专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2009063558A Ultrasonic inspection apparatus, ultrasonic inspection method and nondestructive inspection method of nuclear power plant 有权
标题翻译：超声波检查装置，超声波检查方法和核电厂非结构检查方法
公开(公告)号：JP2009063558A
公开(公告)日：2009-03-26
申请号：JP2008117429
申请日：2008-04-28
申请人： Laser Gijutsu Sogo Kenkyusho , Mitsubishi Heavy Ind Ltd , 三菱重工業株式会社 , 財団法人レーザー技術総合研究所
发明人： SHIMAZAKI MASANORI , TAKEISHI MASAYUKI , HIRAYAMA TOMOYUKI , SHIMADA YOSHINORI , OLEG KOTIAEV
IPC分类号： G01N29/00 , G01N29/04 , G01N29/24 , G21C17/003
CPC分类号： G01N29/2418 , G01N29/043 , G01N29/34 , G01N29/348 , G01S15/8965 , G10K15/046 , G21C17/003
摘要： PROBLEM TO BE SOLVED: To provide an ultrasonic inspection apparatus, ultrasonic inspection method and nondestructive inspection method of a nuclear power plant capable of generating a sufficient intensity of ultrasonic wave effectively and capable of preferably inspecting it over a wide range. SOLUTION: The ultrasonic inspection device 1 includes a laser device 5 for emitting a laser beam of controlled output and an ultrasonic sound transmission part 17 for volume inspection being irradiated with the laser beam from the laser device 5 and provided with a transmission diaphragm 39 generating the ultrasonic sound wave, thereby inspecting a structural member 77 irradiated with the ultrasound generated by the transmission diaphragm 39 of the ultrasonic sound transmission part 17 for volume inspection. The transmission diaphragm 39 is characterized by that it is made of titanium. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够有效地产生足够强度的超声波并能够在宽范围内检查的核电站的超声波检查装置，超声波检查方法和非破坏性检查方法。解决方案：超声波检查装置1包括用于发射受控输出的激光束的激光装置5和用于体积检查的超声波传播部17，其被来自激光装置5的激光束照射并设置有透光膜 39，产生超声波，从而检查由超声波传播部17的传播隔膜39产生的超声波照射的结构部件77进行体积检查。透光隔膜39的特征在于它由钛制成。版权所有（C）2009，JPO＆INPIT

2. 发明专利

JP2009031237A Non-destructive inspection method and device using laser plasma radiation electromagnetic wave 审中-公开
标题翻译：使用激光等离子体辐射电磁波的非破坏性检测方法和器件
公开(公告)号：JP2009031237A
公开(公告)日：2009-02-12
申请号：JP2007216481
申请日：2007-07-27
申请人： Laser Gijutsu Sogo Kenkyusho , Osaka Univ , 国立大学法人大阪大学 , 財団法人レーザー技術総合研究所
发明人： TANAKA KAZUO , NAKAJIMA HIROTOMO , SHIMADA YOSHINORI , HASHIMOTO KAZUHISA , YAMAURA MICHITERU , FUJITA MASAYUKI
IPC分类号： G01N22/00 , G01N22/02
摘要： PROBLEM TO BE SOLVED: To provide a method and device to irradiate laser onto an inspection object surface, generate laser plasma, obtain information of radiated electromagnetic waves, and perform a remote non-destructive inspection inside the inspection object or around the irradiation surface.
SOLUTION: A plasma form is desired to be linear, and a required frequency is obtained by setting twice of plasma length to be the wavelength of the electromagnetic waves. The electromagnetic waves with good directivity and a defined frequency band can be irradiated by generating one or a plurality of linear laser plasma on the inspection object surface. An equivalent investigation results can be obtained as in the cases that measurement is made by shifting the generation place of plasma and that measurement is made by performing signal processing and using a large opening antenna with sharp directivity. The non-destructive inspection is performed by generating one or a plurality of plasma channels on the inspection surface, generating electromagnetic waves with directivity, guiding the electromagnetic waves generated on the inspection surface, and analyzing the electromagnetic waves reflected from the inspection object.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供一种在检查对象表面上照射激光的方法和装置，产生激光等离子体，获得辐射电磁波的信息，并在检查对象内或照射周围进行远程无损检查表面。解决方案：等离子体形式希望是线性的，并且通过将等离子体长度设定为电磁波的波长的两倍来获得所需的频率。可以通过在检查对象表面上生成一个或多个线性激光等离子体来照射具有良好方向性和定义的频带的电磁波。通过移动等离子体的产生位置进行测量，并且通过执行信号处理并且使用具有尖锐方向性的大开口天线进行测量，可以获得等效的调查结果。通过在检查面上产生一个或多个等离子体通道，产生具有方向性的电磁波，引导在检查面上产生的电磁波，分析检查对象反射的电磁波，进行非破坏性检查。版权所有（C）2009，JPO＆INPIT

