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1. 发明授权

US07799963B2 Cracking tube having helical fins 有权
标题翻译：具有螺旋翅片的开裂管
公开(公告)号：US07799963B2
公开(公告)日：2010-09-21
申请号：US12379845
申请日：2009-03-03
申请人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
发明人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
IPC分类号： C07C4/04 , C10G9/14 , F28F1/14
CPC分类号： F28F1/40 , B01F2005/0626 , B01F2005/0636 , B01J19/006 , B01J19/2415 , C10G9/20 , F28D2021/0022
摘要： A cracking tube (50) for use in thermal cracking furnaces for producing ethylene or the like has fins (1) formed on an inner surface thereof and inclined with respect to an axis of the tube for stirring a fluid inside the tube. The fins are arranged discretely on one or a plurality of helical loci, and the tube inner surface has regions (ZB) wherein no fins are present over the entire axial length of the tube from one axial end of the tube to the other axial end thereof.
摘要翻译：用于生产乙烯等的热裂解炉的裂解管（50）在其内表面上形成有相对于管轴倾斜的翅片（1），用于搅拌管内的流体。翅片离散设置在一个或多个螺旋轨迹上，并且管内表面具有区域（ZB），其中在管的整个轴向长度上从管的一个轴向端到另一个轴向端都不存在翅片。

2. 发明申请

US20090177022A1 Cracking tube having helical fins 有权
标题翻译：具有螺旋翅片的开裂管
公开(公告)号：US20090177022A1
公开(公告)日：2009-07-09
申请号：US12379845
申请日：2009-03-03
申请人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
发明人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
IPC分类号： C07C4/04
CPC分类号： F28F1/40 , B01F2005/0626 , B01F2005/0636 , B01J19/006 , B01J19/2415 , C10G9/20 , F28D2021/0022
摘要： A cracking tube (50) for use in thermal cracking furnaces for producing ethylene or the like has fins (1) formed on an inner surface thereof and inclined with respect to an axis of the tube for stirring a fluid inside the tube. The fins are arranged discretely on one or a plurality of helical loci, and the tube inner surface has regions (ZB) wherein no fins are present over the entire axial length of the tube from one axial end of the tube to the other axial end thereof.
摘要翻译：用于生产乙烯等的热裂解炉的裂解管（50）在其内表面上形成有相对于管轴倾斜的翅片（1），用于搅拌管内的流体。翅片离散设置在一个或多个螺旋轨迹上，并且管内表面具有区域（ZB），其中在管的整个轴向长度上从管的一个轴向端到另一个轴向端都不存在翅片。

3. 发明申请

US20060102327A1 Cracking tube having helical fins 审中-公开
标题翻译：具有螺旋翅片的开裂管
公开(公告)号：US20060102327A1
公开(公告)日：2006-05-18
申请号：US10534016
申请日：2003-11-12
申请人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
发明人： Masahiro Inui , Kaoru Hamada , Kenji Otsubo
IPC分类号： F28F13/18 , F28F13/00 , F28F1/20 , F28F1/30 , F28F1/36
CPC分类号： F28F1/40 , B01F2005/0626 , B01F2005/0636 , B01J19/006 , B01J19/2415 , C10G9/20 , F28D2021/0022
摘要： A cracking tube (50) for use in thermal cracking furnaces for producing ethylene or the like has fins (1) formed on an inner surface thereof and inclined with respect to an axis of the tube for stirring a fluid inside the tube. The fins are arranged discretely on one or a plurality of helical loci, and the tube inner surface has regions (ZB) wherein no fins are present over the entire axial length of the tube from one axial end of the tube to the other axial end thereof.
摘要翻译：用于生产乙烯等的热裂解炉的裂解管（50）在其内表面上形成有相对于管轴倾斜的翅片（1），用于搅拌管内的流体。翅片离散地布置在一个或多个螺旋轨迹上，并且管内表面具有区域（ZBB），其中在管的整个轴向长度上不存在翅片，管到另一个轴向端。

