专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US07206653B1 Wafer-based planning methods and systems for batch-based processing tools 有权
标题翻译：基于晶圆的基于批处理工具的规划方法和系统
公开(公告)号：US07206653B1
公开(公告)日：2007-04-17
申请号：US11288489
申请日：2005-11-29
申请人： Ming-Feng Ou , Gwo-Chiang Fang , Chao-Fan Chang , Ju-Kau Chen , Oliver Wu
发明人： Ming-Feng Ou , Gwo-Chiang Fang , Chao-Fan Chang , Ju-Kau Chen , Oliver Wu
IPC分类号： G06F19/00
CPC分类号： G06Q10/06
摘要： Computer-implemented wafer-based planning methods for batch-based processing tools. Tool groups are appended in a tool group level of planning data provided by a MES for converting planning data from batch-based to wafer-based data. The planning data with appended tool group is applied to dispatch processing tools.
摘要翻译：基于批处理工具的计算机实现的基于晶圆的规划方法。工具组附加在由MES提供的计划数据的工具组级别中，用于将计划数据从基于批处理的数据转换为基于晶圆的数据。带有附加工具组的规划数据应用于调度处理工具。

2. 发明授权

US06963785B2 Method for target queue time calculation in semiconductor manufacturing planning 失效
标题翻译：半导体制造规划中目标队列时间计算方法
公开(公告)号：US06963785B2
公开(公告)日：2005-11-08
申请号：US10733057
申请日：2003-12-11
申请人： Ju-Kau Chen , Chao-Fan Chang , Wen-Pin Wu , Gwo-Chiang Fang , Ming-Feng Ou
发明人： Ju-Kau Chen , Chao-Fan Chang , Wen-Pin Wu , Gwo-Chiang Fang , Ming-Feng Ou
IPC分类号： G05B19/418 , G06F19/00
CPC分类号： G05B19/41865 , G05B2219/31378 , G05B2219/45031 , Y02P90/12 , Y02P90/14 , Y02P90/20 , Y02P90/86
摘要： A method is provided for product culmination estimation in a microelectronics manufacturing environment. The method includes providing a manufacturing executing system including a plurality of processing entities. The manufacturing executing system provides interconnectivity and management of the processing entities. The method also assigns a standard queue time factor to product advancing through the manufacturing executing system, and determines an actual and theoretical cycle time and associated with the product through each process entity of the manufacturing executing system. The method further includes anticipating a target queue time for the product through the manufacturing executing system, and forecasting product cycle time of the product through the manufacturing executing system.
摘要翻译：提供了一种用于微电子制造环境中的产品顶点估计的方法。该方法包括提供包括多个处理实体的制造执行系统。制造执行系统提供处理实体的互连和管理。该方法还为通过制造执行系统推进的产品分配标准队列时间因子，并通过制造执行系统的每个进程实体确定实际和理论周期时间并与产品相关联。该方法还包括通过制造执行系统预测产品的目标队列时间，以及通过制造执行系统预测产品的产品周期时间。

3. 发明申请

US20050131564A1 Method for target queue time calculation in semiconductor manufacturing planning 失效
公开(公告)号：US20050131564A1
公开(公告)日：2005-06-16
申请号：US10733057
申请日：2003-12-11
申请人： Ju-Kau Chen , Chao-Fan Chang , Wen-Pin Wu , Gwo-Chiang Fang , Ming-Feng Ou
发明人： Ju-Kau Chen , Chao-Fan Chang , Wen-Pin Wu , Gwo-Chiang Fang , Ming-Feng Ou
IPC分类号： G05B19/418 , G06F19/00
CPC分类号： G05B19/41865 , G05B2219/31378 , G05B2219/45031 , Y02P90/12 , Y02P90/14 , Y02P90/20 , Y02P90/86
摘要： A method is provided for product culmination estimation in a microelectronics manufacturing environment. The method includes providing a manufacturing executing system including a plurality of processing entities. The manufacturing executing system provides interconnectivity and management of the processing entities. The method also assigns a standard queue time factor to product advancing through the manufacturing executing system, and determines an actual and theoretical cycle time and associated with the product through each process entity of the manufacturing executing system. The method further includes anticipating a target queue time for the product through the manufacturing executing system, and forecasting product cycle time of the product through the manufacturing executing system.

4. 发明申请

US20050216110A1 System and method for fabrication backup planning 失效
标题翻译：制造备份计划的制度和方法
公开(公告)号：US20050216110A1
公开(公告)日：2005-09-29
申请号：US10809568
申请日：2004-03-25
申请人： Ju-Kau Chen , Chao-Fan Chang , Gwo-Chiang Fang
发明人： Ju-Kau Chen , Chao-Fan Chang , Gwo-Chiang Fang
IPC分类号： G05B19/418 , G06F19/00
CPC分类号： G05B19/41865 , Y02P90/20
摘要： A backup planning device within a fabrication system. The backup planning device schedules backup operations between separately located fabrication facilities by introducing a virtual tool. The capacity of the virtual tool is combined into first capacity information of a tool group to generate second capacity information thereof accordingly. The first capacity information comprises capacity information of effective tools in the respective tool group, while the second capacity information comprises capacity information of effective tools plus the virtual tool thereof. A first manufacturing plan for the tool group is determined according to a master production schedule, a WIP profile, and the second capacity information thereof. A second manufacturing plan is determined according to the workload allocation of the virtual tool in the first manufacturing plan.
摘要翻译：制造系统中的备用计划设备。备份计划设备通过引入虚拟工具安排在分开的制造设施之间的备份操作。虚拟工具的容量被组合成工具组的第一容量信息，从而相应地生成第二容量信息。第一容量信息包括相应工具组中的有效工具的容量信息，而第二容量信息包括有效工具的容量信息及其虚拟工具。根据主生产计划，WIP简档和其第二容量信息来确定工具组的第一制造计划。根据第一制造计划中的虚拟工具的工作量分配来确定第二制造计划。

