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1. 发明授权

US06195166B1 Photoreflectance spectral analysis of semiconductor laser structures 有权
标题翻译：半导体激光器结构的光反射光谱分析
公开(公告)号：US06195166B1
公开(公告)日：2001-02-27
申请号：US09305712
申请日：1999-05-05
申请人： Mary L. Gray , Harald F. Hess , Mark S. Hybertsen , Leonard Jan-Peter Ketelsen
发明人： Mary L. Gray , Harald F. Hess , Mark S. Hybertsen , Leonard Jan-Peter Ketelsen
IPC分类号： G01N2155
CPC分类号： G01N21/1717
摘要： A micro-photoreflectance technique has been developed for performing non-destructive analysis of III-V optoelectronic devices. By using a significantly reduced spot size (for example, 10 micrometers), various compositional features of the device may be analyzed and the Franz-Keldysh oscillations appearing in the micro-photoreflectance wavelength spectra (such as those beyond the barrier/SCL wavelength in an EML structure) may be analyzed to provide information regarding the physical characteristics of the device, such as the electric field and p-i junction placement within an exemplary EML device structure.
摘要翻译：已经开发了用于对III-V光电子器件进行非破坏性分析的微光反射技术。通过使用显着减小的光斑尺寸（例如，10微米），可以分析器件的各种组成特征，并且出现在微光反射波长光谱中的Franz-Keldysh振荡（例如，在 EML结构）可以被提供关于装置的物理特征的信息，例如示例性EML装置结构内的电场和pi结布置。

2. 发明授权

US07816655B1 Reflective electron patterning device and method of using same 有权
标题翻译：反射电子图案形成装置及其使用方法
公开(公告)号：US07816655B1
公开(公告)日：2010-10-19
申请号：US10851041
申请日：2004-05-21
申请人： Harald F. Hess , Marian Mankos , David L. Adler
发明人： Harald F. Hess , Marian Mankos , David L. Adler
IPC分类号： H01J37/04
CPC分类号： H01J37/3175 , B82Y10/00 , B82Y40/00 , H01J37/3177 , H01J2237/2482 , H01J2237/31789
摘要： One embodiment disclosed relates to a reflective electron patterning device. The device includes a pattern on a surface. There is an electron reflective portion of the pattern and an electron non-reflective portion of the pattern. Another embodiment disclosed relates to a method of reflecting a pattern of electrons. An electron beam is generated to be incident upon a surface. The pattern is formed on the surface. The incident electrons are reflected from a reflective portion of the pattern are prevented from being reflected from a non-reflective portion of the pattern.
摘要翻译：公开的一个实施例涉及一种反射型电子图案形成装置。该装置包括表面上的图案。图案的电子反射部分和图案的电子非反射部分。所公开的另一实施例涉及一种反映电子图案的方法。产生电子束入射到表面上。图案形成在表面上。从图案的反射部分反射的入射电子被防止从图案的非反射部分反射。

3. 发明授权

US06759654B1 High contrast inspection and review of magnetic media and heads 失效
公开(公告)号：US06759654B1
公开(公告)日：2004-07-06
申请号：US10345696
申请日：2003-01-16
申请人： Marian Mankos , David A. Soltz , Harald F. Hess
发明人： Marian Mankos , David A. Soltz , Harald F. Hess
IPC分类号： G01N23225
CPC分类号： G11B5/455 , G01N23/2251 , G11B5/012 , G11B5/09 , G11B5/1272 , G11B5/3166 , G11B5/3193 , G11B27/36 , G11B2220/20
摘要： One embodiment disclosed relates to a method for inspecting or reviewing a magnetized specimen using an automated inspection apparatus. The method includes generating a beam of incident electrons using an electron source, biasing the specimen with respect to the electron source such that the incident electrons decelerate as a surface of the specimen is approached, and illuminating a portion of the specimen at a tilt with the beam of incident electrons. The specimen is moved under the incident beam of electrons using a movable stage of the inspection apparatus. Scattered electrons are detected to form image data of the specimen showing distinct contrast between regions of different magnetization. The movement of the specimen under the beam of incident electrons may be continuous, and data for multiple image pixels may be acquired in parallel using a time delay integrating detector.

