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1. 发明申请

US20090260451A1 FATIGUE TEST APPARATUS FOR THIN ELEMENT OF ELECTRONIC DEVICE 失效
标题翻译：电子设备薄膜疲劳试验装置
公开(公告)号：US20090260451A1
公开(公告)日：2009-10-22
申请号：US12417764
申请日：2009-04-03
申请人： LEI LI , PING CHEN , ZHI-QIANG JIANG , CHUN-YING WANG , XUE-LIANG ZHAI , LI-PING HUANG , ZHI CHENG , CHANG-FA SUN , XIAN-CUI DU
发明人： LEI LI , PING CHEN , ZHI-QIANG JIANG , CHUN-YING WANG , XUE-LIANG ZHAI , LI-PING HUANG , ZHI CHENG , CHANG-FA SUN , XIAN-CUI DU
IPC分类号： G01N3/20
CPC分类号： G01N3/32 , G01M99/005 , G01N2033/0078 , G01N2203/0073 , G01N2203/028
摘要： A fatigue test apparatus for thin workpiece includes a supporting module, a driving mechanism, a first connecting module, a second connecting module, a first holding post, a second holding post and a computer system. The first and second connecting modules are respectively fixed to two sides of the supporting module. Ends of the first holding post and the second holding post are fixed to the first and second connecting modules. The computer system electronically connects with and controls the driving mechanism. The first holding post and the second holding post are drive to rotate by the driving mechanism.
摘要翻译：用于薄工件的疲劳试验装置包括支撑模块，驱动机构，第一连接模块，第二连接模块，第一保持柱，第二保持柱和计算机系统。第一和第二连接模块分别固定在支撑模块的两侧。第一保持柱和第二保持柱的端部固定到第一和第二连接模块。计算机系统与驱动机构电连接并控制。第一保持柱和第二保持柱由驱动机构驱动旋转。

2. 发明申请

US20090292498A1 RESISTANCE TESTING DEVICE 审中-公开
标题翻译：电阻测试装置
公开(公告)号：US20090292498A1
公开(公告)日：2009-11-26
申请号：US12467379
申请日：2009-05-18
申请人： LEI LI , LIN-SEN DONG , ZHI-QIANG JIANG , PING CHEN , ZHI CHENG , CHANG-FA SUN , CHUAN-KANG TAN , LIN LI , CHUN-YING WANG
发明人： LEI LI , LIN-SEN DONG , ZHI-QIANG JIANG , PING CHEN , ZHI CHENG , CHANG-FA SUN , CHUAN-KANG TAN , LIN LI , CHUN-YING WANG
IPC分类号： G01R27/14
CPC分类号： G01R27/02
摘要： A resistance testing device detects resistances between testing points of an electronic element. The resistance testing device includes controls accepting input of data to the resistance testing device, a relay module, a multimeter, testing probes electrically connected to the relay module, a testing platform including a base and a probe mounting board, a driving assembly mounted on the base and moving the probe mounting board relative to the electronic device, a display, and a central processing assembly mounted within the base. The relay module controls the testing probes and implements the multimeter to detect resistances between the testing points. The base seats the electronic element, the probe mounting board fixes the testing probes, and the probe mounting board is adjustably mounted above the base. The central processing assembly includes a central processing unit. The central processing unit is respectively and electronically connected to the controls, driving assembly, display and the relay module. The central processing unit provides input of data and implements the driving assembly, display, relay module and the multimeter, and analyzes testing results, and the display shows input data and testing results.
摘要翻译：电阻测试装置检测电子元件的测试点之间的电阻。电阻测试装置包括接受数据输入到电阻测试装置的控制器，继电器模块，万用表，电连接到继电器模块的测试探针，包括基座和探针安装板的测试平台，安装在并且相对于电子设备移动探针安装板，显示器和安装在基座内的中央处理组件。继电器模块控制测试探头并实现万用表以检测测试点之间的电阻。基座安装电子元件，探头安装板固定测试探头，探头安装板可调节地安装在基座上方。中央处理组件包括中央处理单元。中央处理单元分别电连接到控制器，驱动组件，显示器和继电器模块。中央处理单元提供数据输入，实现驱动组件，显示，继电器模块和万用表，分析测试结果，显示输入数据和测试结果。