4. 发明授权

US08083282B2 Door of a vehicle 有权
标题翻译：一辆车的门
公开(公告)号：US08083282B2
公开(公告)日：2011-12-27
申请号：US12582754
申请日：2009-10-21
申请人： Tokumitu Tomada , Masahiro Inui , Masaya Nishino
发明人： Tokumitu Tomada , Masahiro Inui , Masaya Nishino
IPC分类号： B60J5/10
CPC分类号： E05D15/28 , B60J5/0487 , B61D19/023 , E05Y2201/676 , E05Y2800/11 , E05Y2900/51 , Y10T16/61
摘要： Described is an emergency door of a vehicle. An interior of the door and side part of front face of leading car are connected pivotally by an upper arm, lower arm, and first link bar so that a parallel linkage is composed, thereby enabling horizontal movement of the door. A stopper mechanism is composed such that an end of a second link bar is connecting pivotally to the first link bar, the bracket having an oblong hole is attached to a frame of a carbody, a pin fixed to the other end of the second link bar is received in the oblong hole, and the door can be stopped at its full open position when the pin contacts an end of the oblong hole.
摘要翻译：描述的是车辆的紧急门。前车厢的内部和前车的前表面的侧面部分由上臂，下臂和第一连接杆枢转地连接，从而构成一个平行的联动装置，从而使门能够水平移动。止动机构构成为使得第二连杆的端部枢转地连接到第一连杆，具有长孔的支架附接到车体的框架，固定到第二连杆的另一端的销被接收在长方形孔中，并且当销接触长孔的端部时，门能够在其完全打开位置停止。

5. 发明申请

US20100252969A1 GUIDED VRHICLE 审中-公开
标题翻译：指导型VRHICLE
公开(公告)号：US20100252969A1
公开(公告)日：2010-10-07
申请号：US12612851
申请日：2009-11-05
申请人： Tokumitu TOMADA , Masahiro Inui
发明人： Tokumitu TOMADA , Masahiro Inui
IPC分类号： F16F5/00
CPC分类号： B61F5/24 , B61F5/14 , F16F15/0232
摘要： In a guided vehicle of air spring suspension for running along exclusive guideways, decreasing of center distance of the left and right air spring to mount air springs of increased dimension and increased load carrying capacity, which decreasing of the center distance induces decrease in rolling stiffness of the vehicle resulting in deteriorated ride quality and also induces difficulty in adjusting vehicle height resulting in spending long time in height adjusting operation, will not be required even when load carrying capacity of air springs is required to be increased in order to comply with increased vehicle load. A plurality of air spring elements are mounted tandem along the longitudinal direction of the vehicle with the air spring elements connected with each other so that air pressure thereof is always equal.
摘要翻译：在专用导轨行走的空气弹簧悬架的导向车辆中，减小左右空气弹簧的中心距离，以安装尺寸增大的空气弹簧和增加的承载能力，中心距离的减小会导致滚动刚度的降低车辆导致驾驶质量恶化，并且即使在需要增加空气弹簧的承载能力以便符合增加的车辆载荷时也不需要调整车辆高度导致高度调节操作的长时间。多个空气弹簧元件沿着车辆的纵向方向串联安装，空气弹簧元件彼此连接，使得其空气压力总是相等。

6. 发明申请

US20120203473A1 APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME 有权
标题翻译：测量半导体载体寿命的装置和方法
公开(公告)号：US20120203473A1
公开(公告)日：2012-08-09
申请号：US13500305
申请日：2010-10-01
申请人： Kazushi Hayashi , Hiroyuki Takamatsu , Yoshito Fukumoto , Naokazu Sakoda , Masahiro Inui , Shingo Sumie
发明人： Kazushi Hayashi , Hiroyuki Takamatsu , Yoshito Fukumoto , Naokazu Sakoda , Masahiro Inui , Shingo Sumie
IPC分类号： G06F19/00 , G01N21/55
CPC分类号： G01N21/3151 , G01N21/31 , G01N2021/3568 , H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor carrier lifetime measuring apparatus A1 of the present invention, at least two types of light having mutually different wavelengths are irradiated onto a semiconductor X to be measured, a predetermined measurement wave is irradiated onto the semiconductor X to be measured, a reflected wave of the measurement wave that has been reflected by the semiconductor X to be measured or a transmitted wave of the measurement wave that has transmitted through the semiconductor X to be measured is detected, and the carrier lifetime in the semiconductor X to be measured is obtained based on the detection results so as to minimize the error. Accordingly, the semiconductor carrier lifetime measuring apparatus A1 configured as described above can more accurately measure the carrier lifetime.
摘要翻译：在本发明的半导体载体寿命测量装置A1中，将具有相互不同波长的至少两种类型的光照射到要测量的半导体X上，将预定测量波照射到要测量的半导体X上，反射波检测被测半导体X所反射的测量波，或检测通过半导体X的被测量的测定波的透过波，测定半导体X的载流子寿命，检测结果，以最小化误差。因此，如上所述构成的半导体载体寿命测定装置A1能够更准确地测定载流子寿命。

