is turned into only Cu ions by a reducing reaction and made impinge onto the substrate 3. A Cu thin film 16 is generated on the surface of the substrate 3. The Cu thin film 16 whose deposition speed is high, whose cost is considerably reduced, and whose quality is high is generated.
      COPYRIGHT: (C)2005,JPO&NCIPI
    • 要解决的问题:为了提供一种薄膜沉积速度高的金属膜的制造装置,可以使用廉价的材料,并且不会在膜中残留杂质,以及金属膜的制造方法。 解决方案:气体原料从喷嘴12进入腔室1,电磁波从等离子体天线9入射到腔室1中,并且在铜板构件7上产生蚀刻反应, SB> 2 气体等离子体14以产生前体(CuxCly)15.将被输送到基板3的前体(CuxCly)15被控制在低于铜板部件7的温度的温度下变成 仅通过还原反应产生Cu离子并撞击到基板3上。在基板3的表面上产生Cu薄膜16.沉积速度高,成本大大降低的Cu薄膜16及其质量 产生高。 版权所有(C)2005,JPO&NCIPI
    • 10. 发明专利
    • Apparatus for producing metallic film and method for producing metallic film
    • 用于生产金属膜的装置和用于生产金属膜的方法
    • JP2003328135A
    • 2003-11-19
    • JP2002132424
    • 2002-05-08
    • Mitsubishi Heavy Ind Ltd三菱重工業株式会社
    • SAKAMOTO HITOSHIOBA YOSHIYUKINISHIMORI TOSHIHIKOHACHIMAN NAOKI
    • C23C16/448C23C16/52H01L21/285
    • PROBLEM TO BE SOLVED: To eliminate stagnation in the flow of gas, to improve film quality and a film deposition rate, and to suppress the formation of particles. SOLUTION: A gaseous starting material is fed from a gas ring 12 arranged around a supporting stand 2. Only a precursor (Cu x Cl y ) 15 and excitation chlorine are allowed to exist on the surface of a substrate 3, and gas which does not participate in reaction and etching products are exhausted from an exhaust port 21 on the upper part, so that stagnation in the flow of gas is eliminated, and the stagnation of residual Cl molecules is suppressed to deposit a Cu thin film 16. The failure, e.g. that the residual Cl molecules and the Cu thin film 16 are reacted to reduce the film quality is eliminated, so that the film deposition rate is improved, and the formation of particles caused by film deposition materials onto the chamber 1 is suppressed. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了消除气体流动中的停滞,提高膜质量和膜沉积速率,并抑制颗粒的形成。 解决方案:气体原料从设置在支撑架2周围的气体环12进料。只有前体(Cu)与激发氯(CH 3) 被允许存在于基板3的表面上,并且不参与反应和蚀刻产物的气体从上部的排气口21排出,从而消除气体流中的停滞,并且停止 残留的Cl分子被抑制沉积Cu薄膜16 残留的Cl分子和Cu薄膜16反应以降低膜质量,从而提高了膜沉积速率,并且抑制了由膜沉积材料引起到室1上的颗粒的形成。 版权所有(C)2004,JPO