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    • 2. 发明申请
    • X-RAY DIFFRACTOMETRY METHOD
    • 方法X射线衍射
    • WO9713397A2
    • 1997-04-17
    • PCT/DE9601868
    • 1996-09-30
    • UNIV DRESDEN TECHMEYER DIRKRICHTER KURTSEIDEL ANDREAS
    • MEYER DIRKRICHTER KURTSEIDEL ANDREAS
    • G01N23/20
    • G01N23/20091
    • The invention concerns a method of obtaining an X-ray diffractogram with an X-ray diffractometer using an energy-resolving detector, influences from the operation of the diffractometer, detector properties and the background (radiation of energy other than that the useful radiation) being eliminated and full use being made of the available useful radiation (inter alia the characteristic radiation of an X-ray tube). In this way, the measuring time can be reduced to a quarter in comparison with an X-ray diffractometer using a crystal monochromator, whilst the measuring results have the same degree of statistical reliability. The method offers particular advantages for the measuring of weak reflexes in the presence of a high-energy background.
    • 本发明涉及一种方法,用于使用能量分辨检测器的X射线衍射装置,其中,所述衍射仪,检测器的特性和所述地下(不同的能量比有用辐射的能量的辐射)的设备功能的影响被消除,和可用的有用辐射(通常是特征辐射获得的X射线衍射 的X射线管),以得到充分的发挥。 测量时间可以被减少到四分之一相比于具有与所述测量结果的相同置信水平晶体单色的X射线衍射仪。 在高底物的存在弱反射的测量的方法的特别的优点。