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1. 发明申请

US20120309132A1 CURVILINEAR HEAT SPREADER/LID WITH IMPROVED HEAT DISSIPATION 审中-公开
标题翻译： CURVILINEAR热传播器/带有改进的散热器
公开(公告)号：US20120309132A1
公开(公告)日：2012-12-06
申请号：US13586421
申请日：2012-08-15
申请人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
发明人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
IPC分类号： B65D51/00 , H01L21/50
CPC分类号： H01L23/42 , H01L2224/05573 , H01L2224/16 , H01L2224/73253 , H01L2924/10253 , H01L2924/3511 , H01L2924/00
摘要： A heat spreader or lid for a microelectronic package, in which the heat spreader has an underside surface that includes at least one curvilinear contour, in which the curvilinear contour is selected from at least one positive or protruding curvilinear feature, at least one negative or recessed curvilinear feature, and a combination thereof. A microelectronic package that includes the heat spreader/lid, in which there is improved heat dissipation or reduced mechanical stress in an interface between the heat spreader/lid and a circuit chip.
摘要翻译：一种用于微电子封装的散热器或盖，其中散热器具有包括至少一个曲线轮廓的下表面，其中曲线轮廓选自至少一个正或突出的曲线特征，至少一个负或凹入曲线特征及其组合。包括散热器/盖的微电子封装，其中在散热器/盖和电路芯片之间的界面中改善了散热或降低了机械应力。

2. 发明授权

US08269340B2 Curvilinear heat spreader/lid with improved heat dissipation 失效
标题翻译：曲线散热器/盖具有改善的散热
公开(公告)号：US08269340B2
公开(公告)日：2012-09-18
申请号：US11857812
申请日：2007-09-19
申请人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
发明人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
IPC分类号： H01L23/34 , H01L23/10
CPC分类号： H01L23/42 , H01L2224/05573 , H01L2224/16 , H01L2224/73253 , H01L2924/10253 , H01L2924/3511 , H01L2924/00
摘要： A heat spreader or lid for a microelectronic package, in which the heat spreader has an underside surface that includes at least one curvilinear contour, in which the curvilinear contour is selected from at least one positive or protruding curvilinear feature, at least one negative or recessed curvilinear feature, and a combination thereof. A microelectronic package that includes the heat spreader/lid, in which there is improved heat dissipation or reduced mechanical stress in an interface between the heat spreader/lid and a circuit chip.
摘要翻译：一种用于微电子封装的散热器或盖，其中散热器具有包括至少一个曲线轮廓的下表面，其中曲线轮廓选自至少一个正或突出的曲线特征，至少一个负或凹入曲线特征及其组合。包括散热器/盖的微电子封装，其中在散热器/盖和电路芯片之间的界面中改善了散热或降低了机械应力。

3. 发明申请

US20090072387A1 CURVILINEAR HEAT SPREADER/LID WITH IMPROVED HEAT DISSIPATION 失效
标题翻译： CURVILINEAR热传播器/带有改进的散热器
公开(公告)号：US20090072387A1
公开(公告)日：2009-03-19
申请号：US11857812
申请日：2007-09-19
申请人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
发明人： Michael A. Gaynes , Maurice McGlashan-Powell , Soojae Park , Edward Yarmchuk
IPC分类号： H01L23/34
CPC分类号： H01L23/42 , H01L2224/05573 , H01L2224/16 , H01L2224/73253 , H01L2924/10253 , H01L2924/3511 , H01L2924/00
摘要： A heat spreader or lid for a microelectronic package, in which the heat spreader has an underside surface that includes at least one curvilinear contour, in which the curvilinear contour is selected from at least one positive or protruding curvilinear feature, at least one negative or recessed curvilinear feature, and a combination thereof. A microelectronic package that includes the heat spreader/lid, in which there is improved heat dissipation or reduced mechanical stress in an interface between the heat spreader/lid and a circuit chip.
摘要翻译：一种用于微电子封装的散热器或盖，其中散热器具有包括至少一个曲线轮廓的下表面，其中曲线轮廓选自至少一个正或突出的曲线特征，至少一个负或凹入曲线特征及其组合。包括散热器/盖的微电子封装，其中在散热器/盖和电路芯片之间的界面中改善了散热或降低了机械应力。