4. 发明授权

US08462336B2 Optical microscopy with phototransformable optical labels 有权
公开(公告)号：US08462336B2
公开(公告)日：2013-06-11
申请号：US12956946
申请日：2010-11-30
申请人： Robert Eric Betzig , Harald F. Hess
发明人： Robert Eric Betzig , Harald F. Hess
IPC分类号： G01J3/30
CPC分类号： G01N21/6428 , G01N21/64 , G01N21/6458 , G01N21/648 , G01N33/582 , G01N2021/6419 , G01N2021/6421 , G01N2021/6439 , G01N2021/6441 , G02B21/16 , G02B21/367 , G02B27/58
摘要： An apparatus includes a position-sensitive detector to detect intensities of radiation as a function of position on the detector, and an optical system, characterized by a diffraction-limited resolution volume, adapted for imaging light emitted from activated and excited phototransformable optical labels (“PTOLs”) in a sample onto the position sensitive-detector. A first light source provides activation radiation to the sample to activate a subset of the PTOLs that are distributed in the sample with a density greater than an inverse of the diffraction-limited resolution volume of the optical system. A second light source provides excitation radiation to the sample to excite a portion of the PTOLs in the subset of the PTOLs. A controller controls one both of the activation radiation and the excitation radiation provided to the sample such that a density of PTOLs in the portion of the PTOLs is less than the inverse of the diffraction-limited resolution volume.

5. 发明授权

US07782457B2 Optical microscopy with phototransformable optical labels 有权
标题翻译：具有光变光学标签的光学显微镜
公开(公告)号：US07782457B2
公开(公告)日：2010-08-24
申请号：US11944274
申请日：2007-11-21
申请人： Robert Eric Betzig , Harald F. Hess
发明人： Robert Eric Betzig , Harald F. Hess
IPC分类号： G01J3/30
CPC分类号： G01N21/6428 , G01N21/64 , G01N21/6458 , G01N21/648 , G01N33/582 , G01N2021/6419 , G01N2021/6421 , G01N2021/6439 , G01N2021/6441 , G02B21/16 , G02B21/367 , G02B27/58
摘要： First activation radiation is provided to a sample that includes phototransformable optical labels (“PTOLs”) to activate a first subset of the PTOLs in the sample. First excitation radiation is provided to the first subset of PTOLs in the sample to excite at least some of the activated PTOLs, and radiation emitted from activated and excited PTOLs within the first subset of PTOLs is detecting with imaging optics. The first activation radiation is controlled such that the mean volume per activated PTOL in the first subset is greater than or approximately equal to a diffraction-limited resolution volume (“DLRV”) of the imaging optics.
摘要翻译：将第一激活辐射提供给包括光变形光学标签（“PTOL”）的样品，以激活样品中PTOL的第一子集。将第一激发辐射提供给样品中的PTOL的第一子集，以激发至少一些激活的PTOL，并且由PTOL的第一子集内的激活和激发的PTOL发射的辐射正在用成像光学元件进行检测。控制第一激活辐射，使得第一子集中每个激活的PTOL的平均体积大于或近似等于成像光学器件的衍射限制分辨率体积（“DLRV”）。

