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1. 发明申请

WO2011097386A1 MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME 审中-公开
标题翻译：多平面多反射风扇光束检测系统及其使用方法
公开(公告)号：WO2011097386A1
公开(公告)日：2011-08-11
申请号：PCT/US2011/023612
申请日：2011-02-03
申请人： MORPHO DETECTION, INC. , HARDING, Geoffrey , OLESINSKI, Stephan , KOSCIESZA, Dirk , STRECKER, Helmut Rudolf
发明人： HARDING, Geoffrey , OLESINSKI, Stephan , KOSCIESZA, Dirk , STRECKER, Helmut Rudolf
IPC分类号： G21K1/02
CPC分类号： G21K1/025 , G01V5/0016 , G01V5/0025
摘要： A detection system (100) includes a multi- focus radiation source (108) configured to generate X-ray radiation and a primary collimator (116) defining a first row of apertures (140) and a second row of apertures (160). The first row of apertures forms first X-ray beams (136) within a first plane (104) from the X-ray radiation, and the second row of apertures forms second X-ray beams (133) within a second plane (106) from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector (122) including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.
摘要翻译：检测系统（100）包括被配置为产生X射线辐射的多焦点辐射源（108）和限定第一排孔（140）和第二排孔（160）的主准直器（116）。第一排孔从X射线辐射在第一平面（104）内形成第一X射线束（136），并且第二排孔在第二平面（106）内形成第二X射线束（133）从X射线辐射。第一个平面与第二个平面不同。检测系统还包括散射检测器（122），其包括第一排散射检测器元件和第二排散射检测器元件。第一排散射检测器元件被配置为检测来自第一X射线束的散射辐射，并且第二排散射检测器元件被配置为检测来自第二X射线束的散射辐射。

2. 发明申请

WO2010065460A2 PRIMARY COLLIMATOR AND SYSTEMS FOR X-RAY DIFFRACTION IMAGING, AND METHOD FOR FABRICATING A PRIMARY COLLIMATOR 审中-公开
标题翻译：用于X射线衍射成像的主要收缩器和系统，以及用于制造主要收缩机的方法
公开(公告)号：WO2010065460A2
公开(公告)日：2010-06-10
申请号：PCT/US2009/066115
申请日：2009-11-30
申请人： MORPHO DETECTION, INC. , HARDING, Geoffrey , STRECKER, Helmut Rudolf , DELFS, Johannes
发明人： HARDING, Geoffrey , STRECKER, Helmut Rudolf , DELFS, Johannes
IPC分类号： G21K1/02
CPC分类号： G21K1/025 , G01V5/00
摘要： A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel.
摘要翻译：用于多反向风扇束x射线衍射成像（MIFB XDI）系统的主准直器。 MIFB XDI系统包括定义沿着MFXS的长度布置的多个聚焦点的多焦点X射线源（MFXS）。顺序地激活每个对焦点以发射包括多个主光束的x射线扇形束，每个主光束指向相应的会聚点。主准直器包括构造成相对于MFXS定位的第一隔膜。第一隔膜通过第一隔膜的厚度限定多个第一通道。每个第一通道与对应的焦点对准，并且被配置成透射x射线扇形束。第二隔膜相对于第一隔膜定位，并且通过第二隔膜的厚度限定多个第二通道。每个第二通道与对应的第一通道轴向对准。