5. 发明授权

US07031786B2 System and method for fabrication backup planning 失效
标题翻译：制造备份计划的制度和方法
公开(公告)号：US07031786B2
公开(公告)日：2006-04-18
申请号：US10809568
申请日：2004-03-25
申请人： Ju-Kau Chen , Chao-Fan Chang , Gwo-Chiang Fang
发明人： Ju-Kau Chen , Chao-Fan Chang , Gwo-Chiang Fang
IPC分类号： G06F19/00
CPC分类号： G05B19/41865 , Y02P90/20
摘要： A backup planning device within a fabrication system. The backup planning device schedules backup operations between separately located fabrication facilities by introducing a virtual tool. The capacity of the virtual tool is combined into first capacity information of a tool group to generate second capacity information thereof accordingly. The first capacity information comprises capacity information of effective tools in the respective tool group, while the second capacity information comprises capacity information of effective tools plus the virtual tool thereof. A first manufacturing plan for the tool group is determined according to a master production schedule, a WIP profile, and the second capacity information thereof. A second manufacturing plan is determined according to the workload allocation of the virtual tool in the first manufacturing plan.
摘要翻译：制造系统中的备用计划设备。备份计划设备通过引入虚拟工具安排在分开的制造设施之间的备份操作。虚拟工具的容量被组合成工具组的第一容量信息，从而相应地生成第二容量信息。第一容量信息包括相应工具组中的有效工具的容量信息，而第二容量信息包括有效工具的容量信息及其虚拟工具。根据主生产计划，WIP简档和其第二容量信息来确定工具组的第一制造计划。根据第一制造计划中的虚拟工具的工作量分配来确定第二制造计划。

6. 发明申请

US20050216113A1 Fabrication monitoring system 有权
标题翻译：制造监控系统
公开(公告)号：US20050216113A1
公开(公告)日：2005-09-29
申请号：US10811087
申请日：2004-03-25
申请人： Chin-Cheng Pan , Chao-Fan Chang , Pai-Cheng Huang , Oliver Wu
发明人： Chin-Cheng Pan , Chao-Fan Chang , Pai-Cheng Huang , Oliver Wu
IPC分类号： G06F19/00 , H01L21/00
CPC分类号： H01L21/67276
摘要： System and method for monitoring a fabrication process. Generally, an actual-to-planned variance is calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the planned quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site. Furthermore, a planned-to-actual variance may be calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the actual quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site.
摘要翻译：用于监控制造过程的系统和方法。一般来说，实际计划的差异是通过将每日零件指数作为计划数量和实际数量之间的增量百分比来计算的。通过在预定时间段内平均每日零件指数来计算每周零件指数。从每周零件指数来看，确定了一个考虑到在特定场地制造的产品的站点索引。此外，可以通过将每日零件指数确定为实际数量之间的计划数量和实际数量之间的差值的百分比来计算计划实际差异。通过在预定时间段内平均每日零件指数来计算每周零件指数。从每周零件指数来看，确定了一个考虑到在特定场地制造的产品的站点索引。

7. 发明授权

US07127314B2 Fabrication monitoring system 有权
标题翻译：制造监控系统
公开(公告)号：US07127314B2
公开(公告)日：2006-10-24
申请号：US10811087
申请日：2004-03-25
申请人： Chin-Cheng Pan , Chao-Fan Chang , Pai-Cheng Huang , Oliver Wu
发明人： Chin-Cheng Pan , Chao-Fan Chang , Pai-Cheng Huang , Oliver Wu
IPC分类号： G06F19/00
CPC分类号： H01L21/67276
摘要： System and method for monitoring a fabrication process. Generally, an actual-to-planned variance is calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the planned quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site. Furthermore, a planned-to-actual variance may be calculated by determining a daily part index as a percentage of the delta between the planned quantity and the actual quantity over the actual quantity. A weekly part index is calculated by averaging the daily part index over a predetermined time period. From the weekly part index, a site index is determined that takes into account products fabricated at a particular site.
摘要翻译：用于监控制造过程的系统和方法。一般来说，实际计划的差异是通过将每日零件指数作为计划数量和实际数量之间的增量百分比来计算的。通过在预定时间段内平均每日零件指数来计算每周零件指数。从每周零件指数来看，确定了一个考虑到在特定场地制造的产品的站点索引。此外，可以通过将每日零件指数确定为实际数量之间的计划数量和实际数量之间的差值的百分比来计算计划实际差异。通过在预定时间段内平均每日零件指数来计算每周零件指数。从每周零件指数来看，确定了一个考虑到在特定场地制造的产品的站点索引。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式