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    • 2. 发明授权
    • Adder-based base cell for field programmable gate arrays
    • 用于现场可编程门阵列的基于加法器的基电池
    • US5488315A
    • 1996-01-30
    • US369060
    • 1995-01-05
    • Shivaling S. Mahant-ShettiManisha AgarwalaMahesh M. MehendaleRobert J. LandersMark G. Harward
    • Shivaling S. Mahant-ShettiManisha AgarwalaMahesh M. MehendaleRobert J. LandersMark G. Harward
    • G06F7/50G06F7/501H03K19/173H03K19/177
    • G06F7/501H03K19/1736G06F2207/4812
    • An adder-based base cell (10) is provided for field programmable gate arrays. The base cell (10) includes a first inverter (13) operable to receive a first input signal (A). A first NAND gate (12) is coupled to the first inverter (13) and is operable to receive a second input signal (B). A first 2:1 multiplexer (14) is coupled to the first NAND gate (12) and is operable to receive a third input signal (C). The output of the first 2:1 multiplexer (14) represents a first function (F1). A second inverter (17) is operable to receive a fourth input signal (D). A second NAND gate (16) is coupled to the second inverter (17) and is operable to receive a fifth input signal (E). An XOR gate (18) is coupled to the second NAND gate (16), is operable to receive a sixth input signal (F), and is coupled to the first 2:1 multiplexer (14). The output of the XOR gate represents a partial sum function (PS.sub.-- 1). A second 2:1 multiplexer (19) is operable to receive a seventh input signal (G), is operable to receive an eighth input signal (H) and is coupled to the XOR gate (18). The output of the second 2:1 multiplexer (19) represents a second function (F2).
    • 为现场可编程门阵列提供基于加法器的基电池(10)。 基站(10)包括可操作以接收第一输入信号(A)的第一反相器(13)。 第一NAND门(12)耦合到第一反相器(13)并且可操作以接收第二输入信号(B)。 第一2:1多路复用器(14)耦合到第一与非门(12)并且可操作以接收第三输入信号(C)。 第一2:1多路复用器(14)的输出表示第一功能(F1)。 第二逆变器(17)可操作以接收第四输入信号(D)。 第二NAND门(16)耦合到第二反相器(17)并且可操作以接收第五输入信号(E)。 XOR门(18)耦合到第二与非门(16),可操作以接收第六输入信号(F),并耦合到第一2:1复用器(14)。 XOR门的输出表示部分和函数(PS-1)。 第二2:1复用器(19)可操作以接收第七输入信号(G),可操作以接收第八输入信号(H)并耦合到异或门(18)。 第二2:1复用器(19)的输出表示第二功能(F2)。
    • 6. 发明授权
    • Memory cell with programmable antifuse technology
    • 具有可编程反熔丝技术的存储单元
    • US5426614A
    • 1995-06-20
    • US181523
    • 1994-01-13
    • Mark G. Harward
    • Mark G. Harward
    • G11C17/14G11C7/20G11C17/16H01L21/82H01L21/8244H01L27/10H01L27/11
    • G11C7/20G11C17/16
    • A memory cell (10) comprising a first antifuse (A1) operable to place the memory cell (10) in a non-volatile state. In one embodiment, the memory cell (10) comprises a pair of cross-coupled inverters (I1,I2). The first antifuse (A1)is connected between an output (B) of one of the cross-coupled inverters and ground and is operable to place the memory cell in a first non-volatile state. A second antifuse (A2) is connected between an output (B) and a supply voltage (Vcc) and is operable to place the memory cell (10) in a second non-volatile state. Only one of the antifuses, (A1 or A2) is programmed in memory cell (10).
    • 一种存储单元(10),包括可操作以将所述存储单元(10)置于非易失性状态的第一反熔丝(A1)。 在一个实施例中,存储单元(10)包括一对交叉耦合的反相器(I1,I2)。 第一反熔丝(A1)连接在交叉耦合的反相器之一的输出(B)和地之间,并且可操作以将存储单元置于第一非易失性状态。 第二反熔丝(A2)连接在输出(B)和电源电压(Vcc)之间,并且可操作以将存储单元(10)置于第二非易失性状态。 只有一个反熔丝(A1或A2)被编程在存储单元(10)中。