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    • 1. 发明授权
    • Direct oxidation method for semiconductor process
    • 半导体工艺的直接氧化法
    • US08153534B2
    • 2012-04-10
    • US13025738
    • 2011-02-11
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • H01L21/31
    • C23C8/10H01L21/02238H01L21/02255H01L21/31662H01L21/67109
    • An oxidation method for performing direct oxidation includes respectively supplying an oxidizing gas and a deoxidizing gas to the process field, and directly oxidizing a surface target substrates by use of oxygen radicals and hydroxyl group radicals generated by a reaction between the oxidizing gas and the deoxidizing gas. The oxidizing gas is supplied through an oxidizing gas nozzle extending over a vertical length corresponding to the process field and is spouted from a plurality of gas spouting holes formed on the oxidizing gas nozzle and arrayed over the vertical length corresponding to the process field. The deoxidizing gas is supplied through a plurality of deoxidizing gas nozzles having different heights respectively corresponding to a plurality of zones of the process field arrayed vertically and is spouted from gas spouting holes respectively formed on the deoxidizing gas nozzles each at height of a corresponding zone.
    • 用于进行直接氧化的氧化方法包括分别向工艺场提供氧化气体和脱氧气体,并且通过氧化气体和脱氧气体之间的反应产生的氧自由基和羟基自由基来直接氧化表面目标衬底 。 氧化气体通过在对应于处理场的垂直长度上延伸的氧化气体喷嘴供给,并且从形成在氧化气体喷嘴上的多个气体喷出孔喷出并排列在对应于过程场的垂直长度上。 脱氧气体通过分别对应于垂直排列的处理场的多个区域的不同高度的多个脱氧气体喷嘴供给,并且从分别形成在对应区域的高度的脱氧气体喷嘴上的气体喷出孔喷出。
    • 2. 发明申请
    • DIRECT OXIDATION METHOD FOR SEMICONDUCTOR PROCESS
    • 用于半导体工艺的直接氧化方法
    • US20110129604A1
    • 2011-06-02
    • US13025738
    • 2011-02-11
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • C23C16/448C23C16/00C23C16/22
    • C23C8/10H01L21/02238H01L21/02255H01L21/31662H01L21/67109
    • An oxidation method for performing direct oxidation includes respectively supplying an oxidizing gas and a deoxidizing gas to the process field, and directly oxidizing a surface target substrates by use of oxygen radicals and hydroxyl group radicals generated by a reaction between the oxidizing gas and the deoxidizing gas. The oxidizing gas is supplied through an oxidizing gas nozzle extending over a vertical length corresponding to the process field and is spouted from a plurality of gas spouting holes formed on the oxidizing gas nozzle and arrayed over the vertical length corresponding to the process field. The deoxidizing gas is supplied through a plurality of deoxidizing gas nozzles having different heights respectively corresponding to a plurality of zones of the process field arrayed vertically and is spouted from gas spouting holes respectively formed on the deoxidizing gas nozzles each at height of a corresponding zone.
    • 用于进行直接氧化的氧化方法包括分别向工艺场提供氧化气体和脱氧气体,并且通过氧化气体和脱氧气体之间的反应产生的氧自由基和羟基自由基来直接氧化表面目标衬底 。 氧化气体通过在对应于处理场的垂直长度上延伸的氧化气体喷嘴供给,并且从形成在氧化气体喷嘴上的多个气体喷出孔喷出并排列在对应于过程场的垂直长度上。 脱氧气体通过分别对应于垂直排列的处理场的多个区域的不同高度的多个脱氧气体喷嘴供给,并且从分别形成在对应区域的高度的脱氧气体喷嘴上的气体喷出孔喷出。
    • 4. 发明申请
    • Oxidation apparatus and method for semiconductor process
    • 半导体工艺的氧化装置及方法
    • US20080075838A1
    • 2008-03-27
    • US11902180
    • 2007-09-19
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • Hisashi InoueMasataka ToiyaYoshikatsu Mizuno
    • C23C8/10
    • C23C8/10H01L21/02238H01L21/02255H01L21/31662H01L21/67109
    • An oxidation apparatus for a semiconductor process includes a process container having a process field configured to accommodate target substrates at intervals vertically, a heater configured to heat the process field; an exhaust system configured to exhaust gas from inside the process field; an oxidizing gas supply circuit configured to supply an oxidizing gas to the process field; and a deoxidizing gas supply circuit configured to supply a deoxidizing gas to the process field. The oxidizing gas supply circuit includes an oxidizing gas nozzle extending over a vertical length corresponding to the process field, and having gas spouting holes arrayed over the vertical length corresponding to the process field. The deoxidizing gas supply circuit includes deoxidizing gas nozzles having different heights respectively corresponding to zones of the process field arrayed vertically, and each having a gas spouting hole formed at height of a corresponding zone.
    • 一种用于半导体工艺的氧化设备包括一个处理容器,该过程容器具有被配置为在垂直方向上间隔地容纳目标衬底的过程区域,被配置为加热过程场的加热器; 排气系统,其构造成从所述过程区域内部排出废气; 氧化气体供给回路,其构成为向所述处理场供给氧化气体; 以及脱气气体供给回路,被配置为向所述处理区域供给脱氧气体。 氧化气体供给回路包括在对应于过程场的垂直长度上延伸的氧化气体喷嘴,并且具有排列在对应于过程场的垂直长度上的气体喷射孔。 脱氧气体供给回路包括对应于垂直排列的处理场的区域分别具有不同高度的脱氧气体喷嘴,并且各自具有形成在相应区域的高度处的气体喷射孔。