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    • 2. 发明授权
    • Apparatus and method for ultrasonic spectroscopy testing of materials
    • 材料超声波光谱测试仪器及方法
    • US5591913A
    • 1997-01-07
    • US241862
    • 1994-05-12
    • James R. Tucker
    • James R. Tucker
    • G01N29/44G01N29/12G01N29/34G01N29/46G01N29/04
    • G01N29/348G01N29/12G01N29/346G01N29/46G01N2291/044
    • An apparatus and method for performing ultrasonic spectroscopy provides for rapid evaluation of test materials with good amplitude, balanced response at all test frequencies. A swept frequency signal is generated which is applied to a transmit transducer coupled to a test part. A receive transducer provides a detected signal that is fully digitized for real-time or post signal processing. The created swept frequency signal can be equalized from data obtained from direct coupling between transmit and receive transducers. The resultant data is analyzed for amplitude and/or phase information as a function of frequency and can be used to analyze filter characteristics, identify resonances, characterize material signatures and many other applications.
    • 用于执行超声波光谱的装置和方法提供了在所有测试频率下具有良好振幅,平衡响应的测试材料的快速评估。 产生扫描频率信号,其被施加到耦合到测试部件的发射换能器。 接收传感器提供完全数字化的检测信号,用于实时或后置信号处理。 创建的扫频信号可以从从发射和接收换能器之间的直接耦合获得的数据相等。 分析结果数据作为频率的函数的幅度和/或相位信息,并可用于分析滤波器特性,识别共振,表征材料签名和许多其他应用。
    • 10. 发明授权
    • Methods and systems for measuring target movement with an interferometer
    • 用干涉仪测量目标运动的方法和系统
    • US08223342B2
    • 2012-07-17
    • US12404815
    • 2009-03-16
    • James R. Tucker
    • James R. Tucker
    • G01B9/02G01B11/02
    • G01B9/02016G01B9/02007G01B9/02027G01B2290/45G01B2290/70
    • Systems and methods are disclosed for an interferometer system. An interferometer system may comprise a plurality of light sources, wherein each light source of the plurality is configured to transmit a source beam. The interferometer system may also include an interferometer including a polarizing beam splitter and a reference reflector. The interferometer is configured to receive the source beam and transmit a measurement beam to a target reflector and a reference beam to the reference reflector. Additionally, the interferometer system may include a plurality of receivers, wherein each receiver of the plurality is associated with a light source and configured to receive a mixed beam comprising a reflected measurement beam and a reflected reference beam. Moreover, the interferometer is configured to receive at least one source beam at an angle with respect to an axis perpendicular to a side of the interferometer configured to receive the source beam.
    • 公开了用于干涉仪系统的系统和方法。 干涉仪系统可以包括多个光源,其中多个光源中的每个光源被配置成透射源光束。 干涉仪系统还可以包括包括偏振分束器和参考反射器的干涉仪。 干涉仪被配置为接收源光束并将测量光束传输到目标反射器和参考光束到参考反射器。 另外,干涉仪系统可以包括多个接收器,其中多个接收器中的每个接收器与光源相关联,并被配置为接收包括反射测量光束和反射参考光束的混合光束。 此外,干涉仪被配置为以相对于垂直于被配置为接收源光束的干涉仪的一侧的轴线成角度地接收至少一个源光束。