会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明申请
    • INFRARED DETECTOR, INFRARED DETECTING APPARATUS, AND METHOD OF MANUFACTURING INFRARED DETECTOR
    • 红外探测器,红外检测装置和制造红外探测器的方法
    • US20110079765A1
    • 2011-04-07
    • US12772380
    • 2010-05-03
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro KatoMasahito Yamaguchi
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro KatoMasahito Yamaguchi
    • H01L31/12H01L31/18
    • H01L31/153H01L31/0352H01L31/101H01L31/107
    • An infrared detector comprises: a reflection portion which transmits far- and middle-infrared rays and which reflects near-infrared and visible rays; a photo-current generating portion having a plurality of layered quantum dot structures in each of which electrons are excited by the far- and middle-infrared rays having passed through the reflection portion so as to generate photo-current; a light emitting portion having a plurality of layered quantum well structures into each of which electrons of the photo-current generated by the photo-current generating portion are injected and in each of which the electrons thus injected thereinto are recombined with holes so as to emit near-infrared and visible rays; and a photo-detecting portion which detects the near-infrared and visible rays emitted from the light emitting portion and which detects the near-infrared and visible rays emitted from the light emitting portion and then reflected by the reflection portion. The reflection portion, the photo-current generating portion, and the light emitting portion are made of group III-V compound semiconductors that are layered on top of a semiconductor substrate.
    • 红外检测器包括:透射远红外线和中红外线并反射近红外和可见光线的反射部分; 具有多个分层量子点结构的光电流产生部分,其中每个电子被穿过反射部分的远红外线和中间红外线激发,以产生光电流; 具有多个分层量子阱结构的发光部分,其中注入由光电流产生部分产生的光电流的电子,并且其中注入的电子中的每一个与空穴重新组合以发射 近红外和可见光线; 以及光检测部,其检测从所述发光部发射的近红外线和可见光,并且检测从所述发光部发射的所述近红外和可见光,然后被所述反射部反射。 反射部分,光电流产生部分和发光部分由分层在半导体衬底上的III-V族化合物半导体制成。
    • 5. 发明授权
    • Infrared detector, infrared detecting apparatus, and method of manufacturing infrared detector
    • 红外探测器,红外探测装置及红外探测器的制造方法
    • US08367452B2
    • 2013-02-05
    • US12772380
    • 2010-05-03
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro KatoMasahito Yamaguchi
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro KatoMasahito Yamaguchi
    • H01L21/00
    • H01L31/153H01L31/0352H01L31/101H01L31/107
    • An infrared detector including a reflection portion which transmits far- and middle-infrared rays and which reflects near-infrared and visible rays; a photo-current generating portion having a plurality of layered quantum dot structures in each of which electrons are excited by the far- and middle-infrared rays having passed through the reflection portion so as to generate photo-current; a light emitting portion having a plurality of layered quantum well structures into each of which electrons of the photo-current generated by the photo-current generating portion are injected and in each of which the electrons thus injected thereinto are recombined with holes so as to emit near-infrared and visible rays; and a photo-detecting portion which detects the near -infrared and visible rays emitted from the light emitting portion and which detects the near-infrared and visible rays emitted from the light emitting portion and then reflected by the reflection portion.
    • 一种红外检测器,包括透射远红外线和中红外线并反射近红外和可见光线的反射部分; 具有多个分层量子点结构的光电流产生部分,其中每个电子被穿过反射部分的远红外线和中间红外线激发,以产生光电流; 具有多个分层量子阱结构的发光部分,其中注入由光电流产生部分产生的光电流的电子,并且其中注入的电子中的每一个与空穴重新组合以发射 近红外和可见光线; 以及光检测部,其检测从所述发光部发射的近红外线和可见光,并且检测从所述发光部发射的所述近红外和可见光,然后被所述反射部反射。
    • 6. 发明授权
    • Light detector, light detecting apparatus, infrared detector and infrared detecting apparatus
    • 光检测器,光检测装置,红外检测器和红外检测装置
    • US08039800B2
    • 2011-10-18
    • US12762680
    • 2010-04-19
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro Kato
    • Fumihito SomaYoshikatsu KurodaKazunori MasukawaMasahiro Kato
    • G01J5/20
    • H01L27/14629H01L27/14623H01L27/14625H01L27/14649
    • An infrared detector which converts entering infrared IR into light in a different wavelength band, and which detects the converted light in the different wavelength band includes: a convex-concave structure provided on a light acceptance surface of the infrared detector; and a metal film provided on an outer circumferential face of the light detector other than the light acceptance surface thereof, the metal film covering the outer circumferential face. In the infrared detector, light which enters the light detector after passing through the convex-concave structure and the converted light in the different wavelength band are confined inside the light detector: by causing the entering light to be reflected on the metal film; by causing light reflected on the metal film to be reflected on the convex-concave structure; and by causing the converted light in the different wavelength band to be reflected between the metal film and the convex-concave structure.
    • 将进入红外线IR变换成不同波长带的光并且检测不同波长带的转换光的红外检测器包括:设置在红外线检测器的光接收表面上的凸凹结构; 以及金属膜,其设置在除了其光接收表面之外的所述光检测器的外周面上,所述金属膜覆盖所述外周面。 在红外线检测器中,通过凸凹结构进入光检测器的光和不同波长带的转换光被限制在光检测器内部:通过使入射光在金属膜上反射; 通过使在金属膜上反射的光在凸凹结构上反射; 并且通过使不同波长带中的转换光在金属膜和凸凹结构之间反射。