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    • 5. 发明申请
    • DEVICE AND METHOD FOR MEASURING LAYER THICKNESSES
    • 用于测量层厚度的装置和方法
    • WO2008055473A8
    • 2008-07-31
    • PCT/DE2007001945
    • 2007-10-30
    • MTU AERO ENGINES GMBHJAKIMOV ANDREASHERTTER MANUELSCHNEIDERBANGER STEFAN
    • JAKIMOV ANDREASHERTTER MANUELSCHNEIDERBANGER STEFAN
    • G01B21/08
    • G01B21/08
    • The invention relates to a device for measuring layer thicknesses, especially of a part (18) during or following a coating process. Said device comprises at least one first and a second distance measuring apparatus (12, 14). The first distance measuring apparatus (12) makes it possible to measure a first distance (a) to a surface (20) of a layer (22) that is to be applied to the part (18) while the second distance measuring apparatus (14) makes it possible to measure a second distance (b) to an uncoated surface (24) of the part (18), the measurements being taken continuously or at predefined points in time. According to the invention, the device (10) further comprises at least one third distance measuring apparatus (16) for measuring and monitoring the position of the first distance measuring apparatus (12) relative to the part (18), said third distance measuring apparatus (16) making it possible to measure a third distance (c) in a continuous manner or at predefined points in time in order to determine the position of the part (18). The invention also relates to a method for measuring layer thicknesses, particularly of a part (18) during or following a coating process.
    • 本发明涉及一种装置,用于在或涂覆过程之后测量的层厚度,尤其是对于一个部件(18)的层厚度的测量,一个具有至少一个第一和一个第二距离测量装置(12,14),由所述第一距离计测装置的装置(12) 第一路径长度(a)与部件的表面(20),(18)层被施加(22)和第二距离测量装置(14)包括一个第二路径长度(b)和成分(18)的未涂覆的表面(24)连续地 或者在预定义的时间测量。 根据本发明,该装置(10)还至少包括用于确定测量和监测(12)相对于所述部件(18)的第一Weglängenmessgeräts的位置,由所述第三距离计测装置(16)的第三流路(c)的第三距离测量装置(16) 部件(18)的位置连续地或在预定的时间被测量。 本发明还涉及一种用于测量层厚度的方法,特别是用于在涂覆过程期间或之后测量部件(18)的层厚度。
    • 10. 发明申请
    • ARRANGEMENT FOR MONITORING THERMAL SPRAY PROCESSES
    • 安排监测热喷涂工艺
    • WO2006105762A3
    • 2007-04-19
    • PCT/DE2006000555
    • 2006-03-30
    • MTU AERO ENGINES GMBHHERTTER MANUELHOESCHELE JOERGSCHNEIDERBANGER STEFANSTEINWANDEL JUERGEN
    • HERTTER MANUELHOESCHELE JOERGSCHNEIDERBANGER STEFANSTEINWANDEL JUERGEN
    • H05H1/00
    • H05H1/0037H05H1/0025
    • The invention relates to an arrangement for measuring characteristic properties of a plasma beam in a thermal spray process, said arrangement comprising means for introducing spray materials into the plasma, a one-dimensional or two-dimensional array consisting of first optical waveguides (2a) for receiving the light radiation emitted by the plasma (1), and other optical waveguides (2b, 2c) for distributing the light radiation emitted by the plasma (1). According to the invention, means (W) are provided for splitting the light guided in the first optical waveguides (2a) into the other optical waveguides (2b, 2c), one optical waveguide (2c) being connected to the opening diaphragm of a particle flow arrangement (7), and the other optical waveguide (2b) being connected to the opening diaphragm of a spectrometer (3). Means (5, 7) are also provided for determining the current state of the spray process.
    • 本发明涉及一种装置,用于测量在热喷涂工艺的等离子体束的特征性质,包括:用于供给喷涂材料的等离子体,第一光纤(2a)中从发射(1)的光照射,并进一步等离子体容纳的一维或二维阵列 等离子体(1)的光发射的辐射的分布的光纤(2B,2C)。 根据本发明,装置是(W)呈现出用于将进入的光的第一光纤(2a)中在所述另外的光纤(2B,2C),其中,所述一个光学纤维(2c)的至颗粒磁通布置的输入孔(7) 和其他光纤(2b)中连接到光谱仪(3)和装置的输入孔(5,7),用于确定所述喷射过程的瞬时状态都存在。