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    • 4. 发明授权
    • Nanometer-scale sharpening of conductor tips
    • 导体尖端的纳米级锐化
    • US08070920B2
    • 2011-12-06
    • US11740678
    • 2007-04-26
    • Joseph W. LydingScott W. Schmucker
    • Joseph W. LydingScott W. Schmucker
    • C23C14/34
    • G01Q70/16C23F4/00
    • The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.
    • 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属线,金属导线尖端与导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。
    • 5. 发明申请
    • NANOMETER-SCALE SHARPENING OF CONDUCTOR TIPS
    • 导体提示的NANOMETER-SCALE SHARPENING
    • US20080105539A1
    • 2008-05-08
    • US11740678
    • 2007-04-26
    • Joseph W. LydingScott W. Schmucker
    • Joseph W. LydingScott W. Schmucker
    • C23C14/46
    • G01Q70/16C23F4/00
    • The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.
    • 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属线,金属导线尖端与导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。
    • 6. 发明授权
    • Nanometer-scale sharpening of conductor tips
    • 导体尖端的纳米级锐化
    • US08819861B2
    • 2014-08-26
    • US13292714
    • 2011-11-09
    • Joseph W. LydingScott W. Schmucker
    • Joseph W. LydingScott W. Schmucker
    • G01Q70/16
    • G01Q70/16C23F4/00
    • The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires and semiconductors in other forms.
    • 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属丝,金属丝,其具有导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。
    • 9. 发明申请
    • ASYMMETRIC MAGNETIC FIELD NANOSTRUCTURE SEPARATION METHOD, DEVICE AND SYSTEM
    • 非对称磁场纳米结构分离方法,器件和系统
    • US20140166545A1
    • 2014-06-19
    • US14004364
    • 2012-03-16
    • Joseph W. LydingCharishma Puliyanda SubbaiahJoshua D. Wood
    • Joseph W. LydingCharishma Puliyanda SubbaiahJoshua D. Wood
    • B03C1/023
    • B03C1/023B01J19/12B03C1/0335B03C1/288B03C2201/18
    • A preferred method of the invention separates metallic or charged nanostructures in solution. In preferred embodiments, metal and semiconducting nanostructures are separated in solution with use of a net Lorentz force applied to metallic or conductive nanostructures. In other embodiments, charged nanostructures are separated from other nanostructures in solution. The charge can be applied to semiconducting or insulating nanostructures of a predetermined size by application of appropriate radiation. The method is conducted on dispersed nanostructures suspended in solution in a vessel. The net Lorentz force to metallic, conductive or charged nanostructures within the solution moves the metallic, conductive or charged nanostructures toward a common volume in a portion of the vessel. Extraction of the common volume provides solution with a high ratio of the metallic, conductive or charged nanostructures. The solution left behind has a high ratio of semiconducting or insulating nanostructures. That solution can also be recovered.
    • 本发明优选的方法在溶液中分离金属或带电的纳米结构。 在优选的实施方案中,使用施加到金属或导电纳米结构的净洛伦兹力,在溶液中分离金属和半导体纳米结构。 在其它实施方案中,电荷纳米结构与溶液中的其它纳米结构物分离。 可以通过施加适当的辐射将电荷施加到预定尺寸的半导体或绝缘纳米结构。 该方法在悬浮在容器中的溶液中的分散的纳米结构上进行。 在溶液内的金属,导电或带电的纳米结构的净洛伦兹力将金属,导电或带电的纳米结构朝着容器的一部分中的共同体积移动。 共同体积的提取提供具有高比例的金属,导电或带电的纳米结构的溶液。 留下的解决方案具有高比例的半导体或绝缘纳米结构。 该解决方案也可以恢复。