3. 发明申请

WO2008118568A3 IN-LINE HIGH-THROUGHPUT CONTRABAND DETECTION SYSTEM 审中-公开
标题翻译：在线高通量对比度检测系统
公开(公告)号：WO2008118568A3
公开(公告)日：2008-10-02
申请号：PCT/US2008/054345
申请日：2008-02-20
申请人： GENERAL ELECTRIC COMPANY , EDIC, Peter, Michael , VERMILYEA, Mark, E. , TKACZYK, John, Eric , LANDOLFI, Pierfrancesco , HARDING, Geoffrey , SKATTER, Sondre , MERZBACHER, Matthew, Allen , STRECKER, Helmut, Rudolf , RITCHIE, Cameron, John
发明人： EDIC, Peter, Michael , VERMILYEA, Mark, E. , TKACZYK, John, Eric , LANDOLFI, Pierfrancesco , HARDING, Geoffrey , SKATTER, Sondre , MERZBACHER, Matthew, Allen , STRECKER, Helmut, Rudolf , RITCHIE, Cameron, John
IPC分类号： G01V5/00
摘要： A contraband detection system includes a first contraband detection apparatus designed to perform a first scan on an object and a second contraband detection apparatus positioned in-line with the first contraband detection apparatus to perform a second scan on the object. A computer is included in the contraband detection system and is programmed to cause the first contraband detection apparatus to perform the first scan and acquire object data therefrom. The computer is further programmed to identify one or more regions of interest (ROI) in the object based on the object data, cause the second contraband detection apparatus to perform the second scan on the one or more identified ROIs, and acquire object data from the second scan.
摘要翻译：违禁品检测系统包括被设计为对对象执行第一扫描的第一违禁品检测设备以及与第一违禁品检测设备位于同一直线上的第二违禁品检测设备，以对第目的。计算机被包括在违禁品检测系统中，并被编程为使第一违禁品检测设备执行第一扫描并从中获取对象数据。计算机被进一步编程为基于对象数据识别对象中的一个或多个感兴趣区域（ROI），使第二违禁品检测设备对一个或多个识别的ROI执行第二扫描，并且从第第二次扫描。

4. 发明申请

WO2010051366A2 SYSTEM AND METHOD FOR X-RAY DIFFRACTION IMAGING 审中-公开
标题翻译：用于X射线衍射成像的系统和方法
公开(公告)号：WO2010051366A2
公开(公告)日：2010-05-06
申请号：PCT/US2009/062547
申请日：2009-10-29
申请人： MORPHO DETECTION, INC. , HARDING, Geoffrey
发明人： HARDING, Geoffrey
IPC分类号： G01N23/201
CPC分类号： G01V5/0016 , G01N23/20083 , G01T1/00 , G01V5/0025
摘要： An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.
摘要翻译：提供X射线衍射成像系统。 X射线衍射成像系统包括被配置为发射X射线笔束的X射线源和被配置为接收具有来自X射线笔形束的散射角的散射辐射的散射检测器。散射检测器基本上位于平面中并且包括多个检测器条。第一检测条具有等于在平行于第一宽度的方向上在该平面处测量的X射线笔束的线性范围的第一宽度。

5. 发明申请

WO2010062543A2 APPARATUS AND METHOD FOR IDENTIFYING COMPONENTS IN A CONTAINER 审中-公开
标题翻译：用于识别集装箱中组件的装置和方法
公开(公告)号：WO2010062543A2
公开(公告)日：2010-06-03
申请号：PCT/US2009/062033
申请日：2009-10-26
申请人： MORPHO DETECTION, INC. , COZZINI, Cristina Francesca , BALLER, Marko Klaus , HARDING, Geoffrey
发明人： COZZINI, Cristina Francesca , BALLER, Marko Klaus , HARDING, Geoffrey
IPC分类号： G01N23/04 , G01N23/201
CPC分类号： G01N23/20083 , G01N2223/639 , G01V5/0016 , G01V5/0025
摘要： A scanner includes a transmission detector, an x-ray source positioned to emit a beam of x-rays toward the transmission detector, and a scatter detector positioned to receive x-rays scattered from the beam of x-rays by an object. The scanner includes a computer programmed to receive data from the transmission detector and from the scatter detector, and determine a material composition of the object based on the data received from the transmission and scatter detectors.
摘要翻译：扫描器包括传输检测器，定位成朝向传输检测器发射X射线束的x射线源，以及散射检测器，其被定位成接收由物体从X射线束散射的X射线。扫描器包括被编程为从传输检测器和散射检测器接收数据的计算机，并且基于从传输和散射检测器接收的数据来确定对象的材料组成。