3. 发明申请

US20080184825A1 KEY TESTING APPARATUS 有权
标题翻译：主要测试设备
公开(公告)号：US20080184825A1
公开(公告)日：2008-08-07
申请号：US11945520
申请日：2007-11-27
申请人： LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , XUE-LIANG ZHAI , CHANG-FA SUN , YONG-ZHI TAO
发明人： LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , XUE-LIANG ZHAI , CHANG-FA SUN , YONG-ZHI TAO
IPC分类号： G01M19/00
CPC分类号： G01M99/008
摘要： A key testing apparatus (100) is provided. The key testing apparatus includes a base (11) and an actuator (12). The actuator includes a testing member (17) and a mounting member (18). The mounting member includes at least one base board (181) fixed to the base, a lower board (182), a mounting board (183), and a mounting sheet (185). The lower board is adjustably attached to the base board. The mounting board is adjustably attached to the lower board. The mounting sheet is adjustably attached to the mounting board. The clamping device includes a base desk (131), a clamping platform (132), at least one first clamping board (133) and second clamping board (134). The base desk is adjustably attached to the base. The clamping platform, at least one first clamping board, and at least one second clamping board are adjustably attached to the base desk.
摘要翻译：提供了一种密钥测试装置（100）。钥匙测试装置包括基座（11）和致动器（12）。致动器包括测试构件（17）和安装构件（18）。安装构件包括固定到基座的至少一个基板（181），下板（182），安装板（183）和安装板（185）。下板可调节地连接到基板。安装板可调节地连接到下板。安装板可调节地附接到安装板。夹持装置包括底座（131），夹紧平台（132），至少一个第一夹紧板（133）和第二夹紧板（134）。底座可调节地连接到底座。夹紧平台，至少一个第一夹紧板和至少一个第二夹紧板可调节地附接到底座。

4. 发明申请

US20080169595A1 FLEXIBLE FIXING SYSTEM FOR PRODUCT TESTING 有权
标题翻译：柔性固定系统，用于产品测试
公开(公告)号：US20080169595A1
公开(公告)日：2008-07-17
申请号：US11752908
申请日：2007-05-23
申请人： LEI LI , PING CHEN , ZHI CHENG , XUE-LIANG ZHAI , CHANG-FA SUN , LIN-SEN DONG
发明人： LEI LI , PING CHEN , ZHI CHENG , XUE-LIANG ZHAI , CHANG-FA SUN , LIN-SEN DONG
IPC分类号： B25B11/00
CPC分类号： B25B5/00 , B25B5/003 , B25B5/06 , B25B5/16
摘要： A flexible/adjustable fixing system (100) for fixing a workpiece (40) includes an information management module (10), a plurality of driving devices (20), and a positioning device (30). The information management module receives and processes the position information of the workpiece. The driving devices electronically couple with the information management module. The positioning device includes a platform (31) and a plurality of positioning pins (32). One end of the workpiece is positioned in a certain area of the platform. Each respective pin is attached to a corresponding driving device. When the driving device receives an order/signal from the information management module, the positioning pin is selectably driven relative to (e.g., toward, away from) the workpiece by the driving device.
摘要翻译：一种用于固定工件（40）的柔性/可调节固定系统（100）包括信息管理模块（10），多个驱动装置（20）和定位装置（30）。信息管理模块接收并处理工件的位置信息。驱动装置与信息管理模块电子耦合。定位装置包括平台（31）和多个定位销（32）。工件的一端位于平台的某一区域。每个相应的销连接到相应的驱动装置。当驱动装置从信息管理模块接收到订单/信号时，通过驱动装置相对于（例如，朝向，远离）工件可选择地驱动定位销。