3. 发明专利

JP2009030996A Device for stabilizing interference fringe and non-destructive inspection device using it 有权
标题翻译：用于稳定干扰性的设备和使用其的非破坏性检查设备
公开(公告)号：JP2009030996A
公开(公告)日：2009-02-12
申请号：JP2007192248
申请日：2007-07-24
申请人： Laser Gijutsu Sogo Kenkyusho , 財団法人レーザー技術総合研究所
发明人： SHIMADA YOSHINORI , OLEG KOTIAEV
IPC分类号： G01N29/00 , G01B11/22 , G01N21/00 , G01N21/45 , G01N21/88
摘要： PROBLEM TO BE SOLVED: To provide a device for stabilizing interference fringe capable of stabilizing the interference fringe of reference light with the signal light reflected from an inspection target and modulated in frequency, and a non-destructive inspection device capable of enhancing the detection precision of the internal flow of the inspection target. SOLUTION: The non-destructive inspection device is equipped with a detecting laser 11, an elastic wave exciting laser 21, a vibration detecting means 30 for allowing the signal light to interfere with the reference light to detect the vibration of an inspection target Ob and a device 40 for stabilizing interference fringe. The device 40 is equipped with an interference fringe detecting means 41 for detecting the interference fringe of the correction signal light branched from the signal light with the correction reference light branched from the reference light, a wavefront controlling mirror 42 arranged on the light path of the reference light before the correction reference light is branched to control the wavefront of the reference light, and a control means 43 for controlling the position of the wavefront controlling mirror 42 so as to suppress the phase shift from the stable state of the interference fringe detected by the interference fringe detecting means 41. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于稳定干涉条纹的装置，其能够利用从检查对象反射并被频率调制的信号光稳定参考光的干涉条纹，以及能够增强检测对象的无损检测装置检测目标内部流量的检测精度。解决方案：非破坏性检查装置配备有检测激光器11，弹性波激励激光器21，振动检测装置30，用于允许信号光干涉参考光以检测检查目标的振动 Ob和用于稳定干涉条纹的装置40。装置40配备有干涉条纹检测装置41，用于检测从参考光分支的校正参考光从信号光分支的校正信号光的干涉条纹;布置在基准光的光路上的波前控制反射镜42 在校正参考光被分支之前的参考光被分支以控制参考光的波前;以及控制装置43，用于控制波前控制镜42的位置，以便抑制从由干涉条纹检测装置41.版权所有（C）2009，JPO＆INPIT

4. 发明专利

JP2006085940A Method and device for generating x ray 有权
标题翻译：用于生成X射线的方法和装置
公开(公告)号：JP2006085940A
公开(公告)日：2006-03-30
申请号：JP2004267078
申请日：2004-09-14
申请人： Laser Gijutsu Sogo Kenkyusho , 財団法人レーザー技術総合研究所
发明人： UCHIDA SHIGEAKI , SHIMADA YOSHINORI , YAMAURA MICHITERU , MIYANAGA NORIAKI , NISHIMURA HIROAKI , FUJIOKA SHINSUKE , NORIMATSU TAKAYOSHI , NAGAI KEIJI , NISHIHARA ISANAGA , IZAWA YASUKAZU
IPC分类号： H05G2/00 , G21K5/08 , H05H1/24
摘要： PROBLEM TO BE SOLVED: To provide a method for generating a X ray (including EUV light), whereby generation of debris can be effectively suppressed.
SOLUTION: This method of generating the X ray is provided with a process in which a target separating laser beam 19 is irradiated to a X ray generating target 13 deposited on the surface of a transparent substrate 11 directly or through a laser absorbing layer from the rear surface side of the substrate, the target 13 is thereby separated from the substrate 11, and X ray generating energy 23 is supplied to the separated target 13, in order to generate the X ray.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于产生X射线（包括EUV光）的方法，由此可以有效地抑制碎屑的产生。解决方案：这种产生X射线的方法具有这样的处理，其中靶分离激光束19直接照射到沉积在透明基板11的表面上的X射线产生靶13，或者通过激光吸收层从基板的背面侧将靶13与基板11分离，将X射线产生能23供给到被分离的靶13，以产生X射线。版权所有（C）2006，JPO＆NCIPI

