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    • 1. 发明申请
    • TEMPERATURE INFORMATION OUTPUTTING CIRCUIT AND A SEMICONDUCTOR MEMORY APPARATUS USING THE SAME
    • 温度信息输出电路和使用其的半导体存储器件
    • US20110026561A1
    • 2011-02-03
    • US12648505
    • 2009-12-29
    • Mi Hyun HWANG
    • Mi Hyun HWANG
    • G01K7/00
    • G01K1/026
    • A temperature information outputting circuit of a semiconductor memory apparatus for accurately performing a temperature measuring test is presented. The temperature information outputting circuit includes first, second and third temperature information outputting units. The first temperature information outputting unit outputs a first temperature information signal to a single temperature information outputting pad when a first test signal is enabled. The second temperature information outputting unit stores a second temperature information signal when the first test signal is enabled and outputs the stored second temperature information signal to the single temperature information outputting pad when a second test signal is enabled. The third temperature information outputting unit stores a third temperature information signal when the first test signal is enabled and outputs the stored third temperature information signal to the single temperature information outputting pad when a third test signal is enabled.
    • 提出了一种用于精确执行温度测量测试的半导体存储装置的温度信息输出电路。 温度信息输出电路包括第一,第二和第三温度信息输出单元。 当第一测试信号被使能时,第一温度信息输出单元将第一温度信息信号输出到单个温度信息输出板。 当第一测试信号被使能时,第二温度信息输出单元存储第二温度信息信号,并且当启用第二测试信号时,将所存储的第二温度信息信号输出到单个温度信息输出板。 第三温度信息输出单元在第一测试信号被使能时存储第三温度信息信号,并且当第三测试信号被使能时,将所存储的第三温度信息信号输出到单个温度信息输出板。