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    • 7. 发明授权
    • Integrated sample preparation and analyte detection
    • 综合样品制备和分析物检测
    • US08697435B2
    • 2014-04-15
    • US12871402
    • 2010-08-30
    • James R. HeilMichael J. LochheadKevin D. MollChristopher J. Myatt
    • James R. HeilMichael J. LochheadKevin D. MollChristopher J. Myatt
    • C12M1/34G01N33/543
    • G01N33/54326G01N33/54373G01N33/585Y10S435/808Y10S436/805Y10S436/806
    • A system for sample preparation and analyte detection includes a cartridge, with a fluidic channel, a waveguide, and a capture spot. The system further includes a force field generator, an imaging system, and a fluid, which includes a sample potentially containing a target analyte, first type particles, which include binding moieties specific for the target analyte and are responsive to a force field, and second type particles, which include binding moieties specific for the target analyte and are capable of generating a signal. When the sample contains the target analyte, specific binding interactions between the target analyte and binding moieties link first and second type particles via the target analyte to form multiple-particle complex capturable at a capture spot. The force field allows manipulation of the particles and multiple-particle complex such that the detected signal from the second type particles is indicative of the target analyte within the sample.
    • 用于样品制备和分析物检测的系统包括具有流体通道,波导和捕获点的盒。 该系统还包括力场发生器,成像系统和流体,其包括潜在地包含目标分析物的样品,第一类型颗粒,其包括对于目标分析物特异的并且对力场有反应的结合部分,并且第二 型颗粒,其包括对目标分析物特异性的结合部分并且能够产生信号。 当样品含有目标分析物时,目标分析物和结合部分之间的特异性结合相互作用通过目标分析物连接第一和第二类型颗粒,以在捕捉点处形成可以捕获的多重颗粒复合物。 力场允许操作颗粒和多颗粒复合物,使得来自第二类型颗粒的检测信号指示样品内的目标分析物。
    • 8. 发明申请
    • Integrated Sample Preparation and Analyte Detection
    • 综合样品制备和分析物检测
    • US20110065209A1
    • 2011-03-17
    • US12871402
    • 2010-08-30
    • James R. HeilMichael J. LochheadKevin D. MollChristopher J. Myatt
    • James R. HeilMichael J. LochheadKevin D. MollChristopher J. Myatt
    • G01N33/53G01N30/96
    • G01N33/54326G01N33/54373G01N33/585Y10S435/808Y10S436/805Y10S436/806
    • A system for sample preparation and analyte detection includes a cartridge, with a fluidic channel, a waveguide, and a capture spot. The system further includes a force field generator, an imaging system, and a fluid, which includes a sample potentially containing a target analyte, first type particles, which include binding moieties specific for the target analyte and are responsive to a force field, and second type particles, which include binding moieties specific for the target analyte and are capable of generating a signal. When the sample contains the target analyte, specific binding interactions between the target analyte and binding moieties link first and second type particles via the target analyte to form multiple-particle complex capturable at a capture spot. The force field allows manipulation of the particles and multiple-particle complex such that the detected signal from the second type particles is indicative of the target analyte within the sample.
    • 用于样品制备和分析物检测的系统包括具有流体通道,波导和捕获点的盒。 该系统还包括力场发生器,成像系统和流体,其包括潜在地包含目标分析物的样品,第一类型颗粒,其包括对于目标分析物特异的并且对力场有反应的结合部分,并且第二 型颗粒,其包括对目标分析物特异性的结合部分并且能够产生信号。 当样品含有目标分析物时,目标分析物和结合部分之间的特异性结合相互作用通过目标分析物连接第一和第二类型颗粒,以在捕捉点处形成可以捕获的多重颗粒复合物。 力场允许操作颗粒和多颗粒复合物,使得来自第二类型颗粒的检测信号指示样品内的目标分析物。
    • 9. 发明申请
    • PLANAR OPTICAL WAVEGUIDE WITH CORE OF LOW-INDEX-OF-REFRACTION INTERROGATION MEDIUM
    • 具有低折射介质介质核心的平面光波导
    • US20110049388A1
    • 2011-03-03
    • US12942234
    • 2010-11-09
    • Marie J. DelaneyKevin D. Moll
    • Marie J. DelaneyKevin D. Moll
    • G01J1/58G02B6/32
    • G01N21/552G02B6/124G02B6/4206
    • An apparatus for illuminating a sample includes a planar waveguide. The planar waveguide includes a first substrate, including a first outer surface and a first inner surface, and a second substrate, including a second outer surface and a second inner surface. The first and second inner surfaces of the first and second substrates, respectively, are spaced apart from each other and partly define a volume for confining the sample therein. The apparatus also includes a light source for providing light directed toward the planar waveguide, such that the light is optically coupled to and contained within the planar waveguide between the outer surfaces of the first and second substrates, while illuminating at least a portion of the sample confined within the volume.
    • 用于照射样品的装置包括平面波导。 平面波导包括包括第一外表面和第一内表面的第一基板和包括第二外表面和第二内表面的第二基板。 第一和第二基板的第一和第二内表面分别彼此分开,并且部分地限定用于将样品限制在其中的体积。 该装置还包括用于提供朝向平面波导的光的光源,使得光在第一和第二基板的外表面之间光耦合到平面波导内并且包含在平面波导内,同时照亮样品的至少一部分 限于卷内。
    • 10. 发明授权
    • Planar optical waveguide with core of low-index-of-refraction interrogation medium
    • 具有低折射率询问介质核的平面光波导
    • US08331751B2
    • 2012-12-11
    • US12942234
    • 2010-11-09
    • Marie J. DelaneyKevin D. Moll
    • Marie J. DelaneyKevin D. Moll
    • G02B6/10
    • G01N21/552G02B6/124G02B6/4206
    • An apparatus for illuminating a sample includes a planar waveguide. The planar waveguide includes a first substrate, including a first outer surface and a first inner surface, and a second substrate, including a second outer surface and a second inner surface. The first and second inner surfaces of the first and second substrates, respectively, are spaced apart from each other and partly define a volume for confining the sample therein. The apparatus also includes a light source for providing light directed toward the planar waveguide, such that the light is optically coupled to and contained within the planar waveguide between the outer surfaces of the first and second substrates, while illuminating at least a portion of the sample confined within the volume.
    • 用于照射样品的装置包括平面波导。 平面波导包括包括第一外表面和第一内表面的第一基板和包括第二外表面和第二内表面的第二基板。 第一和第二基板的第一和第二内表面分别彼此间隔开,并且部分地限定用于将样品限制在其中的体积。 该装置还包括用于提供朝向平面波导的光的光源,使得光在第一和第二基板的外表面之间光耦合到平面波导内并且包含在平面波导内,同时照亮样品的至少一部分 限于卷内。