5. 发明专利

JP2007051992A Laser ionization mass spectrometry capable of sorting object molecule, and device 审中-公开
标题翻译：激光离子质谱仪可分配对象分子和器件
公开(公告)号：JP2007051992A
公开(公告)日：2007-03-01
申请号：JP2005259852
申请日：2005-08-12
申请人： Laser Gijutsu Sogo Kenkyusho , 財団法人レーザー技術総合研究所
发明人： SHIMADA YOSHINORI , NAKAJIMA NOBUAKI , YATSUHASHI TOMOYUKI
IPC分类号： G01N27/64 , G01N27/62
摘要： PROBLEM TO BE SOLVED: To reduce an analysis time and cost by reducing a process for removing impurities and a pretreatment process.
SOLUTION: Only an object molecule is excited by irradiating a narrow-band laser having a wavelength coincident with an excitation level of the object molecule. An impurity molecule cannot have the excitation level, because of inconsistency with the excitation level. Thereafter, only the object molecule is ionized by irradiating a femtosecond laser having ionizable intensity of only the excited object molecule, and analyzed by a time-of-flight mass spectrometer.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：通过减少去除杂质和预处理过程的方法来减少分析时间和成本。解决方案：通过照射具有与物体分子的激发水平一致的波长的窄带激光器，仅激发对象分子。杂质分子不能具有激发水平，因为与激发水平不一致。此后，通过照射仅具有可激发物质分子的可离子化强度的飞秒激光，仅通过飞行时间质谱仪分析对象分子。版权所有（C）2007，JPO＆INPIT

6. 发明专利

JP2003305333A Exhaust gas absorbent and exhaust gas treatment device using the same 审中-公开
标题翻译：排气吸收和排气处理装置使用相同
公开(公告)号：JP2003305333A
公开(公告)日：2003-10-28
申请号：JP2002113437
申请日：2002-04-16
申请人： Laser Gijutsu Sogo Kenkyusho , 財団法人レーザー技術総合研究所
发明人： SHIMADA YOSHINORI , IN KOHA , UCHIDA SHIGEAKI , WADA YUJI , YAMANAKA CHIYOE
IPC分类号： B01D53/60 , B01D53/34 , B01D53/74 , B01D53/77 , B01J20/04
CPC分类号： Y02A50/2344
摘要： PROBLEM TO BE SOLVED: To obtain an exhaust gas absorbent which can remarkably improve the absorption efficiency by utilizing the properties of a porous material having a large specific surface area as a means for absorbing and removing hazardous components such as nitrogen oxides NOx contained in exhaust gas, and which has combinedly has the properties as a solution absorbent. SOLUTION: A porous material of an adsorptive material having micropores 2 is used as the exhaust gas absorbent 1. Liquid parts 3 in which an alkaline substance such as sodium hydroxide is dissolved are carried on the surface of the material part 1a of the gas absorbent 1 so as to have each angstrom or micrometer thickness and size. When the exhaust gas passes through the inside of the pores 2, the hazardous components are taken into the liquid parts 3 by chemical reactions to be removed. COPYRIGHT: (C)2004,JPO
摘要翻译：要解决的问题：为了获得可以通过利用具有大比表面积的多孔材料的性质来显着提高吸收效率的废气吸收剂作为用于吸收和去除诸如氮氧化物的有害成分的装置在废气中，并且其具有作为溶液吸收剂的性质。解决方案：使用具有微孔2的吸附材料的多孔材料作为废气吸收剂1.其中溶解有碱性物质如氢氧化钠的液体部分3被承载在材料部分1a的表面上气体吸收剂1，以便具有每埃埃或厚度的厚度和尺寸。当废气通过孔2的内部时，有害成分通过化学反应被吸入液体部分3中以除去。版权所有（C）2004，JPO