7. 发明申请

US20100251926A1 Vehicle lifting apparatus 有权
标题翻译：车辆起重设备
公开(公告)号：US20100251926A1
公开(公告)日：2010-10-07
申请号：US12385379
申请日：2009-04-07
申请人： Tokumitsu Tomada , Masahiro Inui , Masaya Nishino
发明人： Tokumitsu Tomada , Masahiro Inui , Masaya Nishino
IPC分类号： B61D23/02 , B61K13/00
CPC分类号： B61D23/02 , B61D19/023
摘要： The present invention aims at providing an emergency staircase, whereby an operator can promptly and easily arrange the preparation of detrainment with the staircase in an emergency, and the passengers can detrain with a feeling of security.An emergency staircase 40 includes a plurality of step forming members 44a to 44f that are housed in a casing 42, a podium 50 and a railing 46 that are fitted to the casing 42 so that the podium and the railing can be unfolded against the casing. The step forming members include: a pair of guiding parts 62, the parts being arranged each other in parallel; a step plate 64 that is sandwiched between the guiding parts 62 of each pair and fastened to each of the guiding parts 62; thereby, the left and right pair of squarish U-shapes faces each other; the inner guiding parts and the outer guiding parts are mutually of a similar figure, the inner one being relatively smaller than the outer one by the thickness of the part and the size of the protrusions 66a and 66b that act as sliding contact lines between the adjacent guiding parts.
摘要翻译：本发明旨在提供一种紧急楼梯，由此操作人员可以在紧急情况下及时和容易地安排与楼梯进行的拆卸准备，并且乘客可以以安全感来克服。紧急楼梯40包括容纳在壳体42，平台50和栏杆46中的多个台阶形成构件44a至44f，该台阶50和栏杆46装配到壳体42，使得讲台和栏杆可以展开在壳体上。台阶形成构件包括：一对引导部62，这些部分彼此平行布置; 夹在每一对的引导部62之间并固定到每个引导部62的台阶板64; 因此左右方向的U形形状彼此面对; 内部引导部分和外部引导部分相互相似，内部部分相对于外部引导部分和外部引导部分相对较小，部分的厚度和突出部分66a和66b的尺寸相对小于相邻部分之间的滑动接触线引导部件。

8. 发明授权

US08952338B2 Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD technique 有权
标题翻译：使用μ-PCD技术的薄膜半导体晶体质量评估装置
公开(公告)号：US08952338B2
公开(公告)日：2015-02-10
申请号：US13819288
申请日：2011-09-01
申请人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
发明人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
IPC分类号： G01T1/16 , G01N21/63 , H01L21/66 , G01N21/84 , G01N22/00
CPC分类号： G01T1/16 , G01N21/63 , G01N21/8422 , G01N22/00 , H01L22/12
摘要： The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom. Thus, the thin-film semiconductor crystalline quality evaluation apparatus (1) and method configured in this manner make it possible to evaluate the crystalline quality even in the above situation where the electrically conductive film (2b) is formed under the semiconductor thin-film (2a).
摘要翻译：本发明提供一种薄膜半导体的结晶质量评价装置（1）和结晶质量评价方法，其被设计为通过发射激发光来评价薄膜半导体（2a）的样品（2）的结晶质量和用于照射样品（2）的测量部位的电磁波，以及检测来自样品（2）的反射电磁波的强度。在本发明中，样品（2）的薄膜半导体（2a）形成在导电膜（2b）上，并且在样品（2）之间另外设置对激发光透明的电介质（3）以及用于从其发射电磁波的波导（13）。因此，这样构成的薄膜半导体结晶质量评价装置（1）和方法即使在半导体薄膜下形成导电膜（2b）的情况下也能够评价结晶质量 2a）。

