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    • 1. 发明申请
    • PIEZOELECTRIC/ELECTROSTRICTIVE FILM ELEMENT
    • 压电/电镀膜元件
    • US20080111453A1
    • 2008-05-15
    • US11960923
    • 2007-12-20
    • Kunihiko YOSHIOKATakao OhnishiTomohiro Yamada
    • Kunihiko YOSHIOKATakao OhnishiTomohiro Yamada
    • H01L41/00
    • H01L41/0973H01L41/0475H01L41/257Y10T29/42Y10T29/49155Y10T29/49163
    • A lower electrode 4 and an auxiliary electrode 8, a piezoelectric/electrostrictive film 5, and an upper electrode 6 are sequentially arranged in layers on a substrate 1. The lower electrode 4 is continuously formed in a region ranging from a first portion of the thick-walled portion 2 to a thin-walled diaphragm portion 3. The auxiliary electrode 8 is continuously formed in a region ranging from a second portion of the thick-walled portion 2 opposite the first portion to a position on the thin-walled diaphragm portion 3, the position being separated from the lower electrode 4. The upper electrode 6 is formed in such a manner as to overlie the piezoelectric/electrostrictive film 5 and the auxiliary electrode 8. Furthermore, a connection electrode 20 is provided for electrically connecting the upper electrode 6 and the auxiliary electrode 8. Thus, a plurality of paths are provided for electrically connecting the upper electrode 6 and the auxiliary electrode 8. Therefore, even when connection through a certain path is cut off due to fracture of a portion of the upper electrode 6 caused by deterioration in insulating performance of the piezoelectric/electrostrictive film 5, electrical connection between the upper electrode 6 and the auxiliary electrode 8 can be maintained through the remaining path(s).
    • 下部电极4和辅助电极8,压电/电致伸缩膜5和上部电极6依次排列在基板1上。 下部电极4连续形成在从厚壁部2的第一部分到薄壁膜部3的范围内。 辅助电极8连续地形成在与第一部分相对的厚壁部分2的第二部分到薄壁隔膜部分3上的位置,该位置与下部电极4分离。 上电极6以覆盖压电/电致伸缩膜5和辅助电极8的方式形成。 此外,设置连接电极20用于电连接上电极6和辅助电极8。 因此,设置多个路径用于电连接上电极6和辅助电极8。 因此,即使由于由于压电/电致伸缩膜5的绝缘性能的劣化而导致的上部电极6的一部分的断裂,通过某一路径的连接被切断时,上部电极6与辅助电极8之间的电连接也可以 通过剩余的路径进行维护。
    • 2. 发明授权
    • Piezoelectric/electrostrictive film element
    • 压电/电致伸缩膜元件
    • US07427820B2
    • 2008-09-23
    • US11960923
    • 2007-12-20
    • Kunihiko YoshiokaTakao OhnishiTomohiro Yamada
    • Kunihiko YoshiokaTakao OhnishiTomohiro Yamada
    • H01L41/047
    • H01L41/0973H01L41/0475H01L41/257Y10T29/42Y10T29/49155Y10T29/49163
    • A lower electrode 4 and an auxiliary electrode 8, a piezoelectric/electrostrictive film 5, and an upper electrode 6 are sequentially arranged in layers on a substrate 1. The lower electrode 4 is continuously formed in a region ranging from a first portion of the thick-walled portion 2 to a thin-walled diaphragm portion 3. The auxiliary electrode 8 is continuously formed in a region ranging from a second portion of the thick-walled portion 2 opposite the first portion to a position on the thin-walled diaphragm portion 3, the position being separated from the lower electrode 4. The upper electrode 6 is formed in such a manner as to overlie the piezoelectric/electrostrictive film 5 and the auxiliary electrode 8. Furthermore, a connection electrode 20 is provided for electrically connecting the upper electrode 6 and the auxiliary electrode 8. Thus, a plurality of paths are provided for electrically connecting the upper electrode 6 and the auxiliary electrode 8. Therefore, even when connection through a certain path is cut off due to fracture of a portion of the upper electrode 6 caused by deterioration in insulating performance of the piezoelectric/electrostrictive film 5, electrical connection between the upper electrode 6 and the auxiliary electrode 8 can be maintained through the remaining path(s).
