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    • 2. 发明申请
    • Optical information medium measurement method, optical information medium, recording apparatus, and reproducing apparatus
    • 光信息介质测量方法,光信息介质,记录装置和再现装置
    • US20100128590A1
    • 2010-05-27
    • US12559766
    • 2009-09-15
    • Kousei SANOYoshiaki KommaYasumori Hino
    • Kousei SANOYoshiaki KommaYasumori Hino
    • G11B7/00B32B3/02G01B11/06G01N21/55
    • G11B7/268G11B7/00375G11B2007/0013
    • An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.
    • 本发明的光信息介质测量方法,用于测量具有多个信息层的多层结构的光信息介质中的调制度,包括测量光信息介质的每一层的调制度的第一步骤 通过使用测量光学系统,获得光学信息介质的层之间的厚度的第二步骤,获得光学信息介质的每一层的反射率的第三步骤和转换光信息介质的调制度的第四步骤 基于表示层之间的厚度的值,在第二步骤中获得的厚度和在第一步骤中获得的厚度,将在第一步骤中测量的调制度调整为与测量光学系统不同的参考光学系统的调制度,以及 表示每层的反射率的值,第三步骤中得到的反射率。
    • 5. 发明授权
    • Optical head device, optical information device, and information processing device
    • 光头设备,光信息设备和信息处理设备
    • US08395980B2
    • 2013-03-12
    • US13391483
    • 2010-07-30
    • Yoshiaki KommaJoji AnzaiYasumori HinoKousei SanoHideki NakataKeisuke FujimotoTakeharu YamamotoTakeshi Shimamoto
    • Yoshiaki KommaJoji AnzaiYasumori HinoKousei SanoHideki NakataKeisuke FujimotoTakeharu YamamotoTakeshi Shimamoto
    • G11B7/00
    • G11B7/1381G11B7/1275G11B2007/0006G11B2007/0013
    • When information is recorded or reproduced on or from an optical information medium having three or more recording layers using blue light, interference by another layer light is reduced and, when information is reproduced from an optical information medium using red light, an S/N ratio is held excellently high.An optical head device includes a first laser light source (1) which emits blue light, a second laser light source (2) which emits red light, an objective lens (11) which focuses the blue light onto a recording layer of a first optical disc (12) or focuses the red light onto a recording layer of a second optical disc (13), a photodetector (9) which receives the blue light reflected by the recording layer of the first optical disc (12) or the red light reflected by the recording layer of the second optical disc (13) and outputs an electric signal in accordance with an amount of the received blue light or red light, and a wavelength selective light blocking region (7x) which blocks a predetermined range of the blue light including an optical axis thereof to prevent the predetermined range from reaching the photodetector (9), and transmits the red light.
    • 当使用蓝光在具有三个或更多个记录层的光信息介质上记录或再现信息时,减少了另一层光的干扰,并且当使用红光从光信息介质再现信息时,S / N比 举办得非常高。 光头装置包括发射蓝光的第一激光光源(1),发出红光的第二激光光源(2),将蓝光聚焦到第一光学记录层上的物镜(11) 盘(12)或将红光聚焦到第二光盘(13)的记录层上,接收由第一光盘(12)的记录层反射的蓝光的光电检测器(9)或反射的红光 通过第二光盘(13)的记录层,并根据所接收的蓝光或红光的量输出电信号,以及阻挡蓝光的预定范围的波长选择性遮光区域(7x) 包括其光轴以防止预定范围到达光电检测器(9),并发送红光。
    • 7. 发明申请
    • OPTICAL INFORMATION MEDIUM MEASUREMENT METHOD, OPTICAL INFORMATION METHOD, OPTICAL INFORMATION MEDIUM, RECORDING APPARATUS, AND REPRODUCING APPARATUS
    • 光学信息中度测量方法,光学信息方法,光学信息介质,记录装置和再现装置
    • US20110170389A1
    • 2011-07-14
    • US13071914
    • 2011-03-25
    • Kousei SanoYoshiaki KommaYasumori Hino
    • Kousei SanoYoshiaki KommaYasumori Hino
    • G11B7/00
    • G11B7/268G11B7/00375G11B2007/0013
    • An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.
    • 本发明的光信息介质测量方法,用于测量具有多个信息层的多层结构的光信息介质中的调制度,包括测量光信息介质的每一层的调制度的第一步骤 通过使用测量光学系统,获得光学信息介质的层之间的厚度的第二步骤,获得光学信息介质的每一层的反射率的第三步骤和转换光信息介质的调制度的第四步骤 基于表示层之间的厚度的值,在第二步骤中获得的厚度和在第一步骤中获得的厚度,将在第一步骤中测量的调制度调整为与测量光学系统不同的参考光学系统的调制度,以及 表示每层的反射率的值,第三步骤中得到的反射率。
    • 8. 发明申请
    • OPTICAL INFORMATION MEDIUM MEASUREMENT METHOD, OPTICAL INFORMATION MEDIUM, RECORDING APPARATUS AND REPRODUCING APPARATUS
    • 光学信息中度测量方法,光学信息媒介,记录装置和再现装置
    • US20100142348A1
    • 2010-06-10
    • US12559740
    • 2009-09-15
    • Kousei SANOYoshiaki KommaYasumori Hino
    • Kousei SANOYoshiaki KommaYasumori Hino
    • G11B7/00
    • G11B7/0037G01B11/06G11B2007/0013
    • An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.
    • 本发明的光信息介质测量方法,用于测量具有多个信息层的多层结构的光信息介质中的调制度,包括测量光信息介质的每一层的调制度的第一步骤 通过使用测量光学系统,获得光学信息介质的层之间的厚度的第二步骤,获得光学信息介质的每一层的反射率的第三步骤和转换光信息介质的调制度的第四步骤 基于表示层之间的厚度的值,在第二步骤中获得的厚度和在第一步骤中获得的厚度,将在第一步骤中测量的调制度调整为与测量光学系统不同的参考光学系统的调制度,以及 表示每层的反射率的值,第三步骤中得到的反射率。
    • 9. 发明授权
    • Optical information medium measurement method, optical information medium, recording apparatus, and reproducing apparatus
    • 光信息介质测量方法,光信息介质,记录装置和再现装置
    • US08218418B2
    • 2012-07-10
    • US12559766
    • 2009-09-15
    • Kousei SanoYoshiaki KommaYasumori Hino
    • Kousei SanoYoshiaki KommaYasumori Hino
    • G11B3/70G11B7/00B32B3/02G01B11/28G01B9/02
    • G11B7/268G11B7/00375G11B2007/0013
    • An optical information medium measurement method, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring a modulation degree of each layer of the optical information medium, and a second step of obtaining a thickness between layers of the optical information medium. Further, the method includes a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, as measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, as obtained in the third step.
    • 一种光信息介质测量方法,用于测量具有多个信息层的多层结构的光信息介质中的调制度,包括测量光信息介质的每一层的调制度的第一步骤,以及第二步 获得光信息介质的层之间的厚度的步骤。 此外,该方法包括获得光信息介质的每一层的反射率的第三步骤,以及将在第一步骤中测量的每层的调制度转换为参考光学系统的调制度的第四步骤 不同于测量光学系统,基于指示层之间的厚度的值,在第二步骤中获得的厚度和指示每个层的反射率的值,如在第三步骤中获得的。