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1. 发明授权

US11002978B2 Microscope having a beam splitter assembly 有权
公开(公告)号：US11002978B2
公开(公告)日：2021-05-11
申请号：US15329624
申请日：2015-07-28
申请人： Leica Microsystems CMS GmbH , Gabriele Petri
发明人： Peter Euteneuer , Ralf Krueger
IPC分类号： G02B27/14 , G02B21/00 , G02B21/24 , G02B21/04 , G02B21/08
摘要： A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).

2. 发明申请

US20130094016A1 METHOD AND APPARATUS FOR IDENTIFYING AND CORRECTING SPHERICAL ABERRATIONS IN A MICROSCOPE IMAGING BEAM PATH 有权
标题翻译：用于识别和校正微观成像光束路径中的球形异常的方法和装置
公开(公告)号：US20130094016A1
公开(公告)日：2013-04-18
申请号：US13650170
申请日：2012-10-12
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： Werner Knebel , Tobias Bauer , Peter Euteneuer
IPC分类号： G01M11/02
CPC分类号： G01M11/02 , G02B21/241
摘要： A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.
摘要翻译：在使用具有目标的显微镜的样品的显微镜成像的上下文中，方法和装置提供了显微镜成像光束路径的球面误差的识别。携带或覆盖样品的盖玻片布置在成像光束路径中。将测量光束以物镜的光轴外的偏心方式引导到物体上。测量光束在盖玻片与样品的界面处反射，反射的测量光束通过物镜被引导到检测器上。用检测器检测反射的测量光束的强度分布，并且定性和/或定量地确定来自强度分布的球面误差的存在。

3. 发明授权

US10025081B2 Microscope for evanescent illumination and point-shaped raster illumination 有权
公开(公告)号：US10025081B2
公开(公告)日：2018-07-17
申请号：US15035067
申请日：2014-10-30
申请人： Leica Microsystems CMS GmbH
发明人： Peter Euteneuer , Christian Schumann
IPC分类号： G02B21/06 , G02B21/00
摘要： An objective and an illumination unit for selectable generation of an orthoscopic beam path proceeding through the objective for pointlike scanning illumination, and of a conoscopic beam path proceeding through the objective for evanescent illumination of an object are disclosed. The illumination unit has a light source for generating illuminating rays along an illuminating beam path; a displacement unit for deflecting the illuminating beam path; a scanning eyepiece, placed after the displacement unit for focusing the illuminating rays into an image plane of the scanning eyepiece; and a mirror surface arranged in the image plane of the scanning eyepiece, having a transparent region for generating the orthoscopic beam path and having an at least partly reflective region facing toward the scanning eyepiece for generating the conoscopic beam path from the illuminating beam path, the image plane is located in a plane conjugated with the exit pupil.

4. 发明申请

US20170212356A1 MICROSCOPE HAVING A BEAM SPLITTER ASSEMBLY 审中-公开
公开(公告)号：US20170212356A1
公开(公告)日：2017-07-27
申请号：US15329624
申请日：2015-07-28
申请人： Leica Microsystems CMS GmbH
发明人： Peter Euteneuer , Ralf Krueger
IPC分类号： G02B27/14 , G02B21/00 , G02B21/08 , G02B21/24
CPC分类号： G02B27/141 , G02B21/0004 , G02B21/0032 , G02B21/082 , G02B21/245
摘要： A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).

5. 发明授权

US08724103B2 Method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path 有权
标题翻译：用于识别和校正显微镜成像光束路径中的球面像差的方法和装置
公开(公告)号：US08724103B2
公开(公告)日：2014-05-13
申请号：US13650170
申请日：2012-10-12
申请人： Leica Microsystems CMS GmbH
发明人： Werner Knebel , Tobias Bauer , Peter Euteneuer
IPC分类号： G01B9/00 , G01N21/41
CPC分类号： G01M11/02 , G02B21/241
摘要： A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.
摘要翻译：在使用具有目标的显微镜的样品的显微镜成像的上下文中，方法和装置提供了显微镜成像光束路径的球面误差的识别。携带或覆盖样品的盖玻片布置在成像光束路径中。将测量光束以物镜的光轴外的偏心方式引导到物体上。测量光束在盖玻片与样品的界面处反射，反射的测量光束通过物镜被引导到检测器上。用检测器检测反射的测量光束的强度分布，并且定性和/或定量地确定来自强度分布的球面误差的存在。

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