    • 下部电极4和辅助电极8,压电/电致伸缩膜5和上部电极6依次排列在基板1上。 下部电极4连续形成在从厚壁部2的第一部分到薄壁膜部3的范围内。 辅助电极8连续地形成在与第一部分相对的厚壁部分2的第二部分到薄壁隔膜部分3上的位置,该位置与下部电极4分离。 上电极6以覆盖压电/电致伸缩膜5和辅助电极8的方式形成。 此外,设置连接电极20用于电连接上电极6和辅助电极8。 因此,设置多个路径用于电连接上电极6和辅助电极8。 因此,即使由于由于压电/电致伸缩膜5的绝缘性能的劣化而导致的上部电极6的一部分的断裂,通过某一路径的连接被切断时,上部电极6与辅助电极8之间的电连接也可以 通过剩余的路径进行维护。
    • 5. 发明授权
    • Inspection method, inspection apparatus, and polarization method for piezoelectric element
    • 压电元件的检测方法,检验装置和极化方法
    • US07525324B2
    • 2009-04-28
    • US11856351
    • 2007-09-17
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • G01R29/22
    • G01R29/22B41J2/0451B41J2/04513B41J2/04541B41J2/04581B41J2/14201H01L41/257
    • A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.
    • 一种用于检查压电元件的方法包括:第一检查信号施加步骤,向所述压电元件施加具有第一预定电压波形的第一检查信号Vp(1); 第一特征值测量步骤,在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤,向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp(2) 第二特征值测量步骤,在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤,基于与所测量的第二特征值和测量的第一特征值之间的差对应的值,确定压电元件是否异常。
    • 7. 发明申请
    • INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FOR PIEZOELECTRIC ELEMENT
    • 检测方法,检验装置和压电元件极化方法
    • US20080030102A1
    • 2008-02-07
    • US11856351
    • 2007-09-17
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • H01L41/09
    • G01R29/22B41J2/0451B41J2/04513B41J2/04541B41J2/04581B41J2/14201H01L41/257
    • A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.
    • 一种用于检查压电元件的方法包括:第一检查信号施加步骤,向所述压电元件施加具有第一预定电压波形的第一检查信号Vp(1); 第一特征值测量步骤,在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤,向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp(2) 第二特征值测量步骤,在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤,基于与所测量的第二特征值和测量的第一特征值之间的差对应的值,确定压电元件是否异常。
    • 9. 发明申请
    • INSPECTION METHOD, INSPECTION APPARATUS, AND POLARIZATION METHOD FOR PIEZOELECTRIC ELEMENT
    • 检测方法,检验装置和压电元件极化方法
    • US20090174419A1
    • 2009-07-09
    • US12398343
    • 2009-03-05
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • Takao OhnishiTomohiro YamadaTakatoshi Nehagi
    • G01R29/22
    • G01R29/22B41J2/0451B41J2/04513B41J2/04541B41J2/04581B41J2/14201H01L41/257
    • A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference between the measured second characteristic value and the measured first characteristic value.
    • 一种用于检查压电元件的方法包括:第一检查信号施加步骤,向所述压电元件施加具有第一预定电压波形的第一检查信号Vp(1); 第一特征值测量步骤,在施加第一检查信号之后测量压电元件的电特性值作为第一特征值; 第二检查信号施加步骤,向所述压电元件施加具有大于所述第一检查信号的第二预定电压波形和电功率的第二检查信号Vp(2) 第二特征值测量步骤,在施加第二检查信号之后测量压电元件的电特性值作为第二特征值; 以及异常判定步骤,基于与所测量的第二特征值和测量的第一特征值之间的差对应的值,确定压电元件是否异常。
    • 10. 发明授权
    • Chemical sensor element, sensing apparatus, and sensing method
    • 化学传感器元件,感测装置和传感方法
    • US08877519B2
    • 2014-11-04
    • US12738228
    • 2008-10-29
    • Tomohiro YamadaYoichiro Handa
    • Tomohiro YamadaYoichiro Handa
    • G01N33/553G01N21/55G01N21/27
    • G01N21/554G01N21/27Y10S436/805
    • A chemical sensor element contains a resonator having a first reflector in which particles of a fine metal structure are arranged two-dimensionally and periodically is counterposed with interposition of a dielectric layer to a second reflector, wherein the resonance wavelength of a resonator in which the entire of the first reflector is replaced by a metal thin film having the same thickness as the metal fine structure is different from the surface plasmon resonance wavelength induced in the metal fine structure; and the mode of the surface plasmon resonance excited in the metal fine structure is coupled with the mode of the resonator in which the entire of the first reflector is replaced by the metal thin film.
    • 化学传感器元件包括具有第一反射器的谐振器,其中精细金属结构的颗粒被二维地周期性布置,并且与第二反射器插入电介质层,其中整个谐振器的谐振波长 由具有与金属精细结构相同的厚度的金属薄膜替换为与金属精细结构中诱发的表面等离子体共振波长不同的金属薄膜; 并且在金属精细结构中激发的表面等离子体激元谐振的模式与谐振器的模式耦合,其中整个第一反射器被金属薄膜代替。