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    • 4. 发明授权
    • Planar light source device
    • 平面光源装置
    • US07441938B2
    • 2008-10-28
    • US11623909
    • 2007-01-17
    • Seiji SakaiTakuya Sakamoto
    • Seiji SakaiTakuya Sakamoto
    • F21V7/04
    • G02B6/0068G02B6/0043G02B6/009
    • A planar light source device includes: a plurality of point light sources, each of which emits a light; a light guide plate that includes a first surface, and a second surface perpendicular to the first surface, and that is configured to guide the emitted lights incident from the first surface to be emitted from the second surface; a bottom case including a side portion substantially parallel to the first surface; a light source substrate that includes the plurality of point light sources arranged thereon at a predetermined interval, and that is arranged at a side of the first surface; a frame that sandwiches the light source substrate and the side portion of the bottom case and holds the second surface and that includes a plurality of gaps at positions facing the point light source.
    • 平面光源装置包括:多个点光源,每个点光源发光; 导光板,其包括第一表面和垂直于所述第一表面的第二表面,并且被配置为引导从所述第一表面入射的所述发射的光从所述第二表面发射; 底壳,其包括基本上平行于所述第一表面的侧部; 光源基板,其以规定的间隔配置有多个点光源,并配置在所述第一面的一侧; 夹持所述光源基板和所述底壳的侧部并且保持所述第二表面并且在面向所述点光源的位置处包括多个间隙的框架。
    • 5. 发明授权
    • Method of screening varistors
    • 压敏电阻的筛选方法
    • US06246242B1
    • 2001-06-12
    • US09198283
    • 1998-11-23
    • Seiji Sakai
    • Seiji Sakai
    • G01R3102
    • G01R31/013G01R27/2694G01R31/26H01C7/12H01C17/00
    • A method of screening varistors. In a first step, a pulse generator is caused to apply to a varistor a large-current pulse having a peak value of at least 1 A and 90% or less of an average breakdown current of the varistor and has a pulse width of 100 msec or less. In a second step, the dielectric loss of the varistor is measured through use of an LCR meter at a frequency of about 100 KHz or higher. Subsequently, in a third step, a judgment is made as to whether the measured value falls within a range that is preset as a reference value for judgment. If the measured value is within the range, the varistor is judged to be a non-defective product. If the measured value is outside of the range, the varistor is judged to be a defective product having an internal defect.
    • 一种筛选压敏电阻的方法。 在第一步骤中,使脉冲发生器向压敏电阻施加具有至少1A的峰值和可变压敏电阻的平均击穿电流的90%或更小的大电流脉冲,并具有100毫秒的脉冲宽度 或更少。 在第二步中,通过使用约100KHz或更高频率的LCR测量仪来测量压敏电阻的介电损耗。 随后,在第三步骤中,判断测量值是否落在作为判断基准值预设的范围内。 如果测量值在该范围内,则可变压敏电阻被判断为无缺陷产品。 如果测量值在该范围之外,则认为变阻器是具有内部缺陷的缺陷产品。