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    • 7. 发明授权
    • Method for manufacturing a bipolar transistor
    • 制造双极晶体管的方法
    • US07115465B2
    • 2006-10-03
    • US10838860
    • 2004-05-03
    • Michel MartyBertrand MartinetCyril Fellous
    • Michel MartyBertrand MartinetCyril Fellous
    • H01L21/8249
    • H01L29/66287H01L29/66242
    • A method for manufacturing a bipolar transistor, comprising the steps of: growing on the substrate a first semiconductor; depositing an encapsulation layer etchable with respect to the first semiconductor, forming a sacrificial block at the location of the base-emitter junction; exposing the first semiconductor around spacers formed around said block; forming a second semiconductor, then a third semiconductor etchable with respect to the second semiconductor layer, the encapsulation layer, and the spacers, the sum of the thicknesses of the second semiconductor and the sacrificial layer being substantially equal to the sum of the thicknesses of the encapsulation layer and of the sacrificial block; removing the block and the encapsulation layer; depositing a fourth semiconductor; removing the third semiconductor; and etching an insulating layer to maintain it on the emitter walls and between said emitter and the second semiconductor.
    • 一种制造双极晶体管的方法,包括以下步骤:在衬底上生长第一半导体; 沉积相对于第一半导体可蚀刻的封装层,在基极 - 发射极结的位置处形成牺牲块; 将第一半导体暴露在围绕所述块形成的间隔件周围; 形成第二半导体,然后可蚀刻相对于第二半导体层,封装层和间隔物的第三半导体,第二半导体和牺牲层的厚度之和基本上等于 封装层和牺牲块; 去除块和封装层; 沉积第四半导体; 去除第三半导体; 并蚀刻绝缘层以将其保持在发射极壁上和所述发射极与第二半导体之间。