6. 发明授权

US07626694B2 Optical microscopy with phototransformable optical labels 有权
标题翻译：具有光变光学标签的光学显微镜
公开(公告)号：US07626694B2
公开(公告)日：2009-12-01
申请号：US11944280
申请日：2007-11-21
申请人： Robert Eric Betzig , Harald F. Hess
发明人： Robert Eric Betzig , Harald F. Hess
IPC分类号： G01J3/30
CPC分类号： G01N21/6428 , G01N21/64 , G01N21/6458 , G01N21/648 , G01N33/582 , G01N2021/6419 , G01N2021/6421 , G01N2021/6439 , G01N2021/6441 , G02B21/16 , G02B21/367 , G02B27/58
摘要： First activation radiation is provided to a sample that includes fluorescent proteins (“FPs”) to activate a first subset of the FPs in the sample. First excitation radiation is provided to the first subset of FPs in the sample to excite at least some of the activated FPs, and radiation emitted from activated and excited FPs within the first subset of FPs is detecting with imaging optics. The first activation radiation is controlled such that the mean volume per activated FPs in the first subset is greater than or approximately equal to a diffraction-limited resolution volume (“DLRV”) of the imaging optics.
摘要翻译：第一激活辐射被提供给包括荧光蛋白（“FP”）的样品，以激活样品中FP的第一子集。第一激发辐射被提供给样本中的FP的第一子集，以激励至少一些激活的FP，并且从FP的第一子集内的激活和激发的FP发射的辐射是用成像光学器件进行检测的。控制第一激活辐射，使得第一子集中每个激活的FP的平均体积大于或近似等于成像光学器件的衍射限制分辨率体积（“DLRV”）。

7. 发明授权

US07505143B2 Dynamic reference plane compensation 有权
标题翻译：动态参考平面补偿
公开(公告)号：US07505143B2
公开(公告)日：2009-03-17
申请号：US11130830
申请日：2005-05-17
申请人： Harald F. Hess , Thomas Daniel Carr , Romain Sappey
发明人： Harald F. Hess , Thomas Daniel Carr , Romain Sappey
IPC分类号： G01B11/02
CPC分类号： G01B9/0207 , G11B5/6052
摘要： In one embodiment, a method of dynamic reference plane compensation, comprises impinging radiation from a first radiation source onto a surface of an object; generating an uncompensated measurement signal from radiation reflected from a first location on the surface and a second location; generating a compensation signal from radiation reflected from a third location and a fourth location on the surface; and generating a compensated measurement signal using the uncompensated measurement signal and the compensation signal.
摘要翻译：在一个实施例中，动态参考平面补偿的方法包括将来自第一辐射源的辐射照射到物体的表面上; 从表面上的第一位置反射的辐射和第二位置产生未补偿的测量信号; 从表面上的第三位置和第四位置反射的辐射产生补偿信号; 以及使用所述未补偿的测量信号和所述补偿信号产生补偿的测量信号。

8. 发明授权

US06424745B1 Method and apparatus for object recognition 失效
标题翻译：用于对象识别的方法和装置
公开(公告)号：US06424745B1
公开(公告)日：2002-07-23
申请号：US09081469
申请日：1998-05-19
申请人： Mark Henry Hansen , Harald F. Hess , Partha Pratim Mitra , Gordon Albert Thomas
发明人： Mark Henry Hansen , Harald F. Hess , Partha Pratim Mitra , Gordon Albert Thomas
IPC分类号： G06K946
CPC分类号： G06K9/522 , G06K2209/17
摘要： A method and system for optically recognizing an object from a reference library of known products based on a spectrum of local radius of curvature of the object. A surface portion of an object is illuminated with a pattern of light that permits the extraction of three dimensional coordinates for a set of points on the surface portion of the object. An image data set of the surface portion of the object is then captured with a capture device that is positioned at an angular offset with respect to a source of the light. That is, the combination of the light pattern and the imaging device together generate a two dimensional captured image, from which it is possible to extract the three dimensional coordinates for the set of points on the surface portion of the object. A set of local radii of curvatures are then determined for selected data points in the image data set. A spectrum representing a distribution of the curvatures is then computed for the set of local radii of curvatures. If the data set is for the generation of a library of spectra, it is processed with a dimension reduction analysis to determine a single set of basis functions representing all of the objects and a corresponding set of basis coefficients for each different type of object. If the data set is for an unknown object, then the dimension reduction analysis and the basis functions are applied to the data set to generate an unidentified set of basis coefficients. This latter set is then statistically compared with the reference library of spectra to identify the product or at least designate the closest known products.
摘要翻译：一种用于基于对象的局部曲率半径的光谱从已知产品的参考库光学地识别对象的方法和系统。物体的表面部分用允许提取物体的表面部分上的一组点的三维坐标的图案来照亮。然后利用相对于光源以角度偏移定位的捕获装置捕获对象的表面部分的图像数据集。也就是说，光图案和成像装置的组合一起产生二维拍摄图像，从该图像可以提取对象的表面部分上的该组点的三维坐标。然后对图像数据集中的选定数据点确定一组局部曲率半径。然后，对于局部曲率半径的集合计算表示曲率分布的光谱。如果数据集用于生成光谱库，则通过维数减小分析来处理数据集，以确定表示所有对象的单个基函数集合，以及每个不同类型对象的对应的一组基准系数。如果数据集用于未知对象，则将维度减小分析和基函数应用于数据集以生成未识别的基系数集合。然后将后一组与谱的参考文献库进行统计学比较以鉴定产物或至少指定最接近的已知产物。

