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1. 发明授权

US06281698B1 LSI testing apparatus and timing calibration method for use therewith 失效
标题翻译： LSI测试装置和与其一起使用的定时校准方法
公开(公告)号：US06281698B1
公开(公告)日：2001-08-28
申请号：US09467153
申请日：1999-12-20
申请人： Masaru Sugimoto , Yasuhide Nakase , Tomohiro Nishimura , Teruhiko Funakura
发明人： Masaru Sugimoto , Yasuhide Nakase , Tomohiro Nishimura , Teruhiko Funakura
IPC分类号： G01R3126
CPC分类号： G01R31/3191
摘要： A waveform and timing generation circuit 28, a skew circuit 30, and a pin driver 32 are provided for each of a plurality of I/O terminals 22 corresponding respectively to a plurality of pins furnished on an LSI. A relay 44 and a loop control circuit 46 are provided to feed an output signal of the pin driver 32 back to an input side of the waveform and timing generation circuit 28. A skew board 100 is used to adjust the skew circuit 30, whereby the initial timing calibration is carried out. With the skew circuit 30 thus adjusted, oscillations are generated over the feedback path, and the number of resulting pulses is counted (to obtain pulse cycles). When the skew circuit 30 is adjusted so that the pulse count above matches the number of pulses generated during oscillations, a simplified form of timing calibration is implemented.
摘要翻译：为分别对应于LSI上提供的多个引脚的多个I / O端子22中的每一个提供波形和定时产生电路28，偏斜电路30和引脚驱动器32。设置有继电器44和回路控制电路46，以将引脚驱动器32的输出信号反馈回波形的输入侧和定时产生电路28.偏斜板100用于调整偏斜电路30，由此，执行初始定时校准。通过这样调整偏斜电路30，在反馈路径上产生振荡，并且对所得到的脉冲的数量进行计数（以获得脉冲周期）。当偏斜电路30被调整为使得上面的脉冲数与在振荡期间产生的脉冲数相匹配时，实现了简化形式的定时校准。

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