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    • 2. 发明授权
    • Ytterbium-phosphate glass
    • 磷酸镱玻璃
    • US07531473B2
    • 2009-05-12
    • US11209603
    • 2005-08-23
    • John D. Myers
    • John D. Myers
    • C03C3/16C03C3/19C03C3/17
    • C03C3/16C03C3/17C03C3/19C03C4/0071H01S3/1618H01S3/175
    • A new ytterbium-phosphate glass and a method for producing the same are disclosed. The glass finds special use in forming laser glass. Previously the level of ytterbium that could be incorporated into a phosphate glass without leading to formation of crystals or devitrification was limited. It has been found that much higher levels of ytterbium can be incorporated if an initial glass melt is formed from phosphate and ytterbium prior to adding the other components. Using the present process ytterbium-phosphate glasses having up to 30 mole percent ytterbium can be created. The new glasses function as well and often better than previous ytterbium containing glasses as laser glasses especially when combined with one or more of the lasing ions erbium oxide, neodymium oxide, holmium oxide or thulium oxide.
    • 公开了一种新的磷酸镱玻璃及其制造方法。 该玻璃特别用于形成激光玻璃。 以前可以掺入磷酸盐玻璃而不导致晶体形成或失透的镱的含量受到限制。 已经发现,如果在添加其它组分之前由磷酸盐和镱形成初始玻璃熔体,则可以引入更高水平的镱。 使用本发明方法可以产生具有高达30%(摩尔)镱的镱 - 磷酸盐玻璃。 新眼镜的功能也比以前的含镱玻璃作为激光眼镜更好,特别是当与一种或多种激光离子铒氧化物,氧化钕,氧化钬或氧化when组合时。
    • 3. 发明授权
    • System for optimal electronic debugging and verification employing
scheduled cutover of alternative logic simulations
    • 用于优化电子调试和验证的系统,采用替代逻辑模拟的预定切换
    • US5566097A
    • 1996-10-15
    • US27016
    • 1993-03-05
    • John D. MyersJose L. Rivero
    • John D. MyersJose L. Rivero
    • G06F17/50G06F19/00
    • G06F17/5022
    • A system for determining the optimal circuit design simulator schedule for debugging a digital electronic circuit design. The system characterizes all available circuit design simulators in terms of several parameters reflecting simulator speed and the time required to discover, isolate and fix a design error (bug). A cutover point is established for any pair of available simulators on the basis of these parameters. One simulator is progressively more efficient than the other beyond this cutover point, which is the desired time for scheduling substitution of the more efficient simulator during the debugging process. The system also permits "what-if" evaluation of alternative debugging strategies in advance by creating alternative schedules in response to various characteristic parameters.
    • 一种用于确定用于调试数字电子电路设计的最佳电路设计模拟器计划的系统。 该系统根据反映模拟器速度和发现,隔离和修复设计错误(错误)所需的时间的几个参数来表征所有可用的电路设计模拟器。 基于这些参数为任何一对可用的模拟器建立切换点。 一个模拟器比该切换点之外的其他模拟器更有效率,这是在调试过程期间调度替代更高效模拟器的期望时间。 该系统还通过根据各种特征参数创建替代计划来提前提供替代调试策略的“假设”评估。
    • 5. 发明授权
    • Athermal laser glass composition
    • 激光玻璃组合物
    • US4333848A
    • 1982-06-08
    • US212396
    • 1980-12-03
    • John D. MyersCharles S. Vollers
    • John D. MyersCharles S. Vollers
    • C03C3/17C03C4/00C03C3/04C03C3/16C09K11/42
    • C03C4/0071C03C3/17
    • A phosphate laser glass in which the optical path length is substantially independent of temperature, or "athermal", particularly under rapid pulsing, and chemically stable, while providing high gain. The base glass composition comprises, in mole percent, 55 to 70% P.sub.2 O.sub.5, 3 to 15% of an alkali metal oxide, preferably Li.sub.2 O plus K.sub.2 O, 20 to 30% BaO and 0.5 to 5% Al.sub.2 O.sub.3. Up to 15% of the BaO may be replaced by CaO, SrO or MgO and part of the Al.sub.2 O.sub.3 may be replaced by Nd.sub.2 O.sub.3. The total Al.sub.2 O.sub.3 plus Nd.sub.2 O.sub.3 is 4 mole percent .+-.1.5%. The laser glass composition also includes a laseable component, preferably Nd.sub.2 O.sub.3 and preferably includes a solarization inhibitor.
    • 一种磷酸盐激光玻璃,其中光路长度基本上与温度无关,或“无热”,特别是在快速脉冲下,并具有化学稳定性,同时提供高增益。 基础玻璃组合物以摩尔%计含有55-70%P 2 O 5,3-15%碱金属氧化物,优选Li 2 O加K 2 O,20-30%BaO和0.5-5%Al 2 O 3。 高达15%的BaO可被CaO,SrO或MgO代替,部分Al2O3可被Nd2O3替代。 总Al2O3加Nd2O3为4摩尔%+/- 1.5%。 激光玻璃组合物还包括可发射组分,优选为Nd 2 O 3,并且优选包含防晒剂。
    • 7. 发明授权
    • Contact method to allow benign failure in ceramic capacitor having self-clearing feature
    • 具有自清除功能的陶瓷电容器的良性故障接触方法
    • US08208239B2
    • 2012-06-26
    • US12469087
    • 2009-05-20
    • John D. MyersRalph S. Taylor
    • John D. MyersRalph S. Taylor
    • H01G2/00H01G4/015
    • H01G4/015H01G4/1218
    • A capacitor exhibiting a benign failure mode has a first electrode layer, a first ceramic dielectric layer deposited on a surface of the first electrode, and a second electrode layer disposed on the ceramic dielectric layer, wherein selected areas of the ceramic dielectric layer have additional dielectric material of sufficient thickness to exhibit a higher dielectric breakdown voltage than the remaining majority of the dielectric layer. The added thickness of the dielectric layer in selected areas allows lead connections to be made at the selected areas of greater dielectric thickness while substantially eliminating a risk of dielectric breakdown and failure at the lead connections, whereby the benign failure mode is preserved.
    • 表现出良性破坏模式的电容器具有第一电极层,沉积在第一电极的表面上的第一陶瓷电介质层和设置在陶瓷介电层上的第二电极层,其中陶瓷介电层的选定区域具有额外的电介质 足够厚度的材料表现出比绝缘层的剩余大部分更高的介电击穿电压。 在选择的区域中增加的电介质层的厚度允许在较大电介质厚度的选定区域进行引线连接,同时基本消除引线连接处的介电击穿和故障的风险,从而保持良性故障模式。