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    • 9. 发明授权
    • Patterned thin film dielectric stack formation
    • 图案化薄膜电介质叠层形成
    • US08927434B2
    • 2015-01-06
    • US13600274
    • 2012-08-31
    • Carolyn R. EllingerDavid H. LevyShelby F. Nelson
    • Carolyn R. EllingerDavid H. LevyShelby F. Nelson
    • H01L21/314
    • H01L21/02348C23C16/04C23C16/45525H01L21/02178H01L21/022H01L21/0228H01L21/02299H01L21/02334H01L21/0234H01L29/4908
    • A method of producing a patterned inorganic thin film dielectric stack includes providing a substrate. A first patterned deposition inhibiting material layer is provided on the substrate. A first inorganic thin film dielectric material layer is selectively deposited on a region of the substrate where the first deposition inhibiting material layer is not present using an atomic layer deposition process. The first deposition inhibiting and first inorganic thin film dielectric material layers are simultaneously treated after deposition of the first inorganic thin film dielectric material layer. A second patterned deposition inhibiting material layer is provided on the substrate. A second inorganic thin film dielectric material layer is selectively deposited on a region of the substrate where the second deposition inhibiting material layer is not present using an atomic layer deposition process. The first and second inorganic thin film dielectric material layers form a patterned inorganic thin film dielectric stack.
    • 制造图案化无机薄膜电介质叠层的方法包括提供基板。 第一图案化沉积抑制材料层设置在基板上。 使用原子层沉积工艺,在不存在第一沉积抑制材料层的基板的区域上选择性地沉积第一无机薄膜电介质材料层。 在沉积第一无机薄膜电介质材料层之后,同时处理第一沉积抑制和第一无机薄膜电介质材料层。 第二图案化的沉积抑制材料层设置在基板上。 使用原子层沉积工艺,在不存在第二沉积抑制材料层的基板的区域上选择性地沉积第二无机薄膜电介质材料层。 第一和第二无机薄膜电介质材料层形成图案化的无机薄膜电介质叠层。
    • 10. 发明授权
    • High performance thin film transistor
    • 高性能薄膜晶体管
    • US08653516B1
    • 2014-02-18
    • US13600323
    • 2012-08-31
    • Shelby F. NelsonCarolyn R. EllingerDavid H. Levy
    • Shelby F. NelsonCarolyn R. EllingerDavid H. Levy
    • H01L29/10
    • H01L29/4908H01L29/66969H01L29/7869
    • A transistor includes a substrate; a gate including a first electrically conductive layer stack on the substrate; and a first inorganic thin film dielectric layer on the substrate with the first inorganic thin film dielectric layer having a first pattern. A second inorganic thin film dielectric layer, having a second pattern, is in contact with the first inorganic thin film dielectric layer. The first inorganic thin film dielectric layer and the second thin film dielectric layer have the same material composition. A third inorganic thin film dielectric layer has a third pattern. A semiconductor layer is in contact with and has the same pattern as the third inorganic thin film dielectric material layer. A source/drain includes a second electrically conductive layer stack.
    • 晶体管包括衬底; 栅极,包括在所述衬底上的第一导电层堆叠; 以及第一无机薄膜电介质层,其具有第一图案的第一无机薄膜电介质层。 具有第二图案的第二无机薄膜电介质层与第一无机薄膜电介质层接触。 第一无机薄膜电介质层和第二薄膜电介质层具有相同的材料组成。 第三无机薄膜电介质层具有第三图案。 半导体层与第三无机薄膜电介质材料层接触并具有相同的图案。 源极/漏极包括第二导电层堆叠。