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1. 发明授权

US07428783B2 Testing system for flatness and parallelism 失效
标题翻译：测量系统的平直度和平行度
公开(公告)号：US07428783B2
公开(公告)日：2008-09-30
申请号：US11615896
申请日：2006-12-22
申请人： Lei Li , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
发明人： Lei Li , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
IPC分类号： G01B5/20 , G01B7/28
CPC分类号： G01B5/207 , G01B5/25 , G01B5/285
摘要： A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.
摘要翻译：用于测试工件表面的平整度的测试系统包括测试装置（10）和处理器（20）。测试装置包括测试箱（12）和测量装置（14）。测试箱包括多个保持器（122）; 支架定义基准平面。测量装置包括从测试箱延伸出来的多个可动测试极（142）和多个量测器（141），其被配置用于测量测试极回缩到测试箱中的距离。远离测试箱的测试极的端部（1421）位于基准平面上并且被配置为支撑其上的工件的表面，以允许测量仪在工件的压力下测量测试极的回缩距离。测试极的回缩距离等于工件表面和基准平面上的测试点之间的距离。处理器连接到测试装置，用于接收和处理从由量规测量的测试极的回缩距离转换的测试数据。

2. 发明申请

US20070240322A1 TESTING SYSTEM FOR FLATNESS AND PARALLELISM 失效
标题翻译：平面和平行测试系统
公开(公告)号：US20070240322A1
公开(公告)日：2007-10-18
申请号：US11615896
申请日：2006-12-22
申请人： LEI LI , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
发明人： LEI LI , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
IPC分类号： G01B5/25
CPC分类号： G01B5/207 , G01B5/25 , G01B5/285
摘要： A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.
摘要翻译：用于测试工件表面的平整度的测试系统包括测试装置（10）和处理器（20）。测试装置包括测试箱（12）和测量装置（14）。测试箱包括多个保持器（122）; 支架定义基准平面。测量装置包括从测试箱延伸出来的多个可动测试极（142）和多个量测器（141），其被配置用于测量测试极回缩到测试箱中的距离。远离测试箱的测试极的端部（1421）位于基准平面上并且被配置为支撑其上的工件的表面，以允许测量仪在工件的压力下测量测试极的回缩距离。测试极的回缩距离等于工件表面和基准平面上的测试点之间的距离。处理器连接到测试装置，用于接收和处理从由量规测量的测试极的回缩距离转换的测试数据。

3. 发明授权

US07798022B2 Testing devices for multihole workpiece 有权
标题翻译：多孔工件测试装置
公开(公告)号：US07798022B2
公开(公告)日：2010-09-21
申请号：US11926495
申请日：2007-10-29
申请人： Lei Li , Ping Chen , Zhi Cheng , Ai-Ge Sun , Lin-Sen Dong , Chang-Fa Sun
发明人： Lei Li , Ping Chen , Zhi Cheng , Ai-Ge Sun , Lin-Sen Dong , Chang-Fa Sun
IPC分类号： G01M19/00
CPC分类号： B23Q15/22
摘要： A testing device (100) configured for testing a multihole workpiece (10) with a plurality of holes (12), includes a detecting station (120) and an inspecting box (140). The detecting station positions a plurality of detecting pins (124) and a plurality of detecting apparatus (128). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.
摘要翻译：一种被配置为用多个孔（12）测试多孔工件（10）的测试装置（100），包括检测站（120）和检查箱（140）。检测站定位多个检测引脚（124）和多个检测装置（128）。检测销对应于多孔工件的孔。检测装置响应多孔工件并发送检测信号。检查箱从检测站的检测装置接收检测信号，处理并显示检测结果。

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