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    • 1. 发明申请
    • Probe Microscope
    • 探头显微镜
    • US20100306886A1
    • 2010-12-02
    • US12789796
    • 2010-05-28
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • Motoko HARADAKyoko HonboKatsumi Mabuchi
    • G01Q30/00
    • G01Q60/44G01Q60/02
    • An object of the present invention is to provide a probe microscope that permits qualitative and quantitative evaluation on ions existing near the surface of a sample and permits to detect further simply and easily such as impurities, flaws and corrosion origins existing on the sample in high sensitivity. A probe microscope according to the present invention is provided with a test cell that holds a sample and permits to receive liquid, a probe, a counter electrode, a reference electrode, a drive mechanism that causes the probe to follow the surface of the sample as well as to scan the same, a potential control portion that controls a potential between the probe and the reference electrode and a current measuring portion that measures a current flowing between the probe and the counter electrode, and is characterized in that the material of the probe is constituted by a conductive body containing any of gold or gold alloy, carbon or carbon compound, boron, zinc, lead, tin and mercury.
    • 本发明的目的是提供一种探针显微镜,其允许对存在于样品表面附近的离子进行定性和定量评估,并且允许以高灵敏度进一步简单且容易地检测样品中存在的杂质,缺陷和腐蚀起源。 。 根据本发明的探针显微镜设置有容纳样品并允许接收液体,探针,对电极,参比电极,使探针跟随样品表面的驱动机构的测试电池, 以及扫描相同的电位控制部分,其控制探针和参考电极之间的电势;以及电流测量部分,其测量在探针和对电极之间流动的电流,其特征在于探针的材料 由含有金或金合金,碳或碳化合物,硼,锌,铅,锡和汞的导电体构成。
    • 2. 发明申请
    • Probe microscope and measurement method using the same
    • 探头显微镜和测量方法使用相同
    • US20100257642A1
    • 2010-10-07
    • US12662234
    • 2010-04-07
    • Kyoko HonboKatsumi MabuchiMotoko Harada
    • Kyoko HonboKatsumi MabuchiMotoko Harada
    • G01Q10/00
    • G01Q60/04G01Q60/60
    • The present invention allows simple and sensitive detection of microimpurities, microdefects, and corrosion starting points which may be present in a material. A probe microscope has a function to sense ions diffused from a specimen in a liquid. A probe is caused to scan over a predetermined range on a specimen. Then, the probe is fixed to a particular position in a liquid so as to set the distance between the specimen and the probe to a given value at which the microstructure of the specimen surface cannot be observed. Thereafter, one of the current between the probe and a counter electrode and the potential between the probe and a reference electrode is controlled, and the other of the current and potential which varies in accordance with the control is measured. Thus, ions diffused from the specimen are sensed.
    • 本发明允许对材料中可能存在的微量杂质,微缺陷和腐蚀起点进行简单和灵敏的检测。 探针显微镜具有感测从液体中的样品扩散的离子的功能。 使探针在样品上扫描预定范围。 然后,将探针固定在液体中的特定位置,以将试样和探针之间的距离设定为不能观察到试样表面的微结构的给定值。 此后,控制探针和对电极之间的电流之一以及探针与参考电极之间的电位,并且测量根据控制变化的电流和电位中的另一个。 因此,检测从样品扩散的离子。
    • 3. 发明授权
    • Probe microscope and measurement method using the same
    • 探头显微镜和测量方法使用相同
    • US08327460B2
    • 2012-12-04
    • US12662234
    • 2010-04-07
    • Kyoko HonboKatsumi MabuchiMotoko Harada
    • Kyoko HonboKatsumi MabuchiMotoko Harada
    • G01Q10/00
    • G01Q60/04G01Q60/60
    • The present invention allows simple and sensitive detection of microimpurities, microdefects, and corrosion starting points which may be present in a material. A probe microscope has a function to sense ions diffused from a specimen in a liquid. A probe is caused to scan over a predetermined range on a specimen. Then, the probe is fixed to a particular position in a liquid so as to set the distance between the specimen and the probe to a given value at which the microstructure of the specimen surface cannot be observed. Thereafter, one of the current between the probe and a counter electrode and the potential between the probe and a reference electrode is controlled, and the other of the current and potential which varies in accordance with the control is measured. Thus, ions diffused from the specimen are sensed.
    • 本发明允许对材料中可能存在的微量杂质,微缺陷和腐蚀起点进行简单和灵敏的检测。 探针显微镜具有感测从液体中的样品扩散的离子的功能。 使探针在样品上扫描预定范围。 然后,将探针固定在液体中的特定位置,以将试样和探针之间的距离设定为不能观察到试样表面的微结构的给定值。 此后,控制探针和对电极之间的电流之一以及探针与参考电极之间的电位,并且测量根据控制变化的电流和电位中的另一个。 因此,检测从样品扩散的离子。