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    • 1. 发明申请
    • Imaging Device
    • 成像设备
    • US20070120982A1
    • 2007-05-31
    • US11553577
    • 2006-10-27
    • Masaya OITAHiromichi TanakaMasafumi Kimata
    • Masaya OITAHiromichi TanakaMasafumi Kimata
    • H04N5/225H04N9/04
    • H04N5/2357H04N5/23245H04N5/235H04N5/3456H04N5/3559H04N5/37457
    • In an imaging device having an all-pixel read mode for reading signals from all pixels and a pixel downsampling read mode for reading signals by appropriately discarding pixels, adjacent ones of pixels use a floating diffusion capacitance, an amplifying transistor, a reset switch and a selection switch in common. In the pixel downsampling read mode, not only a primary capacitance but also a photodiode in each pixel to be discarded are used as capacitances for storing signal charges transferred from transfer switches. This makes it possible to lower the gate voltage of the amplifying transistor as compared with the case of using only the primary capacitance as a capacitance for storing signal charges transferred from a transfer switch to reduce the sensitivity of the pixels, thereby reducing the occurrence of flicker.
    • 在具有用于从所有像素读取信号的全像素读取模式和用于通过适当地丢弃像素来读取信号的像素下采样读取模式的成像装置中,相邻的像素使用浮动扩散电容,放大晶体管,复位开关和 选择开关共同。 在像素下采样读取模式中,不仅要将要丢弃的每个像素中的一次电容,而且还将光电二极管用作用于存储从转换开关传送的信号电荷的电容。 与仅使用一次电容作为用于存储从转换开关传送的信号电荷的电容的情况相比,可以降低放大晶体管的栅极电压,以降低像素的灵敏度,从而减少闪烁的发生 。
    • 2. 发明授权
    • Imaging device
    • 成像设备
    • US07639298B2
    • 2009-12-29
    • US11637666
    • 2006-12-13
    • Masaya OitaHiromichi TanakaMasafumi KimataSumio Terakawa
    • Masaya OitaHiromichi TanakaMasafumi KimataSumio Terakawa
    • H04N5/335
    • H04N5/335H04N5/235H04N5/2357H04N5/3745H04N5/37457
    • Adjacent pixels in a pixel circuit of an imaging device use a primary capacitance, an amplifying transistor, a reset switch and a selection switch in common. Each pixel has a photodiode and a transfer switch having first and second gates provided on the photodiode side and the primary capacitance side, respectively. In a pixel downsampling read mode, the first and second gate voltages of each pixel to be discarded are brought to high level, and thereafter the first and second gate voltages of each pixel to be read are brought to high level, to transfer charge generated in the photodiode of the pixel to be read to the primary capacitance and the photodiode in each pixel to be discarded. This enables reduction of the potential of the primary capacitance, and hence reduction of the pixel sensitivity than using only the primary capacitance to store charge transferred from the transfer switch.
    • 成像装置的像素电路中的相邻像素共同使用一次电容,放大晶体管,复位开关和选择开关。 每个像素具有光电二极管和转移开关,分别具有设置在光电二极管侧和初级电容侧的第一和第二栅极。 在像素下采样读取模式中,要丢弃的每个像素的第一和第二栅极电压被提高到高电平,然后将要读取的每个像素的第一和第二栅极电压变为高电平, 要读取的像素的光电二极管和要丢弃的每个像素中的光电二极管。 这使得能够降低主电容的电位,并因此降低像素灵敏度,而不仅仅是使用一次电容来存储从转换开关传送的电荷。
    • 3. 发明授权
    • Imaging device with normal and reduced sensitivity readout
    • 成像装置具有正常和降低的灵敏度读数
    • US07595830B2
    • 2009-09-29
    • US11553577
    • 2006-10-27
    • Masaya OitaHiromichi TanakaMasafumi Kimata
    • Masaya OitaHiromichi TanakaMasafumi Kimata
    • H04N5/217H04N5/21H04N5/225
    • H04N5/2357H04N5/23245H04N5/235H04N5/3456H04N5/3559H04N5/37457
    • In an imaging device having an all-pixel read mode for reading signals from all pixels and a pixel downsampling read mode for reading signals by appropriately discarding pixels, adjacent ones of pixels use a floating diffusion capacitance, an amplifying transistor, a reset switch and a selection switch in common. In the pixel downsampling read mode, not only a primary capacitance but also a photodiode in each pixel to be discarded are used as capacitances for storing signal charges transferred from transfer switches. This makes it possible to lower the gate voltage of the amplifying transistor as compared with the case of using only the primary capacitance as a capacitance for storing signal charges transferred from a transfer switch to reduce the sensitivity of the pixels, thereby reducing the occurrence of flicker.