9. 发明授权

US08780442B2 Optical interfering apparatus 有权
标题翻译：光干扰装置
公开(公告)号：US08780442B2
公开(公告)日：2014-07-15
申请号：US13051670
申请日：2011-03-18
申请人： Harald F. Hess
发明人： Harald F. Hess
IPC分类号： G02B21/00
CPC分类号： G01B9/02041 , G01B9/02007 , G01B9/02081 , G01B9/02097 , G01B9/04 , G01B2290/45 , G01B2290/55 , G01N21/6456 , G01N21/6458 , G02B21/0056 , G02B21/0076 , G02B21/008 , G02B21/14 , G02B21/367 , H04N13/214
摘要： In one embodiment, an apparatus comprises an optical system with multiple detectors and a processor. The optical system is configured to produce images of an optical source in a first dimension and a second dimension substantially orthogonal to the first dimension at each detector at a given time. Each image from the images is based on an interference of an emission from the optical source in a first direction and an emission from the optical source in a second direction different from the first direction. The processor is configured to calculate a position in a third dimension based on the images. The third dimension is substantially orthogonal to the first dimension and the second dimension.
摘要翻译：在一个实施例中，一种装置包括具有多个检测器和处理器的光学系统。光学系统被配置为在给定时间在每个检测器处产生第一尺寸和基本上垂直于第一尺寸的第二尺寸的光源的图像。来自图像的每个图像基于来自第一方向上的来自光源的发射的干扰和来自与第一方向不同的第二方向的来自光源的发射。处理器被配置为基于图像计算第三维度中的位置。第三尺寸基本上与第一尺寸和第二尺寸正交。

10. 发明授权

US07916304B2 Systems and methods for 3-dimensional interferometric microscopy 有权
标题翻译：三维干涉显微镜的系统和方法
公开(公告)号：US07916304B2
公开(公告)日：2011-03-29
申请号：US11961601
申请日：2007-12-20
申请人： Harald F. Hess
发明人： Harald F. Hess
IPC分类号： G01B11/02 , G02B21/00
CPC分类号： G01B9/02041 , G01B9/02007 , G01B9/02081 , G01B9/02097 , G01B9/04 , G01B2290/45 , G01B2290/55 , G01N21/6456 , G01N21/6458 , G02B21/0056 , G02B21/0076 , G02B21/008 , G02B21/14 , G02B21/367 , H04N13/214
摘要： In one embodiment, an apparatus comprises an optical system with multiple detectors and a processor. The optical system is configured to produce images of an optical source in a first dimension and a second dimension substantially orthogonal to the first dimension at each detector at a given time. Each image from the images is based on an interference of an emission from the optical source in a first direction and an emission from the optical source in a second direction different from the first direction. The processor is configured to calculate a position in a third dimension based on the images. The third dimension is substantially orthogonal to the first dimension and the second dimension.
摘要翻译：在一个实施例中，一种装置包括具有多个检测器和处理器的光学系统。光学系统被配置为在给定时间在每个检测器处产生第一尺寸和基本上垂直于第一尺寸的第二尺寸的光源的图像。来自图像的每个图像基于来自第一方向上的来自光源的发射的干扰和来自与第一方向不同的第二方向的来自光源的发射。处理器被配置为基于图像计算第三维度中的位置。第三尺寸基本上与第一尺寸和第二尺寸正交。

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