7. 发明专利

JP2008044086A Cutting method and device, and substrate cut by the cutting method 审中-公开
标题翻译：切割方法和装置，以及通过切割方法切割的基板
公开(公告)号：JP2008044086A
公开(公告)日：2008-02-28
申请号：JP2006223700
申请日：2006-08-19
申请人： Fujiwara Denshi Kogyo:Kk , Laser Gijutsu Sogo Kenkyusho , 有限会社藤原電子工業 , 財団法人レーザー技術総合研究所
发明人： FUJIWARA YOSHIHARU , SHIMADA YOSHINORI , OLEG KOTIAEV , MOTOKOSHI SHINJI
IPC分类号： B23B1/00 , B23B37/00 , B23C3/00 , B23C9/00 , B23Q11/10 , B26D7/08 , B26F1/16 , B26F1/26 , B28D5/00 , H05K3/00
摘要： PROBLEM TO BE SOLVED: To provide a cutting method capable of improving cutting speed and cutting quality during execution of various cutting procedures.
SOLUTION: The cutting method and a cutting device can improve cutting efficiency by applying ultrasonic vibrations to a cutting tool of a machine tool such as a router machining device. An ultrasonic vibration applying means is implemented by laser beams which are applied to the cutting tool at a suitable location, to thereby apply ultrasonic vibrations to the cutting tool 12. The cutting tool 12 is implemented by an axially rotational cutting tool having cutting blades arranged at a front end and on a peripheral surface thereof. The cutting tool has laser beam applying means 3 for applying laser beams from outside the cutting tool 12 in four directions orthogonal to an axial direction of the cutting tool (so as to set central angles at 90 degrees). Thus by successively irradiating the cutting tool circumferentially in four directions by shifting irradiation starting timing at predetermined time intervals, circumferential ultrasonic vibration occurs at the cutting tool 12. Further the cutting device has a cooling air spraying means 5 arranged at a cutting portion or in the vicinity of the same, for spraying cooling air.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够在执行各种切割过程期间提高切割速度和切割质量的切割方法。解决方案：切割方法和切割装置可以通过对诸如路由器加工装置的机床的切削工具施加超声波振动来提高切割效率。超声波振动施加装置由在合适位置施加到切割工具的激光束实现，从而对切割工具12施加超声波振动。切割工具12由具有切割刀片的轴向旋转切割工具前端和其外周表面。切割工具具有激光束施加装置3，用于在与切割工具的轴向正交的四个方向上施加来自切割工具12的外侧的激光束（从而将中心角度设定为90度）。因此，通过以规定的时间间隔移动照射开始时刻，通过在四个方向上周向地照射切削工具，在切削工具12发生周向的超声波振动。此外，切断装置具有设置在切割部或切割部附近，用于喷洒冷却空气。版权所有（C）2008，JPO＆INPIT

8. 发明专利

JP2003001064A Method and apparatus for reduction of harmful material 审中-公开
标题翻译：减少有害材料的方法和装置
公开(公告)号：JP2003001064A
公开(公告)日：2003-01-07
申请号：JP2001185283
申请日：2001-06-19
申请人： Laser Gijutsu Sogo Kenkyusho , 財団法人レーザー技術総合研究所
发明人： SHIMADA YOSHINORI , UCHIDA SHIGEAKI , YAMANAKA CHIYOE
IPC分类号： A62D3/176 , A62D3/19 , A62D3/34 , A62D3/37 , A62D101/22 , A62D101/28 , B01D53/34 , B01D53/70 , B01J19/08 , B01J35/02 , B09C1/02 , B09C1/08 , C07B35/06 , F01N3/02 , F01N3/08 , F23J15/00 , A62D3/00
摘要： PROBLEM TO BE SOLVED: To provide a method and an apparatus by which harmful materials in an exhaust gas is not only decomposed by discharge plasma, but also reduced by using the strong reduction force of hydrogen produced by ultraviolet rays from the discharge plasma at a low cost to treat the exhaust gas containing the harmful materials.
SOLUTION: The apparatus A for reduction of harmful materials is constituted so that the harmful materials are reduced with hydrogen and electron in the reaction zone by connecting an exhaust pipe 2 to a casing 1, providing a high voltage electrode on one side of the casing 1 and a hydrogen producing means 4 on opposite side to face each other, generating discharge plasma by the discharge in the high voltage electrode, irradiating the hydrogen producing means 4 with ultraviolet rays from the discharge plasma, providing a semiconductor electrode 41 and a metallic electrode 42 with a gel material 45 in the hydrogen producing means to be in contact with an electrolyte vessel and absorbing the ultraviolet ray in the semiconductor electrode to release hydrogen from the metallic electrode 42 side.
COPYRIGHT: (C)2003,JPO
摘要翻译：要解决的问题：提供排气中的有害物质不仅通过排放等离子体分解的方法和装置，而且还通过使用来自放电等离子体的低的紫外线产生的氢的强的还原力而降低处理含有有害物质的废气的成本。解决方案：用于减少有害物质的装置A构成为：通过将排气管2连接到壳体1上，在反应区中用有害物质和电子减少，在外壳1的一侧设置高压电极以及在相对面相对的氢产生装置4，通过高压电极中的放电产生放电等离子体，用来自放电等离子体的紫外线照射氢产生装置4，提供半导体电极41和金属电极42 在氢产生装置中的凝胶材料45与电解质容器接触并吸收半导体电极中的紫外线以从金属电极42侧释放氢。