    • 在具有用于从所有像素读取信号的全像素读取模式和用于通过适当地丢弃像素来读取信号的像素下采样读取模式的成像装置中,相邻的像素使用浮动扩散电容,放大晶体管,复位开关和 选择开关共同。 在像素下采样读取模式中,不仅要将要丢弃的每个像素中的一次电容,而且还将光电二极管用作用于存储从转换开关传送的信号电荷的电容。 与仅使用一次电容作为用于存储从转换开关传送的信号电荷的电容的情况相比,可以降低放大晶体管的栅极电压,以降低像素的灵敏度,从而减少闪烁的发生 。
    • 4. 发明申请
    • Imaging device
    • 成像设备
    • US20070131993A1
    • 2007-06-14
    • US11637666
    • 2006-12-13
    • Masaya OitaHiromichi TanakaMasafumi KimataSumio Terakawa
    • Masaya OitaHiromichi TanakaMasafumi KimataSumio Terakawa
    • H01L31/113
    • H04N5/335H04N5/235H04N5/2357H04N5/3745H04N5/37457
    • Adjacent pixels in a pixel circuit of an imaging device use a primary capacitance, an amplifying transistor, a reset switch and a selection switch in common. Each pixel has a photodiode and a transfer switch having first and second gates provided on the photodiode side and the primary capacitance side, respectively. In a pixel downsampling read mode, the first and second gate voltages of each pixel to be discarded are brought to high level, and thereafter the first and second gate voltages of each pixel to be read are brought to high level, to transfer charge generated in the photodiode of the pixel to be read to the primary capacitance and the photodiode in each pixel to be discarded. This enables reduction of the potential of the primary capacitance, and hence reduction of the pixel sensitivity than using only the primary capacitance to store charge transferred from the transfer switch.
    • 成像装置的像素电路中的相邻像素共同使用一次电容,放大晶体管,复位开关和选择开关。 每个像素具有光电二极管和转移开关,分别具有设置在光电二极管侧和初级电容侧的第一和第二栅极。 在像素下采样读取模式中,要丢弃的每个像素的第一和第二栅极电压被提高到高电平,然后将要读取的每个像素的第一和第二栅极电压变为高电平, 要读取的像素的光电二极管和要丢弃的每个像素中的光电二极管。 这使得能够降低主电容的电位,并因此降低像素灵敏度,而不仅仅是使用一次电容来存储从转换开关传送的电荷。
    • 5. 发明授权
    • Solid state imaging device for correcting level variations in output signals
    • 用于校正输出信号电平变化的固态成像装置
    • US08284299B2
    • 2012-10-09
    • US11473138
    • 2006-06-23
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • H04N5/235
    • H04N5/2353H04N5/2351
    • A solid state imaging device detects the period of energy variation of discharge type illumination, and sets a total exposure time to match the detected period. The total exposure time is divided into alternating valid and invalid exposure times by a division ratio to make the sum of the valid exposure times equal to an actual exposure time corresponding to an actual speed of an electronic shutter. Charges accumulated in a CMOS sensor during the valid exposure times are stored in a floating diffusion, whereas charges accumulated during the invalid exposure times are drained. At the end of the total exposure time, the charges stored during the valid exposure times are converted to an electrical signal which is output to a signal processing circuit. This device can correct variation of output signals which corresponds to the illumination energy variation when the shutter is operated for imaging under high luminance illumination.
    • 固态成像装置检测放电型照明的能量变化的周期,并设定与所检测的周期相匹配的总曝光时间。 总曝光时间被划分为交替有效和无效的曝光时间,以使得有效曝光时间的总和等于对应于电子快门的实际速度的实际曝光时间。 在有效曝光时间期间,CMOS传感器中累积的电荷被存储在浮动扩散中,而在无效曝光时间期间积累的电荷被排出。 在总曝光时间结束时,在有效曝光时间期间存储的电荷被转换为输出到信号处理电路的电信号。 当在高亮度照明下操作快门用于成像时,该装置可以校正对应于照明能量变化的输出信号的变化。
    • 6. 发明申请
    • Solid state imaging device
    • 固态成像装置
    • US20060290797A1
    • 2006-12-28
    • US11473138
    • 2006-06-23
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • H04N5/335
    • H04N5/2353H04N5/2351
    • A solid state imaging device detects the period of energy variation of discharge type illumination, and sets a total exposure time to match the detected period. The total exposure time is divided into alternating valid and invalid exposure times by a division ratio to make the sum of the valid exposure times equal to an actual exposure time corresponding to an actual speed of an electronic shutter. Charges accumulated in a CMOS sensor during the valid exposure times are stored in a floating diffusion, whereas charges accumulated during the invalid exposure times are drained. At the end of the total exposure time, the charges stored during the valid exposure times are converted to an electrical signal which is output to a signal processing circuit. This device can correct variation of output signals which corresponds to the illumination energy variation when the shutter is operated for imaging under high luminance illumination.
