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1. 发明授权

US06857090B2 System and method for automatically analyzing and managing loss factors in test process of semiconductor integrated circuit devices 有权
标题翻译：半导体集成电路器件测试过程中自动分析和管理损耗因子的系统和方法
公开(公告)号：US06857090B2
公开(公告)日：2005-02-15
申请号：US09971934
申请日：2001-10-09
申请人： Kyu Sung Lee , Ae Yong Chung , Sung Ok Kim
发明人： Kyu Sung Lee , Ae Yong Chung , Sung Ok Kim
IPC分类号： G01R31/26 , G01R31/28 , G06F17/00 , H03K19/03
CPC分类号： G01R31/2834 , G11C2029/5606
摘要： A system and method automatically analyzes and manages loss factor data of test processes in which a great number of IC devices are tested as a lot with a number of testers. The lot contains a predetermined number of identical IC devices, and the lot test process is performed sequentially according to a predetermined number of test cycles. The system include a means for verifying test results for each of the test cycles and for determining whether or not a re-test is to be performed and an IC device loading/unloading means for loading IC devices to be tested and contained in the lot to a test head and for unloading the tested IC devices from the test head by sorting the tested IC devices according to the test results. The system also includes raw data generating means for generating raw data on the basis of time data occurring when the test process is performed; data calculating means for calculating testing time data, index time data based on the raw data, and loss time data; data storage means for storing the raw data and the calculated data; and data analyzing and outputting means for analyzing the raw data and the calculated data according to the lots, the plurality of testers and the IC device loading/unloading means and for outputting the analyzed output through an user interface. The test system includes testers, a server system and terminal computer, and the server system is provided with data storage means for integrally manipulating time data generated by the testers according to lots and test cycles and for storing manipulated time data.
摘要翻译：系统和方法自动分析和管理测试过程的损耗因子数据，其中大量的IC器件与许多测试人员进行了很多测试。批量包含预定数量的相同的IC器件，并且批次测试过程根据预定数量的测试周期顺序地执行。该系统包括用于验证每个测试周期的测试结果以及用于确定是否要执行重新测试的装置和用于将待测试和包含在批中的IC设备加载到的IC设备加载/卸载装置测试头，并根据测试结果对测试的IC器件进行分类，从测试头卸载测试的IC器件。该系统还包括：原始数据生成装置，用于根据执行测试处理时发生的时间数据生成原始数据; 用于计算测试时间数据，基于原始数据的索引时间数据和丢失时间数据的数据计算装置; 用于存储原始数据和计算数据的数据存储装置; 以及数据分析和输出装置，用于根据批次，多个测试器和IC装置加载/卸载装置分析原始数据和计算数据，并通过用户界面输出分析的输出。测试系统包括测试器，服务器系统和终端计算机，并且服务器系统设置有数据存储装置，用于根据批次和测试周期对测试者生成的时间数据进行整体操作并存储操纵的时间数据。

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