6. 发明申请

WO2012074915A1 METHOD AND SYSTEM FOR DERIVING MOLECULAR INTERFERENCE FUNCTIONS FROM XRD PROFILES 审中-公开
标题翻译：用于从XRD图谱衍生分子干涉函数的方法和系统
公开(公告)号：WO2012074915A1
公开(公告)日：2012-06-07
申请号：PCT/US2011/062212
申请日：2011-11-28
申请人： MORPHO DETECTION, INC. , HARDING, Geoffrey
发明人： HARDING, Geoffrey
IPC分类号： G01N23/20
CPC分类号： G01N23/20083 , G01N2223/045 , G01N2223/1016 , G01N2223/637 , G01N2223/639
摘要： A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.
摘要翻译：用于鉴定物质的方法包括确定第一物质的第一分子干涉功能（MIF）。该方法还包括确定第二物质的第二MIF。该方法还包括至少部分地基于第二MIF与第一MIF的比较来产生残余MIF。该方法还包括基于剩余的MIF来识别物质的类型。

7. 发明申请

WO2010059784A2 METHODS AND SYSTEM FOR CALIBRATING AND CORRECTING A DETECTION SYSTEM 审中-公开
标题翻译：用于校准和校正检测系统的方法和系统
公开(公告)号：WO2010059784A2
公开(公告)日：2010-05-27
申请号：PCT/US2009/065081
申请日：2009-11-19
申请人： MORPHO DETECTION, INC. , HARDING, Geoffrey
发明人： HARDING, Geoffrey
IPC分类号： G01N23/04
CPC分类号： G01N23/04 , G01N2223/303 , G01V5/00
摘要： A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle.
摘要翻译：用于校准包括多焦点X射线源的检测系统的方法包括使用检测系统执行校准材料的扫描以获取扫描数据，使用扫描数据确定校准材料的衍射轮廓，导出实际散射角度，使用所确定的衍射轮廓，使用确定的实际散射角导出偏移角，存储导出的偏移角，以及生成包括所存储的偏移角的表。

8. 发明公开

EP2646810A1 METHOD AND SYSTEM FOR DERIVING MOLECULAR INTERFERENCE FUNCTIONS FROM XRD PROFILES 审中-公开
标题翻译：方法和系统用于确定干扰功能分子水平OFF XRD图
公开(公告)号：EP2646810A1
公开(公告)日：2013-10-09
申请号：EP11845324.0
申请日：2011-11-28
申请人： Morpho Detection, Inc.
发明人： HARDING, Geoffrey
IPC分类号： G01N23/20
CPC分类号： G01N23/20083 , G01N2223/045 , G01N2223/1016 , G01N2223/637 , G01N2223/639
摘要： A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

9. 发明公开

EP2344909A2 SYSTEM AND METHOD FOR X-RAY DIFFRACTION IMAGING 有权转让
标题翻译：系统VERFAHREN ZURRÖNTGENBEUGUNGSBILDGEBUNG
公开(公告)号：EP2344909A2
公开(公告)日：2011-07-20
申请号：EP09745230.4
申请日：2009-10-29
申请人： Morpho Detection, Inc.
发明人： HARDING, Geoffrey
IPC分类号： G01V5/00
CPC分类号： G01V5/0016 , G01N23/20083 , G01T1/00 , G01V5/0025
摘要： An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.
摘要翻译：提供X射线衍射成像系统。 X射线衍射成像系统包括被配置为发射X射线笔形束的X射线源和被配置为接收具有来自X射线笔形束的散射角的散射辐射的散射检测器。散射检测器基本上位于平面中并且包括多个检测器条。第一检测条具有等于在平行于第一宽度的方向上在该平面处测量的X射线笔形光束的线性范围的第一宽度。

10. 发明授权

EP2344909B1 SYSTEM AND METHOD FOR X-RAY DIFFRACTION IMAGING 有权转让
标题翻译：用于X射线衍射成像的系统和方法
公开(公告)号：EP2344909B1
公开(公告)日：2017-07-19
申请号：EP09745230.4
申请日：2009-10-29
申请人： Morpho Detection, Inc.
发明人： HARDING, Geoffrey
IPC分类号： G01V5/00
CPC分类号： G01V5/0016 , G01N23/20083 , G01T1/00 , G01V5/0025

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