9. 发明授权

US5316721A Heat-resistant alloy having high creep rupture strength under high-temperature low-stress conditions and excellent resistance to carburization 失效
标题翻译：耐高温合金在高温低应力条件下具有高蠕变断裂强度，耐渗碳性优异
公开(公告)号：US5316721A
公开(公告)日：1994-05-31
申请号：US814154
申请日：1991-12-30
申请人： Junichi Sugitani , Masahiro Inui , Koji Tsuchida , Teruo Yoshimoto
发明人： Junichi Sugitani , Masahiro Inui , Koji Tsuchida , Teruo Yoshimoto
IPC分类号： B22D13/02 , C10G9/20 , C22C19/05 , C22C30/00 , C22C38/00 , C22C38/48 , C22C38/34
CPC分类号： C22C30/00
摘要： A heat-resistant alloy having a high creep rupture strength under high-temperature low-stress conditions and excellent resistance to carburization even when used at a high temperature exceeding 1100.degree. C. The alloy comprises, in % by weight, more than 0.1% to less than 1.5% of C, more than 2% to less than 3% of Si, more than 0% to less than 2% of Mn, more than 20% to less than 30% of Cr, more than 25% to less than 40% of Ni, more than 0.6% to less than 2% of Al, and the balance Fe and inevitable impurities. When required, the alloy contains at least one component selected from the group consisting of 0.01 to 0.5% of Zr, up to 0.2% of N, 0.2 to 2.0% of Nb, 0.2 to 2.0% of W and 0.01 to 03% of Ti.
摘要翻译：一种在高温低应力条件下具有高蠕变断裂强度的耐热合金，即使在超过1100℃的高温下使用时也具有优异的耐渗碳性。该合金包含以重量％计超过0.1％小于1.5％的C，超过2％至小于3％的Si，超过0％至小于2％的Mn，超过20％至小于30％的Cr，超过25％至小于 40％的Ni，超过0.6％至小于2％的Al，余量为Fe和不可避免的杂质。当需要时，该合金含有至少一种选自以下的组分：Zr：0.01〜0.5％，N：0.2％以下，Nb：0.2〜2.0％，W：0.2〜2.0％，Ti：0.01〜。

10. 发明申请

US20130153778A1 CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTORS, USING +82 -PCD TECHNIQUE 有权
标题翻译：薄膜半导体晶体质量评估装置，采用+ 82 -PCD技术
公开(公告)号：US20130153778A1
公开(公告)日：2013-06-20
申请号：US13819288
申请日：2011-09-01
申请人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
发明人： Naokazu Sakoda , Hiroyuki Takamatsu , Masahiro Inui , Futoshi Ojima
IPC分类号： G01T1/16
CPC分类号： G01T1/16 , G01N21/63 , G01N21/8422 , G01N22/00 , H01L22/12
摘要： The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom. Thus, the thin-film semiconductor crystalline quality evaluation apparatus (1) and method configured in this manner make it possible to evaluate the crystalline quality even in the above situation where the electrically conductive film (2b) is formed under the semiconductor thin-film (2a).
摘要翻译：本发明提供一种薄膜半导体的结晶质量评价装置（1）和结晶质量评价方法，其被设计为通过发射激发光来评价薄膜半导体（2a）的样品（2）的结晶质量和用于照射样品（2）的测量部位的电磁波，以及检测来自样品（2）的反射电磁波的强度。在本发明中，样品（2）的薄膜半导体（2a）形成在导电膜（2b）上，并且在样品（2）之间另外设置对激发光透明的电介质（3）以及用于从其发射电磁波的波导（13）。因此，这样构成的薄膜半导体结晶质量评价装置（1）和方法即使在半导体薄膜下形成导电膜（2b）的情况下也能够评价结晶质量 2a）。

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