    • 固态成像装置检测放电型照明的能量变化的周期,并设定与所检测的周期相匹配的总曝光时间。 总曝光时间被划分为交替有效和无效的曝光时间,以使得有效曝光时间的总和等于对应于电子快门的实际速度的实际曝光时间。 在有效曝光时间期间,CMOS传感器中累积的电荷被存储在浮动扩散中,而在无效曝光时间期间积累的电荷被排出。 在总曝光时间结束时,在有效曝光时间期间存储的电荷被转换为输出到信号处理电路的电信号。 当在高亮度照明下操作快门用于成像时,该装置可以校正对应于照明能量变化的输出信号的变化。
    • 7. 发明授权
    • Solid state imaging device and solid state imaging element
    • 固态成像装置和固态成像元件
    • US07679159B2
    • 2010-03-16
    • US11444312
    • 2006-06-01
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • H01L31/00
    • H01L27/14645
    • Each of three light receiving sections has a P-type well having a P+-type layer and an N-type layer formed therein. The P+-type layer is diffused from substrate surface to depth d1. A PN junction forming portion of the N-type layer is diffused from depth d1 to depth d2 which is greater than depth d1 so as to form, with the P-type well, a PN junction of a photodiode at depth d2. Depths d1 as well as depths d2 of the three light receiving sections are different from each other. The N-type layer has a charge output portion which is diffused from the PN junction to the substrate surface, and which is coupled by circuit coupling to a MOS transistor for reading out charge. This allows each light receiving section to have spectral characteristics, thereby providing a solid state imaging element and a solid state imaging device without using color filters.
    • 三个光接收部分中的每一个具有P型阱,其中形成有P +型层和N型层。 P +型层从衬底表面扩散到深度d1。 N型层的PN结形成部分从深度d1扩散到深度d2,深度d1大于深度d1,以便与P型阱形成深度为d2的光电二极管的PN结。 三个光接收部的深度d1以及深度d2彼此不同。 N型层具有从PN结扩散到衬底表面的电荷输出部分,其通过电路耦合耦合到用于读出电荷的MOS晶体管。 这允许每个光接收部分具有光谱特性,从而提供固态成像元件和固态成像器件而不使用滤色器。
    • 8. 发明申请
    • Solid state imaging device and solid state imaging element
    • 固态成像装置和固态成像元件
    • US20060273361A1
    • 2006-12-07
    • US11444312
    • 2006-06-01
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • Hiromichi TanakaHideto YoshimuraSumio TerakawaMasafumi Kimata
    • H01L31/113
    • H01L27/14645
    • Each of three light receiving sections has a P-type well having a P+-type layer and an N-type layer formed therein. The P+-type layer is diffused from substrate surface to depth d1. A PN junction forming portion of the N-type layer is diffused from depth d1 to depth d2 which is greater than depth d1 so as to form, with the P-type well, a PN junction of a photodiode at depth d2. Depths d1 as well as depths d2 of the three light receiving sections are different from each other. The N-type layer has a charge output portion which is diffused from the PN junction to the substrate surface, and which is coupled by circuit coupling to a MOS transistor for reading out charge. This allows each light receiving section to have spectral characteristics, thereby providing a solid state imaging element and a solid state imaging device without using color filters.
    • 三个光接收部分中的每一个都具有P型阱,其具有P + +型层和形成在其中的N型层。 P + H +型层从衬底表面扩散到深度d 1.N型层的PN结形成部分从深度d 1扩散到深度d 2,深度d 2大于深度d 以便与P型阱形成深度为d 2的光电二极管的PN结。三个光接收部分的深度d 1以及深度d 2彼此不同。 N型层具有从PN结扩散到衬底表面的电荷输出部分,其通过电路耦合耦合到用于读出电荷的MOS晶体管。 这允许每个光接收部分具有光谱特性,从而提供固态成像元件和固态成像器件而不使用滤色器。