会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 9. 发明申请
    • Method of testing for power and ground continuity of a semiconductor device
    • 测试半导体器件的功率和接地连续性的方法
    • US20070200586A1
    • 2007-08-30
    • US11364792
    • 2006-02-28
    • Wai PhoonVivien WongWah Tan
    • Wai PhoonVivien WongWah Tan
    • G01R31/26
    • G01R31/024
    • A method of testing for power and ground continuity of a semiconductor device having Input and Output (IO) pins and at least a pair of power and ground pins includes identifying the power and ground pins of the device. A victim pin is selected from the IO pins of the device for each pair of the power and ground pins, and an aggressor pin for each victim pin is selected from the remaining IO pins. The aggressor pins are toggled between a high state and a low state. A level of switching noise on each victim pin is measured, and the measured levels of switching noise are compared with predetermined data to determine power and ground continuity of the device.
    • 一种测试具有输入和输出(IO)引脚和至少一对电源和接地引脚的半导体器件的功率和接地连续性的方法,包括识别器件的电源和接地引脚。 从每个电源和接地引脚的器件的IO引脚中选择受害器引脚,并从其余的IO引脚中选择每个受害引脚的引脚。 侵略者引脚在高状态和低状态之间切换。 测量每个受害者引脚上的开关噪声水平,并将测量的开关噪声电平与预定数据进行比较,以确定器件的功率和接地连续性。