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    • 6. 发明授权
    • Phase shift mask and method for manufacturing light-collecting device
    • 相移掩模和制造集光装置的方法
    • US07846620B2
    • 2010-12-07
    • US11860756
    • 2007-09-25
    • Motonori IshiiKazutoshi OnozawaKimiaki ToshikiyoToshinobu MatsunoTakanori Yogo
    • Motonori IshiiKazutoshi OnozawaKimiaki ToshikiyoToshinobu MatsunoTakanori Yogo
    • G03F1/00
    • G03F7/0005G03F1/30
    • The phase shift mask according to the present invention is a phase shift mask for manufacturing a semiconductor device. The phase shift mask includes a light-blocking portion, a light-transmitting portion, a phase shift portion, and an auxiliary pattern portion, the light-blocking portion, the light-transmitting portion, the phase shift portion, and the auxiliary pattern portion being concentrically arranged, wherein a width of the auxiliary pattern portion in a radius direction is less than a width of the light-transmitting portion and a width of the phase shift portion in a radius direction. Furthermore, it is possible that a phase of exposure light which passes through an auxiliary pattern portion is opposite to a phase of exposure light which passes through a light-transmitting portion or a phase shift portion, the light-transmitting portion or the phase shift portion being the closest to the auxiliary pattern portion.
    • 根据本发明的相移掩模是用于制造半导体器件的相移掩模。 相移掩模包括遮光部分,透光部分,相移部分和辅助图案部分,遮光部分,透光部分,相移部分和辅助图案部分 其中所述辅助图形部分在半径方向上的宽度小于所述透光部分的宽度和所述相移部分在半径方向上的宽度。 此外,通过辅助图案部分的曝光光的相位可能与通过透光部分或相移部分的曝光光的相位相反,透光部分或相移部分 最靠近辅助图案部分。