4. 发明申请

US20050105200A1 Method and apparatus for correcting for systematic errors in timing pattern generation 失效
标题翻译：用于校正定时模式生成中的系统误差的方法和装置
公开(公告)号：US20050105200A1
公开(公告)日：2005-05-19
申请号：US11015130
申请日：2004-12-17
申请人： Timothy Chainer , Anthony Praino , Mark Schultz , Bucknell Webb , Edward Yarmchuk
发明人： Timothy Chainer , Anthony Praino , Mark Schultz , Bucknell Webb , Edward Yarmchuk
IPC分类号： G11B5/55 , G11B5/596 , G11B21/10 , G11B5/09 , G11B21/02
CPC分类号： G11B5/59633 , G11B5/5565 , G11B21/106
摘要： Improvements in placement of timing patterns in self-servowriting include correcting for systematic errors due to geometric effects. A correction is made for varying systematic errors, such as when the recording head has spatially separate read and write elements. Further, servopattern rotation due to residual or unmeasured systematic errors is reduced by using a once per revolution clock index derived from the motor drive current waveform or any other sensor. In one aspect of correcting for systematic errors in the writing of timing patterns on a storage medium of a storage device, a time interval between a trigger pattern written at a first radial position of the storage medium and a rotational index is measured. The rotational index is related to the rotational orientation of the storage medium with respect to a fixed frame of the storage device. The location of another trigger pattern to be written is shifted, using the measured time interval to determine the shift in location for the another trigger pattern.
摘要翻译：自我维护中定时模式布局的改进包括纠正由于几何效应引起的系统误差。对变化的系统误差进行校正，例如当记录头具有空间上分离的读和写元件时。此外，通过使用从电动机驱动电流波形或任何其他传感器导出的每转一次的时钟指数来减少由于残余或未测量的系统误差引起的伺服模式旋转。在对存储装置的存储介质上的定时模式的写入进行校正系统错误的一个方面，测量在存储介质的第一径向位置上写入的触发模式与旋转指标之间的时间间隔。旋转指数与存储介质相对于存储装置的固定框架的旋转取向有关。使用测量的时间间隔来移动要写入的另一个触发模式的位置，以确定另一个触发模式的位置偏移。

5. 发明申请

US20070108984A1 Ionization test for electrical verification 失效
标题翻译：电验证电离试验
公开(公告)号：US20070108984A1
公开(公告)日：2007-05-17
申请号：US10595541
申请日：2003-11-12
申请人： Christopher Cline , Edward Yarmchuk , Vincent Arena , Donald Merte , Thomas Picunko , Brian Wojszynski , Charles Hendricks , Michael Scaman , Robert Olyha , Arnold Halperin
发明人： Christopher Cline , Edward Yarmchuk , Vincent Arena , Donald Merte , Thomas Picunko , Brian Wojszynski , Charles Hendricks , Michael Scaman , Robert Olyha , Arnold Halperin
IPC分类号： G01N27/62
CPC分类号： G01R31/2805 , G01R19/0061 , G01R31/302
摘要： A method and apparatus for the non-contact electrical test of both opens and shorts in electronic substrates. Top surface electrical test features are exposed to an ionization source under ambient conditions and the subsequent charge build up is measured as a drain current by probes contacting corresponding bottom surface features. Opens are detected by an absence of a drain current and shorts are detected by turning off the ionization source and re-measuring the bottom surface probes with a varying bias applied to each probe in the array.
摘要翻译：用于电子基板中的开口和短路的非接触电测试的方法和装置。顶部表面电测试特征在环境条件下暴露于电离源，随后的电荷积聚通过探针接触相应的底表面特征作为漏极电流测量。通过不存在漏极电流来检测开路，并且通过关闭电离源并且利用施加到阵列中的每个探针的变化的偏置来重新测量底表面探针来检测短路。

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