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    • 1. 发明授权
    • Integrated circuits and methods of designing the same
    • 集成电路及其设计方法
    • US08607172B2
    • 2013-12-10
    • US13267310
    • 2011-10-06
    • Lee-Chung LuLi-Chun TienHui-Zhong ZhuangMei-Hui Huang
    • Lee-Chung LuLi-Chun TienHui-Zhong ZhuangMei-Hui Huang
    • G06F17/50
    • H01L27/0207G06F17/5068G06F17/5077H01L27/11807H01L2027/11875H01L2027/11885
    • A method of designing an integrated circuit includes deploying an active area in a first standard cell. At least one gate electrode is routed, overlapping the active area in the first standard cell. At least one metallic line structure is routed, overlapping the active area in the first standard cell. The at least one metallic line structure is substantially parallel to the gate electrode. A first power rail is routed substantially orthogonal to the at least one metallic line structure in the first standard cell. The first power rail overlaps the at least one metallic line structure. The first power rail has a flat edge that is adjacent to the at least one metallic line structure. A first connection plug is deployed at a region where the first power rail overlaps the at least one metallic line structure in the first standard cell.
    • 设计集成电路的方法包括在第一标准单元中部署有效区域。 至少一个栅电极被路由,与第一标准单元中的有效区重叠。 至少一个金属线结构被路由,与第一标准单元中的有效区重叠。 至少一个金属线结构基本上平行于栅电极。 第一电源轨道基本上正交于第一标准单元中的至少一个金属线结构。 第一电力轨与至少一个金属线结构重叠。 第一动力轨具有与至少一个金属线结构相邻的平坦边缘。 第一连接插头部署在第一电力轨道与第一标准单元中的至少一个金属线结构重叠的区域处。