5. 发明申请

US20080173110A1 TESTING SYSTEM FOR FLIP-TYPE ELECTRONIC DEVICE 失效
标题翻译：用于浮动型电子设备的测试系统
公开(公告)号：US20080173110A1
公开(公告)日：2008-07-24
申请号：US11865629
申请日：2007-10-01
申请人： LEI LI , PING CHEN , ZHI CHENG , XUE-LIANG ZHAI , MING-FENG LI , CHANG-FA SUN , DONG LI , YONG-ZHI TAO
发明人： LEI LI , PING CHEN , ZHI CHENG , XUE-LIANG ZHAI , MING-FENG LI , CHANG-FA SUN , DONG LI , YONG-ZHI TAO
IPC分类号： G01N19/00
CPC分类号： G01M99/005
摘要： A testing system (100) is used to test a flip-type electronic device (80). The electronic device includes a cover (802) and a main body (801). A hinge (803) connects with the cover and the main body. The testing system includes a base (10), a plummer (20), a flipping device (30) and a control device (40). The plummer is fixed on the base for locking the electronic device. The flipping device is fixed on the base for opening and closing the cover of the electronic device. The control device includes an optical fiber sensor (42) for sensing the movement of the cover of the electronic device. The control device connects with the flipping device so as to control the flipping device.
摘要翻译：测试系统（100）用于测试翻盖型电子设备（80）。电子设备包括盖（802）和主体（801）。铰链（803）与盖和主体连接。所述测试系统包括基座（10），直立器（20），翻转装置（30）和控制装置（40）。直立式固定在基座上用于锁定电子设备。翻转装置固定在基座上，用于打开和关闭电子装置的盖。控制装置包括用于感测电子设备的盖的移动的光纤传感器（42）。控制装置与翻转装置连接，以控制翻转装置。

6. 发明申请

US20070294899A1 TESTING MECHANISM FOR CASINGS 失效
标题翻译：测试机制
公开(公告)号：US20070294899A1
公开(公告)日：2007-12-27
申请号：US11682764
申请日：2007-03-06
申请人： LEI LI , PING CHEN , WEN-QUAN XU , ZHI CHENG , CHANG-FA SUN , XUE-LIANG ZHAI , LIN-SEN DONG
发明人： LEI LI , PING CHEN , WEN-QUAN XU , ZHI CHENG , CHANG-FA SUN , XUE-LIANG ZHAI , LIN-SEN DONG
IPC分类号： G01B5/14
CPC分类号： G01B11/0691
摘要： An exemplary testing mechanism (100) is used for testing for a sufficiency of a casing 90. The testing mechanism includes a framework (20) and a testing module (40). The framework includes a base board (21) and a pillar (26). One end of the pillar is mounted on the base board. The testing module includes a main board (42) and at least one testing pin (44). The main board is slidably mounted on the pillar. A bottom end of the testing pin is slidably mounted to the main board. A top end of the testing pin is positioned adjacent to the base board of the framework. The at least one testing pin is located in a position corresponding to at least one mounting hole of a sufficient casing.
摘要翻译：示例性的测试机构（100）用于测试壳体90的充足性。测试机构包括框架（20）和测试模块（40）。框架包括基板（21）和支柱（26）。支柱的一端安装在基板上。测试模块包括主板（42）和至少一个测试引脚（44）。主板可滑动地安装在支柱上。测试销的底端可滑动地安装在主板上。测试销的顶端定位成与框架的基板相邻。所述至少一个测试销位于对应于足够壳体的至少一个安装孔的位置。

7. 发明申请

US20070240322A1 TESTING SYSTEM FOR FLATNESS AND PARALLELISM 失效
标题翻译：平面和平行测试系统
公开(公告)号：US20070240322A1
公开(公告)日：2007-10-18
申请号：US11615896
申请日：2006-12-22
申请人： LEI LI , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
发明人： LEI LI , Zhi Cheng , Ping Chen , Ai-Ge Sun , Xue-Liang Zhai , Chang-Fa Sun
IPC分类号： G01B5/25
CPC分类号： G01B5/207 , G01B5/25 , G01B5/285
摘要： A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.
摘要翻译：用于测试工件表面的平整度的测试系统包括测试装置（10）和处理器（20）。测试装置包括测试箱（12）和测量装置（14）。测试箱包括多个保持器（122）; 支架定义基准平面。测量装置包括从测试箱延伸出来的多个可动测试极（142）和多个量测器（141），其被配置用于测量测试极回缩到测试箱中的距离。远离测试箱的测试极的端部（1421）位于基准平面上并且被配置为支撑其上的工件的表面，以允许测量仪在工件的压力下测量测试极的回缩距离。测试极的回缩距离等于工件表面和基准平面上的测试点之间的距离。处理器连接到测试装置，用于接收和处理从由量规测量的测试极的回缩距离转换的测试数据。

