会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • Device for Measuring Mechanical Quantity
    • 机械量测量装置
    • US20150020601A1
    • 2015-01-22
    • US14379683
    • 2012-03-02
    • Kentaro MiyajimaKisho AshidaHiroyuki Oota
    • Kentaro MiyajimaKisho AshidaHiroyuki Oota
    • G01L1/22G01N19/00
    • G01L1/2293G01B7/16G01B7/18G01L1/044G01L1/18G01L1/2262G01L1/2281G01N19/00
    • A device for measuring mechanical quantity is provided which reduces the influence of a difference in thermal expansion coefficient between an object to be measured and a base plate metal body, and precisely measures a mechanical quantity such as deformation quantity or strain quantity caused in the object to be measured. The device includes a semiconductor strain sensor module for measuring deformation quantity of the object to be measured, and the module includes a metal body, and a semiconductor strain sensor mounted on the metal body to detect strain of the metal body. The object to be measured is made of a material having a thermal expansion coefficient larger than that of the metal body. Further, the metal body mounted with the semiconductor strain sensor has a structure configured to be fixed to the object to be measured.
    • 提供了一种用于测量机械量的装置,其减少了被测量物体与基板金属体之间的热膨胀系数的差异的影响,并且精确地测量在物体中产生的变形量或应变量的机械量 被测量。 该装置包括用于测量被测量物体的变形量的半导体应变传感器模块,并且该模块包括金属体,以及安装在金属体上的半导体应变传感器,用于检测金属体的应变。 待测量的物体由热膨胀系数大于金属体的材料制成。 此外,安装有半导体应变传感器的金属体具有被配置为固定到待测量对象的结构。
    • 2. 发明授权
    • Device for measuring mechanical quantity
    • 机械量测量装置
    • US09459162B2
    • 2016-10-04
    • US14379683
    • 2012-03-02
    • Kentaro MiyajimaKisho AshidaHiroyuki Oota
    • Kentaro MiyajimaKisho AshidaHiroyuki Oota
    • G01L1/22G01B7/16G01L1/04G01L1/18G01N19/00
    • G01L1/2293G01B7/16G01B7/18G01L1/044G01L1/18G01L1/2262G01L1/2281G01N19/00
    • A device for measuring mechanical quantity is provided which reduces the influence of a difference in thermal expansion coefficient between an object to be measured and a base plate metal body, and precisely measures a mechanical quantity such as deformation quantity or strain quantity caused in the object to be measured. The device includes a semiconductor strain sensor module for measuring deformation quantity of the object to be measured, and the module includes a metal body, and a semiconductor strain sensor mounted on the metal body to detect strain of the metal body. The object to be measured is made of a material having a thermal expansion coefficient larger than that of the metal body. Further, the metal body mounted with the semiconductor strain sensor has a structure configured to be fixed to the object to be measured.
    • 提供了一种用于测量机械量的装置,其减少被测量物体与基板金属体之间的热膨胀系数的差异的影响,并且精确地测量在物体中产生的变形量或应变量的机械量 被测量。 该装置包括用于测量被测量物体的变形量的半导体应变传感器模块,并且该模块包括金属体,以及安装在金属体上的半导体应变传感器,用于检测金属体的应变。 待测量的物体由热膨胀系数大于金属体的材料制成。 此外,安装有半导体应变传感器的金属体具有被配置为固定到待测量对象的结构。
    • 4. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
    • 半导体器件及其制造方法
    • US20120228628A1
    • 2012-09-13
    • US13041732
    • 2011-03-07
    • Hiroyuki OnodaHiroyuki Oota
    • Hiroyuki OnodaHiroyuki Oota
    • H01L29/12H01L21/336
    • H01L29/66636H01L29/165H01L29/6659H01L29/7834
    • A semiconductor device and methods of fabricating semiconductor devices are provided. A method involves forming a semiconductor substrate on a source region and a drain region, the semiconductor substrate comprises a first crystal. The method also involves forming an epitaxial layer of a second crystal on the semiconductor substrate. The first crystal has a first lattice constant and the second crystal has a second lattice constant. The first epitaxial layer does not touch a spacer or a gate electrode. Forming the epitaxial layer can comprise forming a first epitaxial layer and a second epitaxial layer, wherein the first epitaxial layer has a conductivity type impurity that is less than the conductivity type impurity of the second epitaxial layer.
    • 提供半导体器件和制造半导体器件的方法。 一种方法包括在源区和漏区上形成半导体衬底,所述半导体衬底包括第一晶体。 该方法还涉及在半导体衬底上形成第二晶体的外延层。 第一晶体具有第一晶格常数,第二晶体具有第二晶格常数。 第一外延层不接触间隔物或栅电极。 形成外延层可以包括形成第一外延层和第二外延层,其中第一外延层具有小于第二外延层的导电类型杂质的导电型杂质。
    • 5. 发明申请
    • ELECTROMAGNETIC FLOW RATE MEASUREMENT SYSTEM AND CALIBRATOR THEREFOR
    • 电磁流量测量系统及其校准器
    • US20120047987A1
    • 2012-03-01
    • US13218063
    • 2011-08-25
    • Takatoshi AsadaDaigo KittakaYasuko OyamatsuMasafumi KomaiHiroyuki Oota
    • Takatoshi AsadaDaigo KittakaYasuko OyamatsuMasafumi KomaiHiroyuki Oota
    • G01F25/00G01F1/58
    • G01F1/588G01F25/0007
    • One embodiment of an electromagnetic flow rate measurement system includes electromagnetic flowmeters arranged at intervals from one another in the peripheral direction of an annular flow passage 1 in which an electric conductive fluid flows. Each of the electromagnetic flowmeters comprises: an excitation member that has magnets arranged at intervals from one another in the outer peripheral surface of the annular flow passage so as to form a magnetic field in the direction perpendicular to the outer peripheral surface of the annular flow passage; and electrodes that are provided between the magnets of the excitation member and between the magnets of the excitation member so as to measure voltage generated when the electric conductive fluid crosses the magnetic field. The polarities of the magnets at the end portions of the closest excitation members of the adjacent electromagnetic flowmeters are opposed to each other.
