会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Atomic absorption spectrophotometer
    • 原子吸收分光光度计
    • US4867562A
    • 1989-09-19
    • US196263
    • 1988-05-20
    • Konosuke OishiMasamichi TsukadaMasatoshi KitagawaToyoharu OkumotoHayato Tobe
    • Konosuke OishiMasamichi TsukadaMasatoshi KitagawaToyoharu OkumotoHayato Tobe
    • G01N21/31G01N21/74
    • G01N21/3103G01N2021/3111G01N2021/3114G01N21/74G01N2201/06166
    • An atomic absorption spectrophotometer for simultaneously measuring a plurality of elements different in kind from each other. A cylindrical heating furnace is provided for heating a sample being analyzed to dry, ash and atomize the sample thereby producing atomic vapor. A plurality of hollow-cathode discharge tubes corresponding in number to the elements being detected are arranged for simultaneously emitting light beams respectively containing line spectra of the respective elements, to cause the light beams to be incident upon the heating furnace at respective angles of inclination with respect to a central axis of the heating furnace. A plurality of spectral detection systems are arranged behind the heating furnace in relation to the angles of inclination, for respectively spectral-diffracting and receiving the light beams having their respective line spectra absorbed by the atomic vapor. A signal processing device is provided for carrying out calculation to obtain concentrations or quantities of the respective elements in the sample being analyzed, on the basis of respective ratios of atomic resonance absorption of the respective line spectra spectral-detected.
    • 一种用于同时测量彼此不同种类的多种元素的原子吸收分光光度计。 提供圆柱形加热炉,用于加热被分析的样品以干燥,灰分并雾化样品,从而产生原子蒸气。 多个对应于被检测的元件的空心阴极放电管被布置成同时发射分别包含各个元件的线谱的光束,以使光束以相应的倾角入射到加热炉上, 相对于加热炉的中心轴线。 多个光谱检测系统相对于倾斜角度布置在加热炉后面,用于分别衍射和接收具有由原子蒸气吸收的各自线谱的光束。 提供信号处理装置,用于根据频谱检测的各个线谱的原子共振吸收的相应比例进行计算以获得正在分析的样品中的各元素的浓度或数量。
    • 4. 发明授权
    • Plasma ion mass spectrometer and plasma mass spectrometry using the same
    • 等离子体离子质谱仪和等离子体质谱仪使用
    • US5616918A
    • 1997-04-01
    • US539258
    • 1995-10-05
    • Konosuke OishiToyoharu OkumotoMasamichi TsukadaTakashi Iino
    • Konosuke OishiToyoharu OkumotoMasamichi TsukadaTakashi Iino
    • G01N27/62H01J49/06H01J49/10H01J49/26
    • H01J49/105
    • A plasma ion mass spectrometer capable of improving detection accuracy in mass spectrometry by reducing background noise due to ultraviolet radiation and neutral particles, and a plasma ion mass spectrometry using the same. A sample is ionized with plasma in a plasma generating portion. The flow of the ionized sample is shielded by a shield plate after an elapse of a specified time, and ions of the sample accumulated before the shielding is held in an ion trap type mass spectrometric portion for a specified time. The ions of the sample held for the specified time are then subjected to mass spectrometry. During ions of the sample accumulated before the shielding are held, ultraviolet radiation mixed with the ions of the sample disappears, and thereby only ions of the sample can be subjected to mass spectrometry. As a result, background noise is reduced, to improve detection accuracy in mass spectrometry.
    • 能够通过降低由于紫外线辐射和中性粒子引起的背景噪声而提高质谱检测精度的等离子体离子质谱仪和使用其的等离子体离子质谱法。 在等离子体产生部分中用等离子体离子化样品。 离子化样品的流动在经过规定时间后被屏蔽板屏蔽,并且在屏蔽之前累积的样品的离子在离子阱型质谱部分中保持一定时间。 然后将保持规定时间的样品的离子进行质谱分析。 在保持屏蔽之前累积的样品的离子中,与样品的离子混合的紫外线辐射消失,从而只能对样品的离子进行质谱分析。 结果,降低背景噪声,提高质谱检测的准确性。
    • 9. 发明授权
    • Plasma ion source mass spectrometer
    • 等离子体离子源质谱仪
    • US06248998B1
    • 2001-06-19
    • US09020381
    • 1998-02-09
    • Toyoharu OkumotoMasamichi TsukadaAkira Owada
    • Toyoharu OkumotoMasamichi TsukadaAkira Owada
    • B01D5944
    • H01J49/105
    • A plasma ion source mass spectrometer comprising a plasma ion source 40 for ionizing a sample with a plasma; a mass filter 60 for subjecting the sample ionized by the plasma ion source 40 to mass spectrometry; and an interface unit 50 having an orifice formed in a cone 52, 54 for introducing the sample ionized by the plasma ion source 40 into the mass filter 60. Further the plasma ion source mass spectrometer comprises a first cooler 49 for cooling a plasma generator 41 of the plasma ion source 40 and a plasma generating power source 44; and a second cooler 56 independent of the first cooler 49, for cooling the interface unit 50 and for raising the temperature by changing the cooling efficiency so as to reduce the influence of deposition on the interface unit 50. With this construction, the temperature of the interface unit can be controlled without changing the analysis sensitivity of the plasma ion source mass spectrometer.
    • 一种等离子体离子源质谱仪,其包括用于使等离子体离子化的等离子体离子源40; 质量过滤器60,用于对由等离子体离子源40离子化的样品进行质谱分析; 以及具有形成在锥体52,54中的孔口的接口单元50,用于将由等离子体离子源40离子化的样品引入质量过滤器60.此外,等离子体离子源质谱仪包括用于冷却等离子体发生器41的第一冷却器49 的等离子体离子源40和等离子体发生电源44; 以及独立于第一冷却器49的第二冷却器56,用于冷却接口单元50并且通过改变冷却效率来提高温度,从而减少对接口单元50的沉积的影响。通过这种结构, 可以控制接口单元,而不改变等离子体离子源质谱仪的分析灵敏度。