8. 发明申请

US20080168849A1 TESTING DEVICES FOR MULTIHOLE WORKPIECE 有权
标题翻译：多工作的测试设备
公开(公告)号：US20080168849A1
公开(公告)日：2008-07-17
申请号：US11926495
申请日：2007-10-29
申请人： LEI LI , PING CHEN , ZHI CHENG , AI-GE SUN , LIN-SEN DONG , CHANG-FA SUN
发明人： LEI LI , PING CHEN , ZHI CHENG , AI-GE SUN , LIN-SEN DONG , CHANG-FA SUN
IPC分类号： G01M19/00
CPC分类号： B23Q15/22
摘要： A testing device (100) configured for testing a multihole workpiece (10) with a plurality of holes (12), includes a detecting station (120) and an inspecting box (140). The detecting station positions a plurality of detecting pins (124) and a plurality of detecting apparatus (128). The detecting pins correspond to the holes of the multihole workpiece. The detecting apparatus respond for the multihole workpiece and sending detecting signals. The inspecting box receives the detecting signals from the detecting apparatus of the detecting station, and deals with and shows detecting results.
摘要翻译：一种被配置为用多个孔（12）测试多孔工件（10）的测试装置（100），包括检测站（120）和检查箱（140）。检测站定位多个检测引脚（124）和多个检测装置（128）。检测销对应于多孔工件的孔。检测装置响应多孔工件并发送检测信号。检查箱从检测站的检测装置接收检测信号，处理并显示检测结果。

9. 发明申请

US20080155846A1 MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME 有权
标题翻译：基于微机的测量系统及其使用方法
公开(公告)号：US20080155846A1
公开(公告)日：2008-07-03
申请号：US11945512
申请日：2007-11-27
申请人： LEI LI , ZHI CHENG , PING CHEN , JI-WEN YANG , LIN-SEN DONG , CHANG-FA SUN
发明人： LEI LI , ZHI CHENG , PING CHEN , JI-WEN YANG , LIN-SEN DONG , CHANG-FA SUN
IPC分类号： G01B5/20
CPC分类号： G01B5/285 , G01B3/22
摘要： A measuring system (100) for flatness degree measurement includes a measuring instrument (10) and a processing device (20). The measuring instrument has a base (12), a guide column (14), a sliding member (16), a digital micrometer (18) and a holding member (19). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece (40) and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.
摘要翻译：用于平坦度测量的测量系统（100）包括测量仪器（10）和处理设备（20）。测量仪器具有底座（12），导柱（14），滑动构件（16），数字测微器（18）和保持构件（19）。引导柱垂直连接到基座。滑动构件可移动地附接到导向柱。数字测微计牢固地固定在滑动构件上。保持构件用于固定工件（40）并具有形成在其上的基准标准表面。处理装置与数字千分尺电子连接。处理装置从数字千分尺接收多个测量值，并在处理测量值之后显示测试结果。

10. 发明申请

US20080203637A1 CLAMPING DEVICE FOR PORTABLE ELECTRONIC DEVICE 审中-公开
标题翻译：便携式电子设备钳位装置
公开(公告)号：US20080203637A1
公开(公告)日：2008-08-28
申请号：US11840552
申请日：2007-08-17
申请人： LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , LIN-SEN DONG , YONG-ZHI TAO , CHANG-FA SUN
发明人： LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , LIN-SEN DONG , YONG-ZHI TAO , CHANG-FA SUN
IPC分类号： B23Q1/25
CPC分类号： B25B1/103 , B25B1/2484 , B25B5/10 , Y10T24/44017 , Y10T29/53961
摘要： A clamping device (100) for clamping a portable electronic device is provided. The clamping device includes a mounting board (12) and a clamping mechanism (14). The clamping mechanism includes at least one adjusting member (141), at least one sliding block (145), and a sliding rail (146). The sliding rail is selectively attached to the mounting board, either horizontally or vertically. Each respective sliding block is slidably mounted to the sliding rail. Each adjusting member respectively engages with a corresponding sliding block and is configured to drive the corresponding sliding block to move along the sliding rail.
摘要翻译：提供一种用于夹持便携式电子设备的夹持装置（100）。夹紧装置包括安装板（12）和夹紧机构（14）。夹紧机构包括至少一个调节构件（141），至少一个滑块（145）和滑轨（146）。滑轨选择性地连接到安装板，水平或垂直。每个滑动块可滑动地安装在滑轨上。每个调节构件分别与相应的滑动块接合并且构造成驱动相应的滑动块沿着滑轨移动。

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