    • 电磁流量测量系统的一个实施例包括电磁流量计,该电磁流量计在导电流体流动的环形流路1的圆周方向上彼此间隔设置。 每个电磁流量计包括:激励构件,其具有在环形流动通道的外周表面中彼此间隔设置的磁体,以便在与环形流动通道的外周表面垂直的方向上形成磁场 ; 以及设置在激励构件的磁体之间和激励构件的磁体之间的电极,以便测量当导电流体穿过磁场时产生的电压。 相邻电磁流量计的最近的激励构件的端部处的磁体的极性彼此相对。
    • 8. 发明授权
    • Coffee maker
    • 咖啡机
    • US4412481A
    • 1983-11-01
    • US340634
    • 1982-01-19
    • Hiroyuki OotaRyuuho Narita
    • Hiroyuki OotaRyuuho Narita
    • A47J31/42A47J31/52G04G15/00H03K17/60
    • A47J31/42A47J31/52G04G15/00H03K17/60
    • An AC power source is coupled with a heater circuit containing a series circuit including a cover switch for a coffee maker, a thermal switch for controlling the temperature of a heating unit and a control switch for turning on and off a heater of the heating unit. A detecting circuit is connected between a signal take-out node as a juction point between the heater and the thermal switch and one end of the AC power source. The detecting circuit responds to a given on-off states of each of the switches to receive a detection current from the signal take-out node, and produces a detection signal for controlling a control apparatus for the coffee maker.
    • AC电源与包含串联电路的加热器电路耦合,所述串联电路包括用于咖啡机的盖开关,用于控制加热单元的温度的热开关和用于打开和关闭加热单元的加热器的控制开关。 检测电路连接在信号取出节点之间,作为加热器和热开关之间的切点以及交流电源的一端。 检测电路响应于每个开关的给定开关状态以从信号取出节点接收检测电流,并且产生用于控制咖啡机的控制装置的检测信号。
    • 9. 发明授权
    • Coffee maker
    • 咖啡机
    • US4406217A
    • 1983-09-27
    • US335288
    • 1981-12-28
    • Hiroyuki Oota
    • Hiroyuki Oota
    • A47J31/42A47J31/52
    • A47J31/42A47J31/52
    • A coffee maker is provided with a mill mechanism, a drip mechanism and a control device. The control device contains a mill time setting counter for setting a milling time of coffee beans in the form of digital data, a drive circuit for driving the mill mechanism and a drive circuit for driving the drip mechanism. When a start signal is supplied to the control device, the mill mechanism is driven only for the milling time set. After the lapse of the milling time, the drip mechanism is automatically actuated to brew coffee.
    • 咖啡机具有磨机机构,滴水机构和控制装置。 控制装置包含用于设定数字数据形式的咖啡豆的研磨时间的磨机时间设定计数器,用于驱动磨机机构的驱动电路和驱动滴液机构的驱动电路。 当启动信号被提供给控制装置时,磨机机构仅为设定的铣削时间而被驱动。 经过铣削时间后,自动启动滴水机构以冲泡咖啡。
    • 10. 发明授权
    • Electromagnetic flow rate measurement system and calibrator therefor
    • 电磁流量测量系统及校验仪
    • US08826716B2
    • 2014-09-09
    • US13218063
    • 2011-08-25
    • Takatoshi AsadaDaigo KittakaYasuko OyamatsuMasafumi KomaiHiroyuki Oota
    • Takatoshi AsadaDaigo KittakaYasuko OyamatsuMasafumi KomaiHiroyuki Oota
    • G01F25/00G01F1/58
    • G01F1/588G01F25/0007
    • One embodiment of an electromagnetic flow rate measurement system includes electromagnetic flowmeters arranged at intervals from one another in the peripheral direction of an annular flow passage 1 in which an electric conductive fluid flows. Each of the electromagnetic flowmeters comprises: an excitation member that has magnets arranged at intervals from one another in the outer peripheral surface of the annular flow passage so as to form a magnetic field in the direction perpendicular to the outer peripheral surface of the annular flow passage; and electrodes that are provided between the magnets of the excitation member and between the magnets of the excitation member so as to measure voltage generated when the electric conductive fluid crosses the magnetic field. The polarities of the magnets at the end portions of the closest excitation members of the adjacent electromagnetic flowmeters are opposed to each other.
    • 电磁流量测量系统的一个实施例包括电磁流量计,该电磁流量计在导电流体流动的环形流路1的圆周方向上彼此间隔设置。 每个电磁流量计包括:激励构件,其具有在环形流动通道的外周表面中彼此间隔设置的磁体,以便在与环形流动通道的外周表面垂直的方向上形成磁场 ; 以及设置在激励构件的磁体之间和激励构件的磁体之间的电极,以便测量当导电流体穿过磁场时产生的电压。 相邻电磁流量计的最近的激励构件的端部处的磁体的极性彼此相对。