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1. 发明申请

WO2011037327A3 SCANNING MICROMIRROR 审中-公开
标题翻译：扫描微型计算机
公开(公告)号：WO2011037327A3
公开(公告)日：2011-06-30
申请号：PCT/KR2010005749
申请日：2010-08-26
申请人： LG ELECTRONICS INC , CHOI DONG JUNE , LEE BYUNG GOO , KIM TAE SIK , LIM TAE SUN
发明人： CHOI DONG JUNE , LEE BYUNG GOO , KIM TAE SIK , LIM TAE SUN
IPC分类号： G02B26/08 , G02B26/10
CPC分类号： G02B26/0841 , G02B26/105
摘要： The present invention relates to a scanning micromirror which forms images or reads data by scanning beams outputted from a light source onto a one-dimensional area or two-dimensional area. The scanning micromirror comprises: a substrate having an open area; a mirror plate positioned in the open area; a first gimbal having a first bent portion which is positioned in an open area between the substrate and the mirror plate and is bent in the mirror plate direction along the X-axis of the open area; a second gimbal having a second bent portion which is positioned in the open area between the first gimbal and the mirror plate and is formed along the first bent portion of the first gimbal; a first elastic body for connecting the substrate with the first bent portion of the first gimbal; a second elastic body for connecting the first gimbal with the second gimbal along the Y-axis of the open area; and a third elastic body for connecting the second gimbal with the mirror plate along the Y-axis of the open area.
摘要翻译：本发明涉及通过将从光源输出的光束扫描到一维区域或二维区域来形成图像或读取数据的扫描微镜。扫描微镜包括：具有开放区域的基板; 位于开放区域的镜板; 第一万向架具有第一弯曲部分，其位于基板和反射镜板之间的开放区域中，并沿着开放区域的X轴在镜板方向上弯曲; 具有第二弯曲部分的第二万向架，所述第二弯曲部分位于所述第一万向架和所述反射镜板之间的所述开放区域中并沿着所述第一万向架的所述第一弯曲部分形成; 第一弹性体，用于将基板与第一万向架的第一弯曲部分连接; 第二弹性体，用于沿着所述开放区域的Y轴连接所述第一万向架与所述第二万向架; 以及第三弹性体，用于沿着开放区域的Y轴将第二万向架与镜板连接。

2. 发明公开

KR20070106163A SENSOR FOR USE IN MEASURING VOLTAGE AND APPARATUS FOR MEASURING VOLTAGE USING THE SAME 无效
标题翻译：用于测量电压的传感器和用于测量电压的装置
公开(公告)号：KR20070106163A
公开(公告)日：2007-11-01
申请号：KR20060038722
申请日：2006-04-28
申请人： LG ELECTRONICS INC
发明人： LEE SEUNG MIN , CHOI DONG JUNE , LEE BYUNG GOO
IPC分类号： G01R19/165
CPC分类号： G01R19/0023 , G01R19/0084 , H01L41/047
摘要： A sensor for detecting a voltage and a voltage detection device using the same are provided to improve an insulation property and current consumption efficiency by detecting the voltage using a piezoelectric element having high insulating resistance. A sensor for detecting a voltage comprises followings. A pair of input electrodes are formed at the upper and lower portions of a piezoelectric unit(110c). A housing fixes a side portion of the piezoelectric unit, and a pair of housing electrodes(120a,120b) are formed within the housing. And the housing electrodes are connected to the input electrodes electrically. A pair of detecting electrodes(130a,130b) are formed at the other side of the piezoelectric unit and the housing.
摘要翻译：提供一种用于检测电压的传感器和使用该传感器的电压检测装置，以通过使用具有高绝缘电阻的压电元件检测电压来提高绝缘性能和电流消耗效率。用于检测电压的传感器包括以下。一对输入电极形成在压电单元（110c）的上部和下部。壳体固定压电单元的侧部，并且在壳体内形成一对壳体电极（120a，120b）。并且壳体电极电连接到输入电极。一对检测电极（130a，130b）形成在压电单元和壳体的另一侧。

3. 发明公开

KR20070075632A APPARATUS FOR TESTING CHARACTER OF THIN FILM MATERIAL AND METHOD FOR ALIGNING POSITION 审中-公开
标题翻译：用于测试薄膜材料的特征的装置和用于对准位置的方法
公开(公告)号：KR20070075632A
公开(公告)日：2007-07-24
申请号：KR20060004125
申请日：2006-01-13
申请人： LG ELECTRONICS INC
发明人： CHOI DONG JUNE , KWON HYOUK
IPC分类号： G01N21/956
摘要： An apparatus for testing properties of a thin film material and a position aligning method are provided to estimate mechanical and electric properties of the thin film material by efficiently performing a contact operation through a shape design of a tip tool. An apparatus for testing properties of a thin film material includes a position determining unit and a driver. The position determining unit includes a plurality of fixing portions(110a,110b,100c), a base plate(120), and a plurality of detection sensors(130a,130c). The base plate is connected to the fixing portions by respective elastic members. The plurality of detection sensors is any one of a gap sensor, a strain gauge, or an LVDT. The detection sensors are positioned at a lower portion of the elastic member. The elastic members are arranged at an interval of 120 degrees. The apparatus for testing properties of a thin film material further includes a driving unit, a probe unit(140), and a controller. The controller includes an amplifier.
摘要翻译：提供一种用于测试薄膜材料的性能的设备和位置对准方法，以通过尖端工具的形状设计有效地执行接触操作来估计薄膜材料的机械和电学性能。用于测试薄膜材料性能的装置包括位置确定单元和驱动器。位置确定单元包括多个固定部分（110a，110b，100c），基板（120）和多个检测传感器（130a，130c）。基板通过相应的弹性构件连接到固定部。多个检测传感器是间隙传感器，应变计或LVDT中的任一个。检测传感器位于弹性部件的下部。弹性部件以120度的间隔配置。用于测试薄膜材料性能的装置还包括驱动单元，探针单元（140）和控制器。控制器包括放大器。

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