9. 发明专利

JP2012230053A Crack depth measuring device and measuring method 有权
标题翻译：破裂深度测量装置和测量方法
公开(公告)号：JP2012230053A
公开(公告)日：2012-11-22
申请号：JP2011099533
申请日：2011-04-27
申请人： Institute For Laser Technology , 公益財団法人レーザー技術総合研究所 , Kansai Electric Power Co Inc:The , 関西電力株式会社
发明人： SHIMADA YOSHINORI , OLEG KOTIAEV , KONO YUKIHIKO
IPC分类号： G01B17/00 , G01N21/88 , G01N29/00
摘要： PROBLEM TO BE SOLVED: To accurately measure crack depth regardless of the depth of the crack.SOLUTION: A crack depth measuring device comprises: a heating laser unit 1 for heating a surface of a structure S in an exposing manner; a first detecting laser unit 2 for detecting an elastic wave, which occurs at the structure S, at a detection position at a predetermined distance from a position for heating by exposure; a second detecting laser unit 3 for measuring signal intensity of a reference signal 9 when the elastic wave is transmitted from the position for heating by exposure to the position at the predetermined distance through a section without a crack C; and an arithmetic unit 10 for deriving crack depth from results of the detection by the both detecting laser units 2 and 3. The arithmetic unit 10 derives the crack depth from a time difference Δt between a measurement signal 8 detected by the both detecting laser units 2 and 3 and a reference signal 9 or from a signal decay ratio r. Since the derivation is executed on the basis of different parameters as above, the reliability of the derived value is improved.
摘要翻译：要解决的问题：无论裂纹深度如何，都能精确测量裂纹深度。解决方案：裂纹深度测量装置包括：用于以曝光方式加热结构S的表面的加热激光单元1; 第一检测激光单元2，用于检测在结构S处发生的弹性波，在距曝光加热位置预定距离处的检测位置处; 第二检测激光单元3，用于当通过没有裂纹C的部分通过暴露于预定距离的位置从加热位置传播弹性波时，测量参考信号9的信号强度; 以及用于通过两个检测激光单元2和3从检测结果导出裂纹深度的运算单元10.运算单元10从由两个检测激光单元2检测的测量信号8之间的时间差Δt导出裂纹深度参考信号9或信号衰减比r。由于根据如上所述的不同参数执行导出，所以导出值的可靠性得到改善。版权所有（C）2013，JPO＆INPIT

10. 发明专利

JP2013092497A Crack detecting method and crack detector 审中-公开
标题翻译：裂纹检测方法和裂纹检测器
公开(公告)号：JP2013092497A
公开(公告)日：2013-05-16
申请号：JP2011235901
申请日：2011-10-27
申请人： Institute For Laser Technology , 公益財団法人レーザー技術総合研究所 , Kansai Electric Power Co Inc:The , 関西電力株式会社
发明人： SHIMADA YOSHINORI , OLEG KOTIAEV , KONO YUKIHIKO
IPC分类号： G01B11/30 , E21D11/00 , G01N21/88
摘要： PROBLEM TO BE SOLVED: To improve detection sensitivity in a crack detecting method based on measuring a light and dark speckle pattern which changes with time.SOLUTION: Signal light 2 phase modulated by reflection on the surface of an inspection object M, and reference light 3 not phase modulated on the surface of the inspection object M are interfere, generating dynamic hologram in a photorefractive crystal 4, by which the reference light 3 is diffracted. The diffracted reference light 3 is received by a multichannel detector 6 having a plurality of detecting channels 5. Among the plurality of detecting channels 5, the detecting channel 5 which detects the n's (n is predetermined number) highest light intensity is discriminated with a discriminator 7. The light intensity at the discriminated detecting channel 5 is integrated by a multiplexer 8 to eliminate noise. The noise elimination make it possible to clearly find phase modulation thereby detecting deep cracks at high sensitivity.
摘要翻译：要解决的问题：基于测量随时间变化的亮和暗斑纹图案的裂纹检测方法来提高检测灵敏度。解决方案：在检查对象M的表面上通过反射调制的信号光2以及在检查对象M的表面上未相位调制的参考光3相互干扰，在光折射晶体4中产生动态全息图，由此参考光3被衍射。衍射参考光3由具有多个检测通道5的多通道检测器6接收。在多个检测通道5中，用鉴别器鉴别检测n（n是预定数）最高光强度的检测通道5 鉴别检测通道5的光强由多路复用器8集成以消除噪声。噪声消除使得可以清楚地发现相位调制，从而以高灵敏度检测深裂纹。版权所有（C）2013，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式