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    • 1. 发明申请
    • Built-in Self-test Circuit for Voltage Controlled Oscillators
    • 用于压控振荡器的内置自检电路
    • US20120286836A1
    • 2012-11-15
    • US13103571
    • 2011-05-09
    • Hsieh-Hung HsiehMing Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • Hsieh-Hung HsiehMing Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • H03K3/84
    • G01R31/2824
    • A built-in self-test circuit for testing a voltage controlled oscillator comprises a voltage controlled oscillator, a buffer having an input coupled to an output of the voltage controlled oscillator and a radio frequency peak detector coupled to the output of the buffer. The radio frequency peak detector is configured to receive an ac signal from the voltage controlled oscillator and generate a dc value proportional to the ac signal at an output of the radio frequency peak detector. Furthermore, the output of the radio frequency peak detector generates a dc value proportional to an amplitude of the ac signal from the voltage controlled oscillator when the voltage controlled oscillator functions correctly. On the other hand, the output of the radio frequency peak detector is at zero volts when the voltage controlled oscillator fails to generate an ac signal.
    • 用于测试压控振荡器的内置自检电路包括压控振荡器,具有耦合到压控振荡器的输出的输入的缓冲器和耦合到缓冲器的输出的射频峰值检测器。 射频峰值检测器被配置为从压控振荡器接收交流信号,并且在射频峰值检测器的输出处产生与ac信号成比例的直流值。 此外,当压控振荡器正常工作时,射频峰值检测器的输出产生与来自压控振荡器的ac信号的幅度成比例的直流值。 另一方面,当压控振荡器不能产生交流信号时,射频峰值检测器的输出为零伏特。
    • 4. 发明授权
    • Built-in self-test circuit for voltage controlled oscillators
    • 用于压控振荡器的内置自检电路
    • US08729968B2
    • 2014-05-20
    • US13103571
    • 2011-05-09
    • Hsieh-Hung HsiehMing Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • Hsieh-Hung HsiehMing Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • H03L5/00
    • G01R31/2824
    • A built-in self-test circuit for testing a voltage controlled oscillator comprises a voltage controlled oscillator, a buffer having an input coupled to an output of the voltage controlled oscillator and a radio frequency peak detector coupled to the output of the buffer. The radio frequency peak detector is configured to receive an ac signal from the voltage controlled oscillator and generate a dc value proportional to the ac signal at an output of the radio frequency peak detector. Furthermore, the output of the radio frequency peak detector generates a dc value proportional to an amplitude of the ac signal from the voltage controlled oscillator when the voltage controlled oscillator functions correctly. On the other hand, the output of the radio frequency peak detector is at zero volts when the voltage controlled oscillator fails to generate an ac signal.
    • 用于测试压控振荡器的内置自检电路包括压控振荡器,具有耦合到压控振荡器的输出的输入的缓冲器和耦合到缓冲器的输出的射频峰值检测器。 射频峰值检测器被配置为从压控振荡器接收交流信号,并且在射频峰值检测器的输出处产生与ac信号成比例的直流值。 此外,当压控振荡器正常工作时,射频峰值检测器的输出产生与来自压控振荡器的ac信号的幅度成比例的直流值。 另一方面,当压控振荡器不能产生交流信号时,射频峰值检测器的输出为零伏特。
    • 5. 发明授权
    • Junction varactor for ESD protection of RF circuits
    • 用于射频电路ESD保护的结型变容二极管
    • US08334571B2
    • 2012-12-18
    • US12731562
    • 2010-03-25
    • Ming-Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • Ming-Hsien TsaiTzu-Jin YehChewn-Pu JouFu-Lung Hsueh
    • H01L23/60H01L23/64H01L29/08
    • H01L27/0255H01L2924/0002H01L2924/00
    • An ESD protection device includes a first well of a first semiconductor type disposed in a substrate of a second semiconductor type forming a first diode. A second well of the second semiconductor type is formed in the substrate to form a second diode with the first well. A first plurality of doped regions of the first semiconductor type are formed in an upper surface of the first well. A second plurality of doped regions of the second semiconductor type are formed in the upper surface of the first well forming a third diode with the first well. A plurality of STI regions are formed in the upper surface of the first well. Each STI region is disposed between a doped region of the first and second semiconductor types. The third diode provides a current bypass when an ESD voltage spike is received at one of the first or second plurality of doped regions.
    • ESD保护装置包括设置在形成第一二极管的第二半导体类型的衬底中的第一半导体类型的第一阱。 第二半导体类型的第二阱形成在衬底中以与第一阱形成第二二极管。 第一半导体类型的第一多个掺杂区域形成在第一阱的上表面中。 第二半导体类型的第二多个掺杂区域形成在第一阱的上表面中,其与第一阱形成第三二极管。 多个STI区域形成在第一阱的上表面中。 每个STI区域设置在第一和第二半导体类型的掺杂区域之间。 当在第一或第二多个掺杂区域中的一个处接收ESD电压尖峰时,第三二极管提供电流旁路。