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1. 发明专利

JP2013029372A Ionic functional group modification sensor chip, and intermolecular interaction measurement method using ligand-carrying charged fine particle 审中-公开
标题翻译：离子功能组修改传感器芯片，以及使用携带携带精细颗粒的分子间相互作用测量方法
公开(公告)号：JP2013029372A
公开(公告)日：2013-02-07
申请号：JP2011164526
申请日：2011-07-27
申请人： Konica Minolta Advanced Layers Inc , コニカミノルタアドバンストレイヤー株式会社
发明人： NINOMIYA HIDETAKA , MURAMATSU SHINICHI , KURIHARA YOSHIKAZU , SEKIYA TADANORI
IPC分类号： G01N33/543 , G01N33/552 , G01N33/553
摘要： PROBLEM TO BE SOLVED: To provide a measurement method with higher sensitivity that solves problems that measurement methods using magnetic particles and magnetic force have while making good use of advantage obtained by combining a homogeneous assay and heterogeneous sensing (intermolecular interaction measurement method) with each other.SOLUTION: There is provided an intermolecular interaction measurement method that uses a sensor chip having a positively- or negatively-charged layer as a surface layer, the intermolecular interaction measurement method including the processes of: forming a ligand-carrying charged fine particle-analyte composite by subjecting positively- or negatively-charged fine particles charged opposite to the charged layer, ligand-carrying charged fine particles composed of ligands bonded to the charged fine particles, and an analyte to reaction in a medium; and bringing a medium including the ligand-carrying charged fine particle-analyte composite into contact with a surface of the charged layer, and observing a signal generated by an act of intermolecular interaction.
摘要翻译：要解决的问题：提供一种灵敏度更高的测量方法，其解决了使用磁性颗粒和磁力的测量方法同时充分利用通过组合均相测定和异质感测（分子间相互作用测量方法）获得的优点的问题，与彼此。解决方案：提供了一种分子间相互作用测量方法，其使用具有带正电或带负电荷的层作为表面层的传感器芯片，分子间相互作用测量方法包括以下过程：形成带配体的带电微粒 - 分散体复合物，通过对与带电层相反的带正电荷或带负电荷的微粒进行充电，由与被加入的微粒结合的配体组成的配体携带带电微粒和分析物在介质中反应; 并使含有带配体的带电微粒 - 分析物复合体的介质与带电层的表面接触，观察由分子间相互作用产生的信号。版权所有（C）2013，JPO＆INPIT

2. 发明专利

JP2013047671A Sensor chip having fine particle film formed thereon, method for manufacturing the same, and assay method 审中-公开
标题翻译：其形成的细颗粒膜的传感器芯片，其制造方法和测定方法
公开(公告)号：JP2013047671A
公开(公告)日：2013-03-07
申请号：JP2012151508
申请日：2012-07-05
申请人： Konica Minolta Advanced Layers Inc , コニカミノルタアドバンストレイヤー株式会社
发明人： MURAMATSU SHINICHI , NINOMIYA HIDETAKA
IPC分类号： G01N33/53 , G01N33/543 , G01N33/553
摘要： PROBLEM TO BE SOLVED: To provide means capable of easily modifying the surface of a sensor chip for measuring an intermolecular interaction with various materials.SOLUTION: A method for manufacturing a sensor chip includes: bringing fine particles (charged fine particles) which have been charged so as to opposite to a layer (charged layer) (2) that has been positively or negatively charged into contact with the charged layer, in a sensor base (1); fixing the layer by an electrostatic interaction; and thereby forming a layer (charged fine particle layer) (3) formed of the charged fine particles. The charged layer is a layer formed of an ionic polymer. The charged fine particles are at least one selected from a group consisting of the ionic polymer, a pigment, SiO, TiO, a metal, semiconductor nanoparticles, a carbon nanotube and a fullerene.
摘要翻译：要解决的问题：提供能够容易地改变用于测量与各种材料的分子间相互作用的传感器芯片的表面的装置。解决方案：一种用于制造传感器芯片的方法，包括：将带有正或负电荷的层（带电层）（2）的带电的微粒（带电微粒）与在传感器基座（1）中的带电层; 通过静电相互作用固定该层; 从而形成由带电微粒形成的层（带电微粒层）（3）。带电层是由离子聚合物形成的层。带电的微粒是选自离子聚合物，颜料，SiO 2，SB POS =“POST”> 2 中的至少一种。金属，半导体纳米颗粒，碳纳米管和富勒烯。版权所有（C）2